Skip to content

Ananta K. Majhi

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

20

Venues

4

Active years

1995–2010

Best venue rank

National

Where they publish

Papers

20 indexed papers, newest first.

YearVenueTitleAuthors
2010DATENIM- a noise index model to estimate delay discrepancies between silicon and simulation.Elif Alpaslan, Jennifer Dworak, Bram Kruseman, Ananta K. Majhi, Wilmar M. Heuvelman, Paul van de Wiel
2010VLSIDImpact of Temperature on Test Quality.Lavanya Jagan, Camelia Hora, Bram Kruseman, Stefan Eichenberger, Ananta K. Majhi, V. Kamakoti
2009VLSIDEfficient Grouping of Fail Chips for Volume Yield Diagnostics.Lavanya Jagan, Ratan Deep Singh, V. Kamakoti, Ananta K. Majhi
2008ITCTowards a World Without Test Escapes: The Use of Volume Diagnosis to Improve Test Quality.Stefan Eichenberger, Jeroen Geuzebroek, Camelia Hora, Bram Kruseman, Ananta K. Majhi
2007ITCEmbedded multi-detect ATPG and Its Effect on the Detection of Unmodeled Defects.Jeroen Geuzebroek, Erik Jan Marinissen, Ananta K. Majhi, Andreas Glowatz, Friedrich Hapke
2007VTSDiagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages.Daniel Arum, Rosa Rodrguez-Montas, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi
2007VTSOn Performance Testing with Path Delay Patterns.Bram Kruseman, Ananta K. Majhi, Guido Gronthoud
2007VTSDiagnosis of Full Open Defects in Interconnecting Lines.Rosa Rodrguez-Montas, Daniel Arum, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi
2006ITCPower Supply Noise in Delay Testing.Jing Wang, D. M. H. Walker, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul van de Wiel, Stefan Eichenberger
2005DATEMemory Testing Under Different Stress Conditions: An Industrial Evaluation.Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, Fred Bowen
2005VTSA New Algorithm for Dynamic Faults Detection in RAMs.Mohamed Azimane, Ananta K. Majhi, Guido Gronthoud, Maurice Lousberg
2004ITCOn Hazard-free Patterns for Fine-delay Fault Testing.Bram Kruseman, Ananta K. Majhi, Guido Gronthoud, Stefan Eichenberger
2004ITCSystematic Defects in Deep Sub-Micron Technologies.Bram Kruseman, Ananta K. Majhi, Camelia Hora, Stefan Eichenberger, Johan Meirlevede
2004VTSNew Test Methodology for Resistive Open Defect Detection in Memory Address Decoders.Mohamed Azimane, Ananta K. Majhi
2003VTSImproving Diagnostic Resolution of Delay Faults using Path Delay Fault Model.Ananta K. Majhi, Guido Gronthoud, Camelia Hora, Maurice Lousberg, Pop Valer, Stefan Eichenberger
1998VLSIDAutomated AC (Timing) Characterization for Digital Circuit Testing.S. Balajee, Ananta K. Majhi
1998VLSIDMixed-Signal Test.Ananta K. Majhi, Vishwani D. Agrawal
1998VLSIDTutorial: Delay Fault Models and Coverage.Ananta K. Majhi, Vishwani D. Agrawal
1996VLSIDOn test coverage of path delay faults.Ananta K. Majhi, James Jacob, Lalit M. Patnaik, Vishwani D. Agrawal
1995VLSIDAn efficient automatic test generation system for path delay faults in combinational circuits.Ananta K. Majhi, James Jacob, Lalit M. Patnaik, Vishwani D. Agrawal