| 2020 | ISCAS | Bit-Cell Selection Analysis for Embedded SRAM-Based PUF. | Abdel Alheyasat, Gabriel Torrens, Sebasti A. Bota, Bartomeu Alorda |
| 2017 | IOLTS | 6T CMOS SRAMs reliability monitoring through stability measurements. | Bartomeu Alorda, Gabriel Torrens, Sebasti A. Bota |
| 2016 | IOLTS | On-line write margin estimator to monitor performance degradation in SRAM cores. | Bartomeu Alorda, Cristian Carmona, Gabriel Torrens, Sebasti A. Bota |
| 2014 | DATE | Word-line power supply selector for stability improvement of embedded SRAMs in high reliability applications. | Bartomeu Alorda, Cristian Carmona, Sebasti A. Bota |
| 2013 | IOLTS | Accurate alpha soft error rate evaluation in SRAM memories. | Sebasti A. Bota, Gabriel Torrens, Ivan de Pal, Bartomeu Alorda, L. A. Segura |
| 2012 | COMPSAC | Understanding the Role of Transmission Power in Component-Based Architectures for Adaptive WSN. | Guillermo Rodrguez-Navas, Miquel A. Ribot, Bartomeu Alorda |
| 2012 | EDUCON | Multi-subject Project Based Learning initiative. | Bartomeu Alorda, Jaume Verd, Vincent Canals, Kay Suenaga, V. Martinez |
| 2011 | DATE | Stability optimization of embedded 8T SRAMs using Word-Line Voltage modulation. | Bartomeu Alorda, Gabriel Torrens, Sebasti A. Bota, Jaume Segura |
| 2010 | DATE | Static and dynamic stability improvement strategies for 6T CMOS low-power SRAMs. | Bartomeu Alorda, Gabriel Torrens, Sebasti A. Bota, Jaume Segura |
| 2010 | IOLTS | Cross-BIC architecture for single and multiple SEU detection enhancement in SRAM memories. | Sebasti A. Bota, Gabriel Torrens, Bartomeu Alorda, Jaume Verd, Jaume Segura |
| 2009 | IOLTS | Critical charge characterization in 6-T SRAMs during read mode. | Sebasti A. Bota, Gabriel Torrens, Bartomeu Alorda |
| 2005 | IOLTS | A Non-Intrusive Built-In Sensor for Transient Current Testing of Digital VLSI Circuits. | Bartomeu Alorda, Sebasti A. Bota, Jaume Segura |
| 2004 | IOLTS | A BIST-based Charge Analysis for Embedded Memories. | Bartomeu Alorda, Vicent Canals, Ivan de Pal, Jaume Segura |
| 2003 | IOLTS | An Evaluation of Built-in vs. Off-chip Strategies for On-line Transient Current Testing. | Bartomeu Alorda, Jaume Segura |
| 2003 | ITC | CHARDIN: An Off-Chip Transient Current Monitor with Digital Interface for Production Testing. | Bartomeu Alorda, Brad Bloechel, Ali Keshavarzi, Jaume Segura |
| 2002 | IOLTS | An Off-Chip Sensor Circuit for On-Line Transient Current Testing. | Bartomeu Alorda, Andr Ivanov, Jaume Segura |
| 2002 | ITC | Charge Based Transient Current Testing (CBT) for Submicron CMOS SRAMs. | Bartomeu Alorda, M. Rosales, Jerry M. Soden, Charles F. Hawkins, Jaume Segura |
| 2001 | VTS | Defect Oriented Fault Diagnosis for Semiconductor Memories using Charge Analysis: Theory and Experiments. | Ivan de Pal, M. Rosales, Bartomeu Alorda, Jaume Segura, Charles F. Hawkins, Jerry M. Soden |
| 2000 | IOLTS | On-Line Current Testing for a Microprocessor Based Application with an Off-Chip Sensor. | Bartomeu Alorda, Ivan de Pal, Jaume Segura, T. Miller |