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Bozena Kaminska

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

66

Venues

11

Active years

1988–2019

Best venue rank

A*

Where they publish

Papers

66 indexed papers, newest first.

YearVenueTitleAuthors
2019VTSSpecial Session (New Topic): Emerging Computing and Testing Techniques.Max M. Shulaker, Laurent Lebrun, Bozena Kaminska, Bernard Courtois
2018VTSSpecial session on quantum systems: Next challenges in design, test, integration.Carlo Reita, Jonathan Baugh, Gabriel Poulin-Lamarre, Bozena Kaminska, Bernard Courtois
2014SIGGRAPHNano-Media: multi-channel full color image with embedded covert information display.Reza Qarehbaghi, Hao Jiang, Bozena Kaminska
2014VTSNew topic session 2B: Co-design and reliability of power electronic modules - Current status and future challenges.Bozena Kaminska, Bernard Courtois, Chris Bailey
2014VTSNew topic session 7B: Challenges and opportunities in test and design for test (DFT) of MEMS sensors.Bozena Kaminska, Bernard Courtois, Mary Ann Maher
2013VTSNew topic session 7B: Challenges and directions for ultra-low voltage VLSI circuits and systems: CMOS and beyond.Bozena Kaminska, Bernard Courtois, Massimo Alioto
2013VTSNew topic session 2B: Why (Re-)Designing Biology is ∗Slightly∗ more challenging than designing electronics.Bozena Kaminska, Bernard Courtois, Soha Hassoun
2011DATE2D and 3D integration with organic and silicon electronics.Clinton K. Landrock, Badr Omrane, Yindar Chuo, Bozena Kaminska, Jeydmer Aristizabal
2011SMCTest firmware architecture for a flexible wireless physiological multi-sensor.Camille Jaggernauth, Benny Hung, Philip Lin, Yindar Chuo, Bozena Kaminska
2010DATEHigh temperature polymer capacitors for aerospace applications.Clinton K. Landrock, Bozena Kaminska
2010VTSSpecial session 9B: New topic test facilities and infrastructure in Canada.Bozena Kaminska, I. L. McWalter
2009ICCDMid-range wireless energy transfer using inductive resonance for wireless sensors.Shahrzad Jalali Mazlouman, Alireza Mahanfar, Bozena Kaminska
2008DSDReliable Data Transmission over Simple Wireless Channels: A Case Study.Pawel Gburzynski, Bozena Kaminska, Ashikur Rahman
2007DATEA tiny and efficient wireless ad-hoc protocol for low-cost sensor networks.Pawel Gburzynski, Bozena Kaminska, Wladek Olesinski
2003ICCADMixed Signal DFT: A Concise Overview.Bozena Kaminska, Karim Arabi
2002ITCHomegrown Tools and Equipment versus EDA and ATE Vendors: The Future of Design to Test Product Lines.Bozena Kaminska
2000DACClosing the gap between analog and digital.Khaled Saab, Naim Ben-Hamida, Bozena Kaminska
2000DATEParametric Fault Simulation and Test Vector Generation.Khaled Saab, Naim Ben-Hamida, Bozena Kaminska
2000ISCASA preamplifier IC design for photonic links.Andr Boyoguno, Bozena Kaminska, Mustapha Slamani
1999ITCIs Analog Fault Simulation a Key to Product Quality? Practical Considerations.Bozena Kaminska
1998ICCDTesting digital to analog converters based on oscillation-test strategy using sigma-delta modulation.Hassan Ihs, Karim Arabi, Bozena Kaminska
1998ITCDigital oscillation-test method for delay and stuck-at fault testing of digital circuits.Karim Arabi, Hassan Ihs, Christian Dufaza, Bozena Kaminska
1998VTSImpedance Mismatch and Lumped Capacitance Effects in High Frequency Testing.Iboun Taimiya Sylla, Mustapha Slamani, Bozena Kaminska, Fartoumi M. Hossein, Patrick Vincent
1997DATEEfficient and accurate testing of analog-to-digital converters using oscillation-test method.Karim Arabi, Bozena Kaminska
1997ICCDBuilt-In Temperature Sensors for On-line Thermal Monitoring of Microelectronic Structures.Karim Arabi, Bozena Kaminska
1997ITCDesign and Realization of an Accurate Built-In Current Sensor for On-Line Power Dissipation Measurement and IKarim Arabi, Bozena Kaminska
1997ITCOscillation Built-In Self Test (OBIST) Scheme for Functional and Structural Testing of Analog and Mixed-Signal Integrated Circuits.Karim Arabi, Bozena Kaminska
1997ITCOptical Communication Channel Test Using BIST Approaches.Mathieu Gagnon, Bozena Kaminska
1997ITCAnalog and Mixed-Signal Benchmark Circuits-First Release.Bozena Kaminska, Karim Arabi, I. Bell, Jos L. Huertas, Bruce C. Kim, Adoracin Rueda, Mani Soma, Prashant Goteti
1997VTSCLP-based Multifrequency Test Generation for Analog Circuits.Abdessatar Abderrahman, Eduard Cerny, Bozena Kaminska
1997VTSParametric and Catastrophic Fault Coverage of Analog Circuits in Oscillation-Test Methodology.Karim Arabi, Bozena Kaminska
1997VTSWill 0.1um Digital Circuits Require Mixed-Signal Testing.Melvin A. Breuer, Bozena Kaminska, John E. McDermid, V. Rayapathi, Donald L. Wheater
1996ICCDDesign for testability of integrated operational amplifiers using oscillation-test strategy.Karim Arabi, Bozena Kaminska, Stephen K. Sunter
1996ICCDTesting of embedded A/D converters in mixed-signal circuit.Naim Ben-Hamida, Bechir Ayari, Bozena Kaminska
1996ITCLIMSoft: Automated Tool for Design and Test Integration of Analog Circuits.Naim Ben-Hamida, Khaled Saab, David Marche, Bozena Kaminska, Guy Quesnel
1996VTSOscillation-test strategy for analog and mixed-signal integrated circuits.Karim Arabi, Bozena Kaminska
1996VTSA new digital test approach for analog-to-digital converter testing.Mehdi Ehsanian, Bozena Kaminska, Karim Arabi
1996VTSIs High Frequency Analog DFT Possible?Bozena Kaminska, Tad A. Kwasniewski, Linda S. Milor, G. Roberts, P. Flahive, Jrme Wojcik
1996VTSDesign and performance of CMOS TSPC cells for high speed pseudo random testing.Mohamed Soufi, Steve Rochon, Yvon Savaria, Bozena Kaminska
1995DATEAutomatic test vector generation for mixed-signal circuits.Bechir Ayari, Naim Ben-Hamida, Bozena Kaminska
1995ISCASBDD-FTEST: Fast, Backtrack-Free Test Generator Based on Binary Decision Diagram Representation.Bechir Ayari, Bozena Kaminska
1995ISCASMixed Deterministic and Pseudorandom Test Vector Generator Based on Cellular Automata Structures.Samir Boubezari, Bozena Kaminska
1995ISCASRetiming for BIST-Sequential Circuits.Samir Lejmi, Bozena Kaminska, Bechir Ayari
1995ISCASOn Using Partial Reset for Pseudo-Random Testing.Mohamed Soufi, Yvon Savaria, Bozena Kaminska
1995ITCSynthesis and Retiming for the Pseudo-Exhaustive BIST of Synchronous Sequential Circuits.Samir Lejmi, Bozena Kaminska, Bechir Ayari
1995VTSFrequency-based BIST for analog circuit testin.Khaled Saab, Bozena Kaminska, Bernard Courtois, Marcelo Lubaszewski
1995VTSRetiming, resynthesis, and partitioning for the pseudo-exhaustive testing of sequential circuits.Samir Lejmi, Bozena Kaminska, Bechir Ayari
1995VTSOn the design of at-speed testable VLSI circuits.Mohamed Soufi, Yvon Savaria, Bozena Kaminska
1994ICCADA new built-in self-test approach for digital-to-analog and analog-to-digital converters.Karim Arabi, Bozena Kaminska, Janusz Rzeszut
1994ICCDRetiming for the Global Optimization of Synchronous Sequential Circuits.Samir Lejmi, Bozena Kaminska, Edouard Wagneur
1994ISCASHigh Level Synthesis with Testability Constraints.Naim Ben-Hamida, Bozena Kaminska
1994ISCASPseudo-Random Vector Compaction for Sequential Testability.Naim Ben-Hamida, Bozena Kaminska, Yvon Savaria
1994ITCAn Integrated Approach for Analog Ciruit Testing with a Minmum Number of Detected Parameters.Mustapha Slamani, Bozena Kaminska, Guy Quesnel
1994ITCApplication of Optoelectronic Techniques to High Speed Testing.Ewa Sokolowska, Bozena Kaminska
1994VLSIDMultiple Fault Testing in Analog Circuits.Naim Ben-Hamida, Bozena Kaminska
1994VLSIDData Path Testability Evaluation via Functional Testability Measures.Mohamed Jamoussi, Bozena Kaminska
1994VTSMultifrequency testability analysis for analog circuits.Mustapha Slamani, Bozena Kaminska
1993ISCASScheduling of a Control and Data Flow Graph.Said Amellal, Bozena Kaminska
1993ISCASInitiability: A Measure of Sequential Testability.Naim Ben-Hamida, Bozena Kaminska, Yvon Savaria
1993ISCASA Functional-level Testability Evaluation Using a New M-Testability.Mohamed Jamoussi, Bozena Kaminska
1993ISCASResynthesis and Retiming of Synchronous Sequential Cirucits.Samir Lejmi, Bozena Kaminska, Edouard Wagneur
1993ITCAnalog Circuit Testing Based on Sensitivity Computation and New Circuit Modeling.Naim Ben-Hamida, Bozena Kaminska
1993VTSControllability and observability measures for functional-level testability evaluation.Mohamed Jamoussi, Bozena Kaminska
1989ITCDesign-for-Testability Using Test Design Yield and Decision Theory.Bozena Kaminska, Yvon Savaria
1989ITCA Pragmatic Approach to the Design of Self-Testing Circuits.Yvon Savaria, Bruno Lagu, Bozena Kaminska
1988ITCDetection of Hard Faults in a Combinational Circuit Using Budget Constraints.David Stannard, Bozena Kaminska