Bram Kruseman
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
24
Venues
5
Active years
1999–2016
Best venue rank
A
Where they publish
Papers
24 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2016 | ETS | ETS 2016 foreword. | Said Hamdioui, Giorgio Di Natale, Bram Kruseman, Maria K. Michael, Haralampos-G. D. Stratigopoulos |
| 2015 | ETS | Testing of Analog/Mixed Signal ICs: Past, present and future. | Bram Kruseman |
| 2013 | ETS | Panel session what is the electronics industry doing to win the battle against the expected scary failure rates in future technology nodes? | Said Hamdioui, Davide Appello, Arnaud Grasset, Xinli Gu, Bram Kruseman, Riccardo Mariani, Hermann Obermeir, Srikanth Venkataraman |
| 2011 | DATE | Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example. | Hamidreza Hashempour, Jos Dohmen, Bratislav Tasic, Bram Kruseman, Camelia Hora, Maikel van Beurden, Yizi Xing |
| 2011 | ITC | Defect Oriented Testing for analog/mixed-signal devices. | Bram Kruseman, Bratislav Tasic, Camelia Hora, Jos Dohmen, Hamidreza Hashempour, Maikel van Beurden, Yizi Xing |
| 2010 | DATE | NIM- a noise index model to estimate delay discrepancies between silicon and simulation. | Elif Alpaslan, Jennifer Dworak, Bram Kruseman, Ananta K. Majhi, Wilmar M. Heuvelman, Paul van de Wiel |
| 2010 | ETS | Diagnosis of full open defects in interconnect lines with fan-out. | Rosa Rodrguez-Montas, Daniel Arum, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman |
| 2010 | VLSID | Impact of Temperature on Test Quality. | Lavanya Jagan, Camelia Hora, Bram Kruseman, Stefan Eichenberger, Ananta K. Majhi, V. Kamakoti |
| 2008 | ITC | Towards a World Without Test Escapes: The Use of Volume Diagnosis to Improve Test Quality. | Stefan Eichenberger, Jeroen Geuzebroek, Camelia Hora, Bram Kruseman, Ananta K. Majhi |
| 2008 | ITC | Time-dependent Behaviour of Full Open Defects in Interconnect Lines. | Rosa Rodrguez-Montas, Daniel Arum, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman |
| 2008 | VTS | Full Open Defects in Nanometric CMOS. | Daniel Arum, Rosa Rodrguez-Montas, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman |
| 2007 | VTS | Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages. | Daniel Arum, Rosa Rodrguez-Montas, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi |
| 2007 | VTS | On Performance Testing with Path Delay Patterns. | Bram Kruseman, Ananta K. Majhi, Guido Gronthoud |
| 2007 | VTS | Diagnosis of Full Open Defects in Interconnecting Lines. | Rosa Rodrguez-Montas, Daniel Arum, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi |
| 2006 | DATE | On test conditions for the detection of open defects. | Bram Kruseman, Manuel Heiligers |
| 2006 | ITC | Power Supply Noise in Delay Testing. | Jing Wang, D. M. H. Walker, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul van de Wiel, Stefan Eichenberger |
| 2004 | ITC | On Hazard-free Patterns for Fine-delay Fault Testing. | Bram Kruseman, Ananta K. Majhi, Guido Gronthoud, Stefan Eichenberger |
| 2004 | ITC | Systematic Defects in Deep Sub-Micron Technologies. | Bram Kruseman, Ananta K. Majhi, Camelia Hora, Stefan Eichenberger, Johan Meirlevede |
| 2004 | ITC | Trends in Testing Integrated Circuits. | Bart Vermeulen, Camelia Hora, Bram Kruseman, Erik Jan Marinissen, Robert Van Rijsinge |
| 2003 | ITC | Detection of Resistive Shorts in Deep Sub-micron Technologies. | Bram Kruseman, Stefan van den Oetelaar |
| 2002 | ITC | Comparison of IDDQ Testing and Very-Low Voltage Testing. | Bram Kruseman, Stefan van den Oetelaar, Josep Rius |
| 2001 | ITC | The future of delta I_DDQ testing. | Bram Kruseman, Rudger van Veen, Kees van Kaam |
| 2000 | ETS | Comparison of defect detection capabilities of current-based and voltage-based test methods. | Bram Kruseman |
| 1999 | ITC | Transient current testing of 0.25 μm CMOS devices. | Bram Kruseman, Peter Janssen, Victor Zieren |