Camelia Hora
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
17
Venues
5
Active years
2002–2011
Best venue rank
A
Where they publish
Papers
17 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2011 | DATE | Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example. | Hamidreza Hashempour, Jos Dohmen, Bratislav Tasic, Bram Kruseman, Camelia Hora, Maikel van Beurden, Yizi Xing |
| 2011 | ITC | Defect Oriented Testing for analog/mixed-signal devices. | Bram Kruseman, Bratislav Tasic, Camelia Hora, Jos Dohmen, Hamidreza Hashempour, Maikel van Beurden, Yizi Xing |
| 2010 | ETS | Diagnosis of full open defects in interconnect lines with fan-out. | Rosa Rodrguez-Montas, Daniel Arum, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman |
| 2010 | VLSID | Impact of Temperature on Test Quality. | Lavanya Jagan, Camelia Hora, Bram Kruseman, Stefan Eichenberger, Ananta K. Majhi, V. Kamakoti |
| 2009 | ITC | Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs. | Friedrich Hapke, Rene Krenz-Baath, Andreas Glowatz, Jrgen Schlffel, Hamidreza Hashempour, Stefan Eichenberger, Camelia Hora, Dan Adolfsson |
| 2008 | ITC | Towards a World Without Test Escapes: The Use of Volume Diagnosis to Improve Test Quality. | Stefan Eichenberger, Jeroen Geuzebroek, Camelia Hora, Bram Kruseman, Ananta K. Majhi |
| 2008 | ITC | Time-dependent Behaviour of Full Open Defects in Interconnect Lines. | Rosa Rodrguez-Montas, Daniel Arum, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman |
| 2008 | VTS | Full Open Defects in Nanometric CMOS. | Daniel Arum, Rosa Rodrguez-Montas, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman |
| 2007 | VTS | Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages. | Daniel Arum, Rosa Rodrguez-Montas, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi |
| 2007 | VTS | Diagnosis of Full Open Defects in Interconnecting Lines. | Rosa Rodrguez-Montas, Daniel Arum, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi |
| 2006 | VTS | A Gate-Level Method for Transistor-Level Bridging Fault Diagnosis. | Xinyue Fan, Will R. Moore, Camelia Hora, Mario Konijnenburg, Guido Gronthoud |
| 2005 | ETS | Stuck-open fault diagnosis with stuck-at model. | Xinyue Fan, Will R. Moore, Camelia Hora, Guido Gronthoud |
| 2005 | ITC | A novel stuck-at based method for transistor stuck-open fault diagnosis. | Xinyue Fan, Will R. Moore, Camelia Hora, Guido Gronthoud |
| 2004 | ITC | Systematic Defects in Deep Sub-Micron Technologies. | Bram Kruseman, Ananta K. Majhi, Camelia Hora, Stefan Eichenberger, Johan Meirlevede |
| 2004 | ITC | Trends in Testing Integrated Circuits. | Bart Vermeulen, Camelia Hora, Bram Kruseman, Erik Jan Marinissen, Robert Van Rijsinge |
| 2003 | VTS | Improving Diagnostic Resolution of Delay Faults using Path Delay Fault Model. | Ananta K. Majhi, Guido Gronthoud, Camelia Hora, Maurice Lousberg, Pop Valer, Stefan Eichenberger |
| 2002 | ITC | An Effective Diagnosis Method to Support Yield Improvement. | Camelia Hora, Rene Segers, Stefan Eichenberger, Maurice Lousberg |