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Daniel Arum

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

10

Venues

4

Active years

2005–2024

Best venue rank

B

Where they publish

Papers

10 indexed papers, newest first.

YearVenueTitleAuthors
2024IOLTSOn the Fine Tuning of RRAM Resistance Under Variability Using Current Pulses at SET.Vahab Mahboubi, . Gmez, Antonio Calomarde, Daniel Arum, R. Rodrguez, Salvador Manich
2014ETSPost-bond test of Through-Silicon Vias with open defects.Rosa Rodrguez-Montas, Daniel Arum, Joan Figueras
2014IOLTSPre-bond testing of weak defects in TSVs.Daniel Arum, Rosa Rodrguez-Montas, Joan Figueras
2013ETSBIST architecture to detect defects in tsvs during pre-bond testing.Daniel Arum, Rosa Rodrguez-Montas, Joan Figueras
2010ETSDiagnosis of full open defects in interconnect lines with fan-out.Rosa Rodrguez-Montas, Daniel Arum, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
2008ITCTime-dependent Behaviour of Full Open Defects in Interconnect Lines.Rosa Rodrguez-Montas, Daniel Arum, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
2008VTSFull Open Defects in Nanometric CMOS.Daniel Arum, Rosa Rodrguez-Montas, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
2007VTSDiagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages.Daniel Arum, Rosa Rodrguez-Montas, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi
2007VTSDiagnosis of Full Open Defects in Interconnecting Lines.Rosa Rodrguez-Montas, Daniel Arum, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi
2005ETSDefective behaviours of resistive opens in interconnect lines.Daniel Arum, Rosa Rodrguez-Montas, Joan Figueras