| 2026 | ETS | Extending FPGA-based NRZ Test Signals Beyond 100 Gbps. | David C. Keezer, Cao Wang, Shengbo Liu, Xiaochun Li, Yindong Xiao |
| 2025 | ETS | Synthesizing 56 Gbps NRZ Test Signals Using FPGAs and SiGe Logie. | David C. Keezer, Cao Wang, Shengbo Liu |
| 2025 | ITC | FPGA Synthesis of Arbitrary Jitter Injection for Multi-GHz Test Signals. | Shengbo Liu, Yindong Xiao, Cao Wang, Xiaochun Li, David C. Keezer |
| 2025 | ITC | Experimental Comparison of Multiplexing Methods for 28 to 64 Gbps NRZ Test Signals. | Cao Wang, Shengbo Liu, Ming Cheng, Yindong Xiao, Xiaochun Li, David C. Keezer |
| 2024 | ETS | Characterization of Ultra-low Random Jitter Reduction Methods up to 36 GHz. | David C. Keezer, Dany Minier, Hongjie Li |
| 2019 | ITC | A Framework for Design of Self-Repairing Digital Systems. | Jingchi Yang, David C. Keezer |
| 2016 | ETS | A 40Gbps economic extension board and FPGA-based testing platform. | Te-Hui Chen, David C. Keezer |
| 2015 | ETS | An FPGA-based ATE extension module for low-cost multi-GHz memory test. | David C. Keezer, Te-Hui Chen, Thomas Moon, D. T. Stonecypher, Abhijit Chatterjee, Hyun Woo Choi, Sungyeol Kim, Hosun Yoo |
| 2014 | CASES | A signature based architecture for Trojan detection. | Aderinola Gbade-Alabi, David C. Keezer, Vincent John Mooney, Axel York Poschmann, Marc Stttinger, Kshitij Divekar |
| 2014 | VTS | Multi-channel testing architecture for high-speed eye-diagram using pin electronics and subsampling monobit reconstruction algorithms. | Thomas Moon, Hyun Woo Choi, David C. Keezer, Abhijit Chatterjee |
| 2013 | ITC | Practical methods for extending ATE to 40 and 50Gbps. | David C. Keezer, Carl Edward Gray, Te-Hui Chen, Ashraf Majid |
| 2012 | ITC | Multi-gigahertz arbitrary timing generator and data pattern serializer/formatter. | David C. Keezer, Te-Hui Chen, Carl Edward Gray, Hyun Woo Choi, Sungyeol Kim, Seongkwan Lee, Hosun Yoo |
| 2011 | DATE | Two methods for 24 Gbps test signal synthesis. | David C. Keezer, Carl Edward Gray |
| 2011 | ITC | Multi-function multi-GHz ATE extension using state-of-the-art FPGAs. | A. M. Majid, David C. Keezer |
| 2010 | DATE | Stretching the limits of FPGA SerDes for enhanced ATE performance. | A. M. Majid, David C. Keezer |
| 2010 | FPGA | An architecture for graphics processing in an FPGA (abstract only). | Marcus Dutton, David C. Keezer |
| 2009 | ITC | A development platform and electronic modules for automated test up to 20 Gbps. | David C. Keezer, Carl Gray, A. M. Majid, Dany Minier, Patrice Ducharme |
| 2008 | DATE | Variable Delay of Multi-Gigahertz Digital Signals for Deskew and Jitter-Injection Test Applications. | David C. Keezer, Dany Minier, Patrice Ducharme |
| 2008 | ITC | An Electronic Module for 12.8 Gbps Multiplexing and Loopback Test. | David C. Keezer, Dany Minier, Patrice Ducharme, A. M. Majid |
| 2007 | DATE | Method for reducing jitter in multi-gigahertz ATE. | David C. Keezer, Dany Minier, Patrice Ducharme |
| 2007 | ITC | Co-development of test electronics and PCI Express interface for a multi-Gbps optical switching network. | Carl Edward Gray, Odile Liboiron-Ladouceur, David C. Keezer, Keren Bergman |
| 2007 | ITC | Multi-GHz loopback testing using MEMs switches and SiGe logic. | David C. Keezer, Dany Minier, Patrice Ducharme, Doris Viens, Greg Flynn, John McKillop |
| 2006 | ITC | Multi-Gigahertz Testing of Wafer-Level Packaged Devices. | A. M. Majid, David C. Keezer, Jayasanker Jayabalan, Mihai Rotaru |
| 2005 | DATE | Low-Cost Multi-Gigahertz Test Systems Using CMOS FPGAs and PECL. | David C. Keezer, Carl Gray, Ashraf M. Majid, Nafeez Taher |
| 2004 | ITC | Modular Extension of ATE to 5 Gbps. | David C. Keezer, Dany Minier, F. Binette |
| 2003 | ITC | Application and Demonstration of a Digital Test Core: Optoelectronic Test Bed and Wafer-level Prober. | John S. Davis, David C. Keezer, Odile Liboiron-Ladouceur, Keren Bergman |
| 2003 | ITC | A Production-Oriented Multiplexing System for Testing above 2.5 Gbps. | David C. Keezer, Dany Minier, Marie-Christine Caron |
| 2002 | ITC | Multi-Purpose Digital Test Core Utilizing Programmable Logic. | John S. Davis, David C. Keezer |
| 2002 | ITC | Challenges and Solutions for Multi-Gigahertz Testing. | David C. Keezer |
| 2002 | VTS | Multi-GigaHertz Testing Challenges and Solutions. | Karim Arabi, Klaus-Dieter Hilliges, David C. Keezer, Sassan Tabatabaei |
| 2001 | ITC | Terabit-per-second automated digital testing. | David C. Keezer, Q. Zhou, C. Bair, J. Kuan, B. Poole |
| 1999 | ITC | Test support processors for enhanced testability of high performance circuits. | David C. Keezer, Q. Zhou |
| 1998 | ITC | Improved sensitivity for parallel test of substrate interconnections. | David C. Keezer, K. E. Newman, John S. Davis |
| 1998 | ITC | Alternative interface methods for testing high speed bidirectional signals. | David C. Keezer, Q. Zhou |
| 1998 | ITC | A high throughput test methodology for MCM substrates. | Bruce C. Kim, David C. Keezer, Abhijit Chatterjee |
| 1997 | ITC | Low-Cost ATE PinElectronics for Multigigabit-per-Second At-Speed Test. | David C. Keezer, R. J. Wenzel |
| 1997 | ITC | A Low-Cost Massively-Parallel Interconnect Test Method for MCM Substrates. | K. E. Newman, David C. Keezer |
| 1995 | ITC | Electrical Troubleshooting, Diagnostics, and Repair of Multichip Modules. | David C. Keezer |
| 1993 | ICCD | SMAC: A Scene Matching Chip. | N. Ranganathan, Raghu Sastry, Raguveer Venkatesan, Joseph W. Yoder, David C. Keezer |
| 1993 | ITC | Known Godd Die for MCMs: Enabling Technologies. | David C. Keezer |
| 1992 | ITC | MCM Test Using Available Technology. | David C. Keezer |
| 1992 | ITC | Calibration Techniques for a Gigahertz Test System. | David C. Keezer, R. J. Wenzel |
| 1991 | ITC | High Frequency Wafer Probing and Power Supply Resonance Effects. | S. P. Athan, David C. Keezer, J. McKinley |
| 1991 | ITC | Real-Time Data Comparison for GigaHertz Digital Test. | David C. Keezer |
| 1990 | ITC | Multiplexing test system channels for data rates above 1 Gb/s. | David C. Keezer |
| 1985 | ITC | Tester Independent Support Software System (TISSS). | L. J. Falkenstrom, David C. Keezer, A. Patterson, Robert M. Rolfe, J. Wolcott |