Davide Appello
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
37
Venues
6
Active years
2002–2025
Best venue rank
B
Where they publish
Papers
37 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2025 | ETS | AI-Assisted Framework for Real-Time Monitoring and Management of Probe Cards in Electrical Wafer Sort Applications. | Mehdi Bejani, Davide Appello, Marco Mauri, Simone Todaro, Stefano Mariani |
| 2024 | DATE | An AI-Enabled Framework for Smart Semiconductor Manufacturing. | Khaled Sidahmed Sidahmed Alamin, Davide Appello, Alessandro Beghi, Nicola Dall'Ora, Fabio Depaoli, Santa Di Cataldo, Franco Fummi, Sebastiano Gaiardelli, Michele Lora, Enrico Macii, Alessio Mascolini, Daniele Pagano, Francesco Ponzio, Gian Antonio Susto, Sara Vinco |
| 2023 | DDECS | Collecting diagnostic information through dichotomic search from Logic BIST of failing in-field automotive SoCs with delay faults. | Paolo Bernardi, Gabriele Filipponi, Matteo Sonza Reorda, Davide Appello, Claudia Bertani, Vincenzo Tancorre |
| 2023 | IOLTS | About the Correlation between Logical Identified Faulty Gates and their Layout Characteristics. | Paolo Bernardi, Lorenzo Cardone, Giusy Iaria, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre |
| 2023 | VTS | A guided debugger-based fault injection methodology for assessing functional test programs. | Francesco Angione, Paolo Bernardi, Nicola Di Gruttola Giardino, Davide Appello, Claudia Bertani, Vincenzo Tancorre |
| 2022 | ETS | Test, Reliability and Functional Safety Trends for Automotive System-on-Chip. | Francesco Angione, Davide Appello, Joseph Aribido, Jyotika Athavale, Nicol Bellarmino, Paolo Bernardi, Riccardo Cantoro, Corrado De Sio, Tommaso Foscale, Gabriele Gavarini, Juan-David Guerrero-Balaguera, Martin Huch, Giusy Iaria, Tobias Kilian, Riccardo Mariani, Raffaele Martone, Annachiara Ruospo, Ernesto Snchez, Ulf Schlichtmann, Giovanni Squillero, Matteo Sonza Reorda, Luca Sterpone, Vincenzo Tancorre, Roberto Ugioli |
| 2022 | ETS | An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip. | Francesco Angione, Paolo Bernardi, Gabriele Filipponi, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre, Roberto Ugioli |
| 2022 | ITC | An innovative Strategy to Quickly Grade Functional Test Programs. | Francesco Angione, Paolo Bernardi, Andrea Calabrese, Lorenzo Cardone, A. Niccoletti, Davide Piumatti, Stefano Quer, Davide Appello, Vincenzo Tancorre, Roberto Ugioli |
| 2022 | ITC | In-field Data Collection System through Logic BIST for large Automotive Systems-on-Chip. | Gabriele Filipponi, Giusy Iaria, Matteo Sonza Reorda, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre |
| 2021 | DDECS | Accelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures. | Davide Appello, Paolo Bernardi, Andrea Calabrese, Stefano Littardi, Giorgio Pollaccia, Stefano Quer, Vincenzo Tancorre, Roberto Ugioli |
| 2021 | IOLTS | System-Level Test: State of the Art and Challenges. | Davide Appello, H. H. Chen, Matthias Sauer, Ilia Polian, Paolo Bernardi, Matteo Sonza Reorda |
| 2020 | DDECS | Applicative System Level Test introduction to Increase Confidence on Screening Quality. | Paolo Bernardi, Marco Restifo, Matteo Sonza Reorda, Davide Appello, Claudia Bertani, D. Petrali |
| 2019 | DDECS | Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test. | F. Almeida, Paolo Bernardi, D. Calabrese, Marco Restifo, Matteo Sonza Reorda, Davide Appello, Giorgio Pollaccia, Vincenzo Tancorre, Roberto Ugioli, Gulio Zoppi |
| 2017 | DATE | A comprehensive methodology for stress procedures evaluation and comparison for Burn-In of automotive SoC. | Davide Appello, Paolo Bernardi, G. Giacopelli, Alessandro Motta, Alberto Pagani, Giorgio Pollaccia, C. Rabbi, Marco Restifo, P. Ruberg, Ernesto Snchez, C. M. Villa, Federico Venini |
| 2013 | ETS | Panel session what is the electronics industry doing to win the battle against the expected scary failure rates in future technology nodes? | Said Hamdioui, Davide Appello, Arnaud Grasset, Xinli Gu, Bram Kruseman, Riccardo Mariani, Hermann Obermeir, Srikanth Venkataraman |
| 2013 | ETS | Current testing: Dead or alive? | Hans A. R. Manhaeve, Pete Harrod, Adit D. Singh, Chintan Patel, Ralf Arnolc, Davide Appello |
| 2011 | DDECS | Optimized embedded memory diagnosis. | Mauricio de Carvalho, Paolo Bernardi, Matteo Sonza Reorda, Nicola Campanelli, Tamas Kerekes, Davide Appello, Mario Barone, Vincenzo Tancorre, Marco Terzi |
| 2010 | DATE | Adapting to adaptive testing. | Erik Jan Marinissen, Adit D. Singh, Dan Glotter, Marco Esposito, John M. Carulli Jr., Amit Nahar, Kenneth M. Butler, Davide Appello, Chris Portelli |
| 2010 | DDECS | Safety features of SoCs: How can they be re-used? | Davide Appello |
| 2010 | DDECS | Cumulative embedded memory failure bitmap display & analysis. | Nicola Campanelli, Tamas Kerekes, Paolo Bernardi, Mauricio de Carvalho, Alessandro Panariti, Matteo Sonza Reorda, Davide Appello, Mario Barone |
| 2010 | IOLTS | Analysis of root causes of alpha sensitivity variations on microprocessors manufactured using different cell layouts. | Paolo Rech, Michelangelo Grosso, Fabio Melchiori, Domenico Loparco, Davide Appello, Luigi Dilillo, Alessandro Paccagnella, Matteo Sonza Reorda |
| 2009 | ETS | Automatic Functional Stress Pattern Generation for SoC Reliability Characterization. | Davide Appello, Paolo Bernardi, R. Cagliesi, M. Giancarlini, Michelangelo Grosso, Edgar E. Snchez, Matteo Sonza Reorda |
| 2009 | IOLTS | An I-IP based approach for the monitoring of NBTI effects in SoCs. | C. Guardiani, A. Shibkov, Angelo Brambilla, Giancarlo Storti Gajani, Davide Appello, Fausto Piazza, Paolo Bernardi |
| 2009 | IOLTS | Evaluating Alpha-induced soft errors in embedded microprocessors. | Paolo Rech, Simone Gerardin, Alessandro Paccagnella, Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda, Davide Appello |
| 2009 | VTS | DfT Reuse for Low-Cost Radiation Testing of SoCs: A Case Study. | Davide Appello, Paolo Bernardi, Simone Gerardin, Michelangelo Grosso, Alessandro Paccagnella, Paolo Rech, Matteo Sonza Reorda |
| 2008 | ETS | An Innovative and Low-Cost Industrial Flow for Reliability Characterization of SoCs. | Davide Appello, Paolo Bernardi, R. Cagliesi, M. Giancarlini, Michelangelo Grosso |
| 2008 | ITC | Robust Design-for-Productization Practices for High Quality Automotive Products. | Paolo Bernardi, Fabio Melchiori, Davide Pandini, Santo Pugliese, Davide Appello |
| 2007 | ITC | Automotive IC's: less testing, more prevention. | Davide Appello |
| 2006 | ITC | Embedded Memory Diagnosis: An Industrial Workflow. | Davide Appello, Vincenzo Tancorre, Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda |
| 2006 | VTS | Session Abstract. | Davide Appello |
| 2006 | VTS | On the Automation of the Test Flow of Complex SoCs. | Davide Appello, Vincenzo Tancorre, Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda |
| 2004 | VTS | Yield Analysis of Logic Circuits. | Davide Appello, Alessandra Fudoli, Katia Giarda, Emil Gizdarski, Ben Mathew, Vincenzo Tancorre |
| 2003 | ETS | A practical evaluation of I | Alessandra Fudoli, Alberto Ascagni, Davide Appello, Hans A. R. Manhaeve |
| 2003 | ITC | Exploiting Programmable BIST For The Diagnosis of Embedded Memory Cores. | Davide Appello, Paolo Bernardi, Alessandra Fudoli, Maurizio Rebaudengo, Matteo Sonza Reorda, Vincenzo Tancorre, Massimo Violante |
| 2002 | IOLTS | A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. | Davide Appello, Alessandra Fudoli, Vincenzo Tancorre, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda |
| 2002 | ITC | The Yield of Test Outsourcing. | Davide Appello |
| 2002 | ITC | High Accuracy Stimulus Generation for A/D Converter BIST. | Aubin Roy, Stephen K. Sunter, Alessandra Fudoli, Davide Appello |