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Dhruv Thapar

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

10

Venues

4

Active years

2023–2026

Best venue rank

A

Where they publish

Papers

10 indexed papers, newest first.

YearVenueTitleAuthors
2026ASPDACWARP: Workload-Aware Reference Prediction for Reliable Multi-Bit FeFET Readout under Charge-Trapping Degradation.Dhruv Thapar, Ashish Reddy Bommana, Arjun Chaudhuri, Kai Ni, Krishnendu Chakrabarty
2026VTSNERT: Network- and Routing-aware Testing of Interconnects in Fanout Wafer-Level Packaging.Dhruv Thapar, Partho Bhoumik, Arjun Chaudhuri, Krishnendu Chakrabarty
2026VTSWARP-TPG: Warpage-Aware Test Pattern Generation for Small-Delay Defects.Dhruv Thapar, Arjun Chaudhuri, Krishnendu Chakrabarty
2025DATEOn the Impact of Warpage on BEOL Geometry and Path Delays in Fan-out Wafer-Level Packaging.Dhruv Thapar, Arjun Chaudhuri, Christopher Bailey, Ravi Mahajan, Krishnendu Chakrabarty
2025ITCSMART: Scalable and Modular Architecture for Routing-Aware Testing of Fan-out Wafer-Level PackagesPartho Bhoumik, Dhruv Thapar, Arjun Chaudhuri, Krishnendu Chakrabarty
2025ITCNeuralTPG: GPU-Accelerated Neural Twin-Based Test Pattern Generation for Transition Delay Faults in Safety-Critical Applications.Xuanyi Tan, Gitanjali Mukherjee, Dhruv Thapar, Arjun Chaudhuri, Sanmitra Banerjee, Rubin A. Parekhji, Krishnendu Chakrabarty
2025ITCFeTest: Defect Analysis and March Test Solution for FeFETsDhruv Thapar, Arjun Chaudhuri, Kai Ni, Krishnendu Chakrabarty
2024ITCSafety-Guided Test Generation for Structural Faults.Xuanyi Tan, Dhruv Thapar, Deepesh Sahoo, Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty, Rubin A. Parekhji
2024ITCDefect Analysis for FeFETs using a Compact Model.Dhruv Thapar, Arjun Chaudhuri, Kai Ni, Krishnendu Chakrabarty
2023ITCAnalysis and Characterization of Defects in FeFETs.Dhruv Thapar, Simon Thomann, Arjun Chaudhuri, Hussam Amrouch, Krishnendu Chakrabarty