NERT: Network- and Routing-aware Testing of Interconnects in Fanout Wafer-Level Packaging.
Dhruv Thapar, Partho Bhoumik, Arjun Chaudhuri, Krishnendu Chakrabarty
Browse the full VTS paper archive.
Dhruv Thapar, Partho Bhoumik, Arjun Chaudhuri, Krishnendu Chakrabarty
Browse the full VTS paper archive.