| 2026 | ASPDAC | WARP: Workload-Aware Reference Prediction for Reliable Multi-Bit FeFET Readout under Charge-Trapping Degradation. | Dhruv Thapar, Ashish Reddy Bommana, Arjun Chaudhuri, Kai Ni, Krishnendu Chakrabarty |
| 2026 | VTS | NERT: Network- and Routing-aware Testing of Interconnects in Fanout Wafer-Level Packaging. | Dhruv Thapar, Partho Bhoumik, Arjun Chaudhuri, Krishnendu Chakrabarty |
| 2026 | VTS | WARP-TPG: Warpage-Aware Test Pattern Generation for Small-Delay Defects. | Dhruv Thapar, Arjun Chaudhuri, Krishnendu Chakrabarty |
| 2025 | ANT | Consumer-Driven Sustainability Transitions in the Food Supply Chain: An Initial Simulation Framework. | Arjun Chaudhuri, Rishi Chilekampally, Nayan Manu Krishna Bindhu, Moscara Andrea, Rob H. Bemthuis |
| 2025 | DATE | On the Impact of Warpage on BEOL Geometry and Path Delays in Fan-out Wafer-Level Packaging. | Dhruv Thapar, Arjun Chaudhuri, Christopher Bailey, Ravi Mahajan, Krishnendu Chakrabarty |
| 2025 | ITC | Fault Modeling and Testing of Chiplet-to-Chiplet Interconnects in Fan-out Wafer-Level Packaging | Partho Bhoumik, Arjun Chaudhuri, Sandeep Kumar Goel, Krishnendu Chakrabarty |
| 2025 | ITC | SMART: Scalable and Modular Architecture for Routing-Aware Testing of Fan-out Wafer-Level Packages | Partho Bhoumik, Dhruv Thapar, Arjun Chaudhuri, Krishnendu Chakrabarty |
| 2025 | ITC | NeuralTPG: GPU-Accelerated Neural Twin-Based Test Pattern Generation for Transition Delay Faults in Safety-Critical Applications. | Xuanyi Tan, Gitanjali Mukherjee, Dhruv Thapar, Arjun Chaudhuri, Sanmitra Banerjee, Rubin A. Parekhji, Krishnendu Chakrabarty |
| 2025 | ITC | FeTest: Defect Analysis and March Test Solution for FeFETs | Dhruv Thapar, Arjun Chaudhuri, Kai Ni, Krishnendu Chakrabarty |
| 2025 | VTS | Hardware Security and Test for AMS Circuits. | Arjun Chaudhuri |
| 2025 | VTS | AI for Test : (Innovation Practices Track). | Arjun Chaudhuri, Soyed Tuhin Ahmed |
| 2025 | VTS | Revisiting Microelectronics Resilience and Reliability in the Era of AI. | Arjun Chaudhuri, Bonita Bhaskaran |
| 2024 | ITC | Safety-Guided Test Generation for Structural Faults. | Xuanyi Tan, Dhruv Thapar, Deepesh Sahoo, Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty, Rubin A. Parekhji |
| 2024 | ITC | Defect Analysis for FeFETs using a Compact Model. | Dhruv Thapar, Arjun Chaudhuri, Kai Ni, Krishnendu Chakrabarty |
| 2023 | DATE | Securing Heterogeneous 2.5D ICs Against IP Theft through Dynamic Interposer Obfuscation. | Jonti Talukdar, Arjun Chaudhuri, Jinwoo Kim, Sung Kyu Lim, Krishnendu Chakrabarty |
| 2023 | ETS | Test-Point Insertion for Power-Safe Testing of Monolithic 3D ICs using Reinforcement Learning | Shao-Chun Hung, Arjun Chaudhuri, Krishnendu Chakrabarty |
| 2023 | ITC | Scan Cell Segmentation Based on Reinforcement Learning for Power-Safe Testing of Monolithic 3D ICs. | Shao-Chun Hung, Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty |
| 2023 | ITC | Analysis and Characterization of Defects in FeFETs. | Dhruv Thapar, Simon Thomann, Arjun Chaudhuri, Hussam Amrouch, Krishnendu Chakrabarty |
| 2023 | VTS | Functional Test Generation for AI Accelerators using Bayesian Optimization | Arjun Chaudhuri, Ching-Yuan Chen, Jonti Talukdar, Krishnendu Chakrabarty |
| 2023 | VTS | Special Session: Using Graph Neural Networks for Tier-Level Fault Localization in Monolithic 3D ICs | Shao-Chun Hung, Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty |
| 2023 | VTS | Innovation Practices Track: Testability and Dependability of AI Hardware and Autonomous Systems. | Fei Su, Eric Zhang, Arjun Chaudhuri, Michael Paulitsch |
| 2022 | DATE | Graph Neural Network-based Delay-Fault Localization for Monolithic 3D ICs. | Shao-Chun Hung, Sanmitra Banerjee, Arjun Chaudhuri, Krishnendu Chakrabarty |
| 2022 | DATE | Graph Neural Network-based Delay-Fault Localization for Monolithic 3D ICs. | Shao-Chun Hung, Sanmitra Banerjee, Arjun Chaudhuri, Krishnendu Chakrabarty |
| 2022 | ETS | TaintLock: Preventing IP Theft through Lightweight Dynamic Scan Encryption using Taint Bits | Jonti Talukdar, Arjun Chaudhuri, Krishnendu Chakrabarty |
| 2022 | ICCAD | Machine Learning for Testing Machine-Learning Hardware: A Virtuous Cycle. | Arjun Chaudhuri, Jonti Talukdar, Krishnendu Chakrabarty |
| 2022 | IOLTS | Structural Test Generation for AI Accelerators using Neural Twins. | Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty |
| 2022 | ITC | Fault Diagnosis for Resistive Random-Access Memory and Monolithic Inter-tier Vias in Monolithic 3D Integration. | Shao-Chun Hung, Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty |
| 2022 | ITC | Automatic Structural Test Generation for Analog Circuits using Neural Twins. | Jonti Talukdar, Arjun Chaudhuri, Mayukh Bhattacharya, Krishnendu Chakrabarty |
| 2022 | VTS | Special Session: Fault Criticality Assessment in AI Accelerators. | Arjun Chaudhuri, Jonti Talukdar, Krishnendu Chakrabarty |
| 2021 | DATE | Advances in Testing and Design-for-Test Solutions for M3D Integrated Circuits. | Sanmitra Banerjee, Arjun Chaudhuri, Shao-Chun Hung, Krishnendu Chakrabarty |
| 2021 | DATE | Fault-Criticality Assessment for AI Accelerators using Graph Convolutional Networks. | Arjun Chaudhuri, Jonti Talukdar, Jinwook Jung, Gi-Joon Nam, Krishnendu Chakrabarty |
| 2021 | ICCAD | ParaMitE: Mitigating Parasitic CNFETs in the Presence of Unetched CNTs. | Sanmitra Banerjee, Arjun Chaudhuri, Jinwoo Kim, Gauthaman Murali, Mark Nelson, Sung Kyu Lim, Krishnendu Chakrabarty |
| 2021 | ITC | Efficient Fault-Criticality Analysis for AI Accelerators using a Neural Twin | Arjun Chaudhuri, Ching-Yuan Chen, Jonti Talukdar, Siddarth Madala, Abhishek Kumar Dubey, Krishnendu Chakrabarty |
| 2020 | ICCAD | RTL-to-GDS Design Tools for Monolithic 3D ICs. | Jinwoo Kim, Gauthaman Murali, Pruek Vanna-Iampikul, Edward Lee, Daehyun Kim, Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty, Saibal Mukhopadhyay, Sung Kyu Lim |
| 2020 | ITC | Functional Criticality Classification of Structural Faults in AI Accelerators. | Arjun Chaudhuri, Jonti Talukdar, Fei Su, Krishnendu Chakrabarty |
| 2019 | DAC | RTL-to-GDS Tool Flow and Design-for-Test Solutions for Monolithic 3D ICs. | Heechun Park, Kyungwook Chang, Bon Woong Ku, Jinwoo Kim, Edward Lee, Daehyun Kim, Arjun Chaudhuri, Sanmitra Banerjee, Saibal Mukhopadhyay, Krishnendu Chakrabarty, Sung Kyu Lim |
| 2019 | ETS | Built-in Self-Test for Inter-Layer Vias in Monolithic 3D ICs. | Arjun Chaudhuri, Sanmitra Banerjee, Heechun Park, Bon Woong Ku, Krishnendu Chakrabarty, Sung Kyu Lim |
| 2019 | ITC | Fault-Tolerant Neuromorphic Computing Systems. | Arjun Chaudhuri, Mengyun Liu, Krishnendu Chakrabarty |
| 2019 | ITC | Hardware Fault Tolerance for Binary RRAM Crossbars. | Arjun Chaudhuri, Bonan Yan, Yiran Chen, Krishnendu Chakrabarty |
| 2018 | ITC | Analysis of Process Variations, Defects, and Design-Induced Coupling in Memristors. | Arjun Chaudhuri, Krishnendu Chakrabarty |