Skip to content

Safety-Guided Test Generation for Structural Faults.

Xuanyi Tan, Dhruv Thapar, Deepesh Sahoo, Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty, Rubin A. Parekhji

VenueAITC
Year2024
ProceedingsITC

Browse the full ITC paper archive.