| 2018 | DATE | Characterization of possibly detected faults by accurately computing their detection probability. | Jan Burchard, Dominik Erb, Bernd Becker |
| 2017 | DATE | Fast and waveform-accurate hazard-aware SAT-based TSOF ATPG. | Jan Burchard, Dominik Erb, Adit D. Singh, Sudhakar M. Reddy, Bernd Becker |
| 2017 | VLSID | Accurate Diagnosis of Interconnect Open Defects Based on the Robust Enhanced Aggressor Victim Model. | Pascal Raiola, Dominik Erb, Sudhakar M. Reddy, Bernd Becker |
| 2017 | VTS | Efficient SAT-based generation of hazard-activated TSOF tests. | Jan Burchard, Dominik Erb, Sudhakar M. Reddy, Adit D. Singh, Bernd Becker |
| 2016 | ASPDAC | Mixed 01X-RSL-Encoding for fast and accurate ATPG with unknowns. | Dominik Erb, Karsten Scheibler, Michael A. Kochte, Matthias Sauer, Hans-Joachim Wunderlich, Bernd Becker |
| 2016 | DATE | Accurate CEGAR-based ATPG in presence of unknown values for large industrial designs. | Karsten Scheibler, Dominik Erb, Bernd Becker |
| 2015 | ETS | Improving test pattern generation in presence of unknown values beyond restricted symbolic logic. | Karsten Scheibler, Dominik Erb, Bernd Becker |
| 2015 | VTS | Multi-cycle Circuit Parameter Independent ATPG for interconnect open defects. | Dominik Erb, Karsten Scheibler, Matthias Sauer, Sudhakar M. Reddy, Bernd Becker |
| 2014 | DATE | Efficient SMT-based ATPG for interconnect open defects. | Dominik Erb, Karsten Scheibler, Matthias Sauer, Bernd Becker |
| 2014 | ITC | Test pattern generation in presence of unknown values based on restricted symbolic logic. | Dominik Erb, Karsten Scheibler, Michael A. Kochte, Matthias Sauer, Hans-Joachim Wunderlich, Bernd Becker |
| 2013 | DATE | Accurate QBF-based test pattern generation in presence of unknown values. | Stefan Hillebrecht, Michael A. Kochte, Dominik Erb, Hans-Joachim Wunderlich, Bernd Becker |