| 2019 | ETS | Digital Built-in Self-Test for Phased Locked Loops to Enable Fault Detection. | Mehmet Ince, Ender Yilmaz, Wei Fu, Joonsung Park, Krishnaswamy Nagaraj, LeRoy Winemberg, Sule Ozev |
| 2018 | VTS | Online information utility assessment for per-device adaptive test flow. | Yanjun Li, Ender Yilmaz, Peter Sarson, Sule Ozev |
| 2017 | ITC | Built-in self-test for stability measurement of low dropout regulator. | Jae Woong Jeong, Ender Yilmaz, LeRoy Winemberg, Sule Ozev |
| 2013 | DATE | Electrical calibration of spring-mass MEMS capacitive accelerometers. | Lingfei Deng, Vinay Kundur, Naveen Sai Jangala Naga, Muhlis Kenan Ozel, Ender Yilmaz, Sule Ozev, Bertan Bakkaloglu, Sayfe Kiaei, Divya Pratab, Tehmoor Dar |
| 2013 | DATE | Adaptive reduction of the frequency search space for multi-vdd digital circuits. | Chandra K. H. Suresh, Ender Yilmaz, Sule Ozev, Ozgur Sinanoglu |
| 2013 | DATE | Fault analysis and simulation of large scale industrial mixed-signal circuits. | Ender Yilmaz, Geoff Shofner, LeRoy Winemberg, Sule Ozev |
| 2013 | ETS | Adaptive quality binning for analog circuits. | Ender Yilmaz, Sule Ozev, Kenneth M. Butler |
| 2012 | ETS | Adaptive multi-site testing for analog/mixed-signal circuits incorporating neighborhood information. | Ender Yilmaz, Sule Ozev |
| 2012 | ETS | Adaptive testing: Conquering process variations. | Ender Yilmaz, Sule Ozev, Ozgur Sinanoglu, Peter C. Maxwell |
| 2011 | ETS | Fast and Accurate DPPM Computation Using Model Based Filtering. | Ender Yilmaz, Sule Ozev |
| 2011 | ITC | Adaptive multidimensional outlier analysis for analog and mixed signal circuits. | Ender Yilmaz, Sule Ozev, Kenneth M. Butler |
| 2011 | VTS | An industrial case study of analog fault modeling. | Ender Yilmaz, Anne Meixner, Sule Ozev |
| 2010 | ITC | Adaptive test flow for mixed-signal/RF circuits using learned information from device under test. | Ender Yilmaz, Sule Ozev, Kenneth M. Butler |
| 2009 | DAC | Adaptive test elimination for analog/RF circuits. | Ender Yilmaz, Sule Ozev |
| 2009 | ICCD | Defect-based test optimization for analog/RF circuits for near-zero DPPM applications. | Ender Yilmaz, Sule Ozev |
| 2009 | ITC | Built-in EVM measurement for OFDM transceivers using all-digital DFT. | Ender Yilmaz, Afsaneh Nassery, Sule Ozev, Erkan Acar |
| 2008 | ICCD | Dynamic test scheduling for analog circuits for improved test quality. | Ender Yilmaz, Sule Ozev |