Eric Faehn
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
13
Venues
5
Active years
2018–2026
Best venue rank
C
Where they publish
Papers
13 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2026 | VTS | Pre-processing Functional And Physical Defect Equivalences To Accelerate Cell-Aware Model Generation. | Reza Khoshzaban, Gianmarco Mongelli, Dorian Ronga, Iacopo Guglielminetti, Michelangelo Grosso, Eric Faehn, Patrick Girard, Arnaud Virazel, Riccardo Cantoro |
| 2025 | DATE | Accelerating Cell-Aware Model Generation for Sequential Cells using Graph Theory. | Gianmarco Mongelli, Eric Faehn, Dylan Robins, Patrick Girard, Arnaud Virazel |
| 2025 | IOLTS | A Runtime Efficient Graph-Based Cell-Aware Model Generation for Structural SRAM Testing. | Gianmarco Mongelli, Xhesila Xhafa, Eric Faehn, Dylan Robins, Patrick Girard, Arnaud Virazel |
| 2025 | IOLTS | A Digital SRAM Modeling for Cell-Aware Testing and Test Algorithms Evaluation. | Dorian Ronga, Xhesila Xhafa, Eric Faehn, Patrick Girard, T. Vayssade, Arnaud Virazel |
| 2024 | IOLTS | A Graph-Based Methodology for Speeding up Cell-Aware Model Generation. | Gianmarco Mongelli, Xhesila Xhafa, Eric Faehn, Dylan Robins, Patrick Girard, Arnaud Virazel |
| 2024 | ITC | A Fast and Efficient Graph-Based Methodology for Cell-Aware Model Generation. | Gianmarco Mongelli, Eric Faehn, Dylan Robins, Patrick Girard, Arnaud Virazel |
| 2023 | ETS | On Using Cell-Aware Methodology for SRAM Bit Cell Testing. | Xhesila Xhafa, Aymen Ladhar, Eric Faehn, Lorena Anghel, Gregory di Pendina, Patrick Girard, Arnaud Virazel |
| 2022 | ITC | Circuit-to-Circuit Attacks in SoCs via Trojan-Infected IEEE 1687 Test Infrastructure. | Michele Portolan, Antonios Pavlidis, Giorgio Di Natale, Eric Faehn, Haralampos-G. Stratigopoulos |
| 2022 | VTS | Run-Time Hardware Trojan Detection in Analog and Mixed-Signal ICs. | Antonios Pavlidis, Eric Faehn, Marie-Minerve Lourat, Haralampos-G. Stratigopoulos |
| 2021 | ETS | BIST-Assisted Analog Fault Diagnosis. | Antonios Pavlidis, Eric Faehn, Marie-Minerve Lourat, Haralampos-G. Stratigopoulos |
| 2020 | DATE | Symmetry-based A/M-S BIST (SymBIST): Demonstration on a SAR ADC IP. | Antonios Pavlidis, Marie-Minerve Lourat, Eric Faehn, Anand Kumar, Haralampos-G. D. Stratigopoulos |
| 2019 | IOLTS | Towards Improvement of Mission Mode Failure Diagnosis for System-on-Chip. | Safa Mhamdi, Arnaud Virazel, Patrick Girard, Alberto Bosio, Etienne Auvray, Eric Faehn, Aymen Ladhar |
| 2018 | ITC | An Effective Intra-Cell Diagnosis Flow for Industrial SRAMs. | Tien-Phu Ho, Eric Faehn, Arnaud Virazel, Alberto Bosio, Patrick Girard |