Frank Poehl
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
5
Venues
4
Active years
2003–2010
Best venue rank
B
Where they publish
Papers
5 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2010 | ETS | Production test challenges for highly integrated mobile phone SOCs - A case study. | Frank Poehl, Frank Demmerle, Juergen Alt, Hermann Obermeir |
| 2006 | ETS | On-Chip Evaluation, Compensation, and Storage of Scan Diagnosis Data - A Test Time Efficient Scan Diagnosis Architecture. | Frank Poehl, Jan Rzeha, Matthias Beck, Michael Gssel, Ralf Arnold, Peter Ossimitz |
| 2005 | DATE | Logic Design for On-Chip Test Clock Generation - Implementation Details and Impact on Delay Test Quality. | Matthias Beck, Olivier Barondeau, Martin Kaibel, Frank Poehl, Xijiang Lin, Ron Press |
| 2005 | VTS | Measures to Improve Delay Fault Testing on Low-Cost Testers - A Case Study. | Matthias Beck, Olivier Barondeau, Frank Poehl, Xijiang Lin, Ron Press |
| 2003 | ITC | Industrial Experience with Adoption of EDT for Low-Cost Test without Concessions. | Frank Poehl, Matthias Beck, Ralf Arnold, Peter Muhmenthaler, Nagesh Tamarapalli, Mark Kassab, Nilanjan Mukherjee, Janusz Rajski |