Grzegorz Mrugalski
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
35
Venues
4
Active years
1999–2025
Best venue rank
A*
Where they publish
Papers
35 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2025 | ETS | Identification of Failing Flip-Flops with Triangular Test Response Compaction. | Grzegorz Mrugalski, Janusz Rajski, Maciej Trawka, Jerzy Tyszer |
| 2025 | ITC | Automated Selection of Optimal EDT Input Configuration. | Grzegorz Mrugalski, Janusz Rajski, Maciej Trawka, Jerzy Tyszer |
| 2022 | ETS | X-Masking for In-System Deterministic Test. | Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer, Bartosz Wlodarczak |
| 2022 | ITC | DIST: Deterministic In-System Test with X-masking. | Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer, Bartosz Wlodarczak |
| 2020 | ETS | Test Sequence-Optimized BIST for Automotive Applications. | Bartosz Kaczmarek, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Lukasz Rybak, Jerzy Tyszer |
| 2020 | ITC | X-Tolerant Tunable Compactor for In-System Test. | Yingdi Liu, Sylwester Milewski, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, Bartosz Wldarczak |
| 2019 | VTS | On Cyclic Scan Integrity Tests for EDT-based Compression. | Wu-Tung Cheng, Grzegorz Mrugalski, Janusz Rajski, Maciej Trawka, Jerzy Tyszer |
| 2015 | ITC | A deterministic BIST scheme based on EDT-compressed test patterns. | Grzegorz Mrugalski, Janusz Rajski, Lukasz Rybak, Jedrzej Solecki, Jerzy Tyszer |
| 2014 | DAC | On Using Implied Values in EDT-based Test Compression. | Marcin Gebala, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer |
| 2013 | ETS | New test compression scheme based on low power BIST. | Jerzy Tyszer, Michal Filipek, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski |
| 2012 | ETS | Bandwidth-aware test compression logic for SoC designs. | Jakub Janicki, Jerzy Tyszer, Grzegorz Mrugalski, Janusz Rajski |
| 2012 | ITC | Low power programmable PRPG with enhanced fault coverage gradient. | Jedrzej Solecki, Jerzy Tyszer, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski |
| 2012 | VTS | Test generator with preselected toggling for low power built-in self-test. | Janusz Rajski, Jerzy Tyszer, Grzegorz Mrugalski, Benoit Nadeau-Dostie |
| 2011 | ETS | Diagnosis of Failing Scan Cells through Orthogonal Response Compaction. | Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer |
| 2011 | ETS | Reduced ATE Interface for High Test Data Compression. | Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer |
| 2011 | ITC | EDT channel bandwidth management in SoC designs with pattern-independent test access mechanism. | Jakub Janicki, Jerzy Tyszer, Avijit Dutta, Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski |
| 2010 | ETS | Diagnosis of failing scan cells through orthogonal response compaction. | Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer |
| 2010 | ITC | Low power compression of incompatible test cubes. | Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Przemyslaw Szczerbicki, Jerzy Tyszer |
| 2010 | ITC | Dynamic channel allocation for higher EDT compression in SoC designs. | Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jakub Janicki, Jerzy Tyszer |
| 2009 | ITC | Compression based on deterministic vector clustering of incompatible test cubes. | Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Dariusz Czysz, Jerzy Tyszer |
| 2009 | VTS | Highly X-Tolerant Selective Compaction of Test Responses. | Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Dariusz Czysz, Jerzy Tyszer |
| 2008 | ITC | Low Power Scan Shift and Capture in the EDT Environment. | Dariusz Czysz, Mark Kassab, Xijiang Lin, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer |
| 2007 | DAC | New Test Data Decompressor for Low Power Applications. | Grzegorz Mrugalski, Janusz Rajski, Dariusz Czysz, Jerzy Tyszer |
| 2007 | VTS | Low Power Embedded Deterministic Test. | Dariusz Czysz, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer |
| 2006 | DAC | Test response compactor with programmable selector. | Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer |
| 2006 | ITC | X-Press Compactor for 1000x Reduction of Test Data. | Janusz Rajski, Jerzy Tyszer, Grzegorz Mrugalski, Wu-Tung Cheng, Nilanjan Mukherjee, Mark Kassab |
| 2005 | ETS | Convolutional compaction-driven diagnosis of scan failures. | Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jerzy Tyszer, Chen Wang |
| 2005 | ITC | Diagnosis with convolutional compactors in presence of unknown states. | Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jerzy Tyszer |
| 2004 | ITC | Fault Diagnosis in Designs with Convolutional Compactors. | Grzegorz Mrugalski, Chen Wang, Artur Pogiel, Jerzy Tyszer, Janusz Rajski |
| 2004 | VTS | Planar High Performance Ring Generators. | Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer |
| 2003 | VTS | High Speed Ring Generators and Compactors of Test Data. | Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer |
| 2002 | ITC | Embedded Deterministic Test for Low-Cost Manufacturing Test. | Janusz Rajski, Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee, Rob Thompson, Kun-Han Tsai, Andre Hertwig, Nagesh Tamarapalli, Grzegorz Mrugalski, Geir Eide, Jun Qian |
| 2000 | VTS | Linear Independence as Evaluation Criterion for Two-Dimensional Test Pattern Generators. | Grzegorz Mrugalski, Jerzy Tyszer, Janusz Rajski |
| 1999 | ITC | Synthesis of pattern generators based on cellular automata with phase shifters. | Grzegorz Mrugalski, Jerzy Tyszer, Janusz Rajski |
| 1999 | VTS | Comparative Study of CA-based PRPGs and LFSRs with Phase Shifters. | Janusz Rajski, Grzegorz Mrugalski, Jerzy Tyszer |