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Haralampos-G. D. Stratigopoulos

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

54

Venues

10

Active years

2003–2021

Best venue rank

A*

Where they publish

Papers

54 indexed papers, newest first.

YearVenueTitleAuthors
2021ASPDACBreaking Analog Biasing Locking Techniques via Re-Synthesis.Julian Leonhard, Mohamed Elshamy, Marie-Minerve Lourat, Haralampos-G. D. Stratigopoulos
2020DATESecuring Programmable Analog ICs Against Piracy.Mohamed Elshamy, Alhassan Sayed, Marie-Minerve Lourat, Amine Rhouni, Hassan Aboushady, Haralampos-G. D. Stratigopoulos
2020DATESymmetry-based A/M-S BIST (SymBIST): Demonstration on a SAR ADC IP.Antonios Pavlidis, Marie-Minerve Lourat, Eric Faehn, Anand Kumar, Haralampos-G. D. Stratigopoulos
2020ETSHardware Trojan Attacks in Analog/Mixed-Signal ICs via the Test Access Mechanism.Mohamed Elshamy, Giorgio Di Natale, Antonios Pavlidis, Marie-Minerve Lourat, Haralampos-G. D. Stratigopoulos
2020IOLTSSpiking Neuron Hardware-Level Fault Modeling.Sarah A. El-Sayed, Theofilos Spyrou, Antonios Pavlidis, Engin Afacan, Luis A. Camuas-Mesa, Bernab Linares-Barranco, Haralampos-G. D. Stratigopoulos
2019DATEMixLock: Securing Mixed-Signal Circuits via Logic Locking.Julian Leonhard, Muhammad Yasin, Shadi Turk, Mohammed Thari Nabeel, Marie-Minerve Lourat, Roselyne Chotin-Avot, Hassan Aboushady, Ozgur Sinanoglu, Haralampos-G. D. Stratigopoulos
2019VTSIP Session on Machine Learning Applications in IC Test-Related Tasks.Ghada Sokar, Yassin Zakaria, Asmaa Rabie, Kareem Madkour, Ira Leventhal, Jochen Rivoir, Xinli Gu, Haralampos-G. D. Stratigopoulos
2018ETSMachine learning applications in IC testing.Haralampos-G. D. Stratigopoulos
2018ISCASOpen Source Hardware and EDA Tools for Analog/Mixed-Signal Design and Prototyping.Naohiko Shimizu, Junichi Akita, Marie-Minerve Lourat, Haralampos-G. D. Stratigopoulos, Jean-Paul Chaput, Dimitri Galayko
2018VTSSpecial session on machine learning: How will machine learning transform test?Yiorgos Makris, Amit Nahar, Haralampos-G. D. Stratigopoulos, Marc Hutner
2017ETSForeword.Maria K. Michael, Rolf Drechsler, Stephan Eggersgl, Haralampos-G. D. Stratigopoulos, Sybille Hellebrand, Rob Aitken
2017VTSAdaptive test flow for mixed-signal ICs.Haralampos-G. D. Stratigopoulos, Christian Streitwieser
2016DATEBuilt-in test of millimeter-Wave circuits based on non-intrusive sensors.Athanasios Dimakos, Haralampos-G. D. Stratigopoulos, Alexandre Siligaris, Salvador Mir, Emeric de Foucauld
2016ETSETS 2016 foreword.Said Hamdioui, Giorgio Di Natale, Bram Kruseman, Maria K. Michael, Haralampos-G. D. Stratigopoulos
2016ISCASHarnessing fabrication process signature for predicting yield across designs.Ali Ahmadi, Haralampos-G. D. Stratigopoulos, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris
2015DATEFast deployment of alternate analog test using Bayesian model fusion.John Liaperdos, Haralampos-G. D. Stratigopoulos, Louay Abdallah, Yiorgos Tsiatouhas, Angela Arapoyanni, Xin Li
2015ETSHigh frequency jitter estimator for SoCs.Herv Le Gall, Rshdee Alhakim, Miroslav Valka, Salvador Mir, Haralampos-G. D. Stratigopoulos, Emmanuel Simeu
2015ICCADYield Forecasting in Fab-to-Fab Production Migration Based on Bayesian Model Fusion.Ali Ahmadi, Haralampos-G. D. Stratigopoulos, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris
2015ITCEvaluation of low-cost mixed-signal test techniques for circuits with long simulation times.Haralampos-G. D. Stratigopoulos, Manuel J. Barragn, Salvador Mir, Herv Le Gall, Neha Bhargava, Ankur Bal
2014DACOne-Shot Calibration of RF Circuits Based on Non-Intrusive Sensors.Martin Andraud, Haralampos-G. D. Stratigopoulos, Emmanuel Simeu
2014IOLTSSolutions for the self-adaptation of communicating systems in operation.Martin Andraud, Anthony Deluthault, Mouhamadou Dieng, Florence Azas, Serge Bernard, Philippe Cauvet, Mariane Comte, Thibault Kervaon, Vincent Kerzerho, Salvador Mir, Paul-Henri Pugliesi-Conti, Michel Renovell, Fabien Soulier, Emmanuel Simeu, Haralampos-G. D. Stratigopoulos
2014VTSEfficient Monte Carlo-based analog parametric fault modelling.Haralampos-G. D. Stratigopoulos, Stephen Sunter
2013DACMultidimensional analog test metrics estimation using extreme value theory and statistical blockade.Haralampos-G. D. Stratigopoulos, Pierre Faubet, Yoann Courant, Firas Mohamed
2013ITCTrue non-intrusive sensors for RF built-in test.Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir
2013ITCFault modeling and diagnosis for nanometric analog circuits.Ke Huang, Haralampos-G. D. Stratigopoulos, Salvador Mir
2013VTSDefect-oriented non-intrusive RF test using on-chip temperature sensors.Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir, Josep Altet
2013VTSReduced code linearity testing of pipeline adcs in the presence of noise.Asma Laraba, Haralampos-G. D. Stratigopoulos, Salvador Mir, Herv Naudet, Gerard Bret
2012DATETesting RF circuits with true non-intrusive built-in sensors.Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir, Josep Altet
2012DATEAdvances in variation-aware modeling, verification, and testing of analog ICs.Dimitri de Jonghe, Elie Maricau, Georges G. E. Gielen, Trent McConaghy, Bratislav Tasic, Haralampos-G. D. Stratigopoulos
2012ETSEnhanced reduced code linearity test technique for multi-bit/stage pipeline ADCs.Asma Laraba, Haralampos-G. D. Stratigopoulos, Salvador Mir, Herv Naudet, Christophe Forel
2012ITCExperiences with non-intrusive sensors for RF built-in test.Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir, Christophe Kelma
2011ICCADOn proving the efficiency of alternative RF tests.Nathan Kupp, Haralampos-G. D. Stratigopoulos, Petros Drineas, Yiorgos Makris
2010DATEFault diagnosis of analog circuits based on machine learning.Ke Huang, Haralampos-G. D. Stratigopoulos, Salvador Mir
2010ETSSensors for built-in alternate RF test.Louay Abdallah, Haralampos-G. D. Stratigopoulos, Christophe Kelma, Salvador Mir
2010ETSDefect filter for alternate RF test.Haralampos-G. D. Stratigopoulos, Salvador Mir, Erkan Acar, Sule Ozev
2010ICCADAnalog test metrics estimates with PPM accuracy.Haralampos-G. D. Stratigopoulos, Salvador Mir
2010IOLTSAn analog VLSI multilayer perceptron and its application towards built-in self-test in analog circuits.Dzmitry Maliuk, Haralampos-G. D. Stratigopoulos, Yiorgos Makris
2010ITCAnalog neural network design for RF built-in self-test.Dzmitry Maliuk, Haralampos-G. D. Stratigopoulos, He Huang, Yiorgos Makris
2010VTSDensity estimation for analog/RF test problem solving.Salvador Mir, Haralampos-G. D. Stratigopoulos, Ahcne Bounceur
2010VTSSpecial session 4C: Thesis research poster session.Haralampos-G. D. Stratigopoulos
2010VTSSpecial session 8A: TTTC 2010 E. J. McCluskey Best Doctoral Thesis Award.Haralampos-G. D. Stratigopoulos
2010VTSSpecial session 12A: Panel adaptive analog test: Feasibility and opportunities ahead.Haralampos-G. D. Stratigopoulos
2009DATEEnrichment of limited training sets in machine-learning-based analog/RF test.Haralampos-G. D. Stratigopoulos, Salvador Mir, Yiorgos Makris
2009ETSDefect Filter for Alternate RF Test.Haralampos-G. D. Stratigopoulos, Salvador Mir, Erkan Acar, Sule Ozev
2009ICCDHierarchical parametric test metrics estimation: A ΣΔ converter BIST case study.Matthieu Dubois, Haralampos-G. D. Stratigopoulos, Salvador Mir
2009VTSSpecial Session 7C: TTTC 2009 Best Doctoral Thesis Contest.Yiorgos Makris, Haralampos-G. D. Stratigopoulos
2008DATEA General Method to Evaluate RF BIST Techniques Based on Non-parametric Density Estimation.Haralampos-G. D. Stratigopoulos, Jeanne Tongbong, Salvador Mir
2008VTSA Statistical Approach to Characterizing and Testing Functionalized Nanowires.James Dardig, Haralampos-G. D. Stratigopoulos, Eric Stern, Mark A. Reed, Yiorgos Makris
2007VTSNon-RF to RF Test Correlation Using Learning Machines: A Case Study.Haralampos-G. D. Stratigopoulos, Petros Drineas, Mustapha Slamani, Yiorgos Makris
2006VTSBridging the Accuracy of Functional and Machine-Learning-Based Mixed-Signal Testing.Haralampos-G. D. Stratigopoulos, Yiorgos Makris
2005VTSConstructive Derivation of Analog Specification Test Criteria.Haralampos-G. D. Stratigopoulos, Yiorgos Makris
2003IOLTSAn Analog Checker With Input-Relative Tolerance for Duplicate Signals.Haralampos-G. D. Stratigopoulos, Yiorgos Makris
2003ITCConcurrent Error Detection in Linear Analog Circuits Using State Estimation.Haralampos-G. D. Stratigopoulos, Yiorgos Makris
2003VTSAn Analog Checker with Dynamically Adjustable Error Threshold for Fully Differential Circuits.Haralampos-G. D. Stratigopoulos, Yiorgos Makris