Hassen Aziza
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
20
Venues
7
Active years
2002–2025
Best venue rank
A
Where they publish
Papers
20 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2025 | ETS | In-Field Monitoring and Preventing Read Disturb Faults in RRAMs. | Hanzhi Xun, Moritz Fieback, Sicong Yuan, Changhao Wang, Erbing Hua, Hassen Aziza, Leticia Bolzani Poehls, Riccardo Cantoro, Rajendra Bishnoi, Mottaqiallah Taouil, Said Hamdioui |
| 2024 | DATE | Device-Aware Diagnosis for Yield Learning in RRAMs. | Hanzhi Xun, Moritz Fieback, Sicong Yuan, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui |
| 2024 | ETS | Online Detection of Unique Faults in RRAMs. | Hanzhi Xun, Moritz Fieback, Mohammad Amin Yaldagard, Sicong Yuan, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui |
| 2024 | ITC | Robust Design-for-Testability Scheme for Conventional and Unique Defects in RRAMs. | Hanzhi Xun, Moritz Fieback, Mohammad Amin Yaldagard, Sicong Yuan, Erbing Hua, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui |
| 2023 | ITC | Device-Aware Test for Ion Depletion Defects in RRAMs. | Hanzhi Xun, Sicong Yuan, Moritz Fieback, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui |
| 2022 | ISCAS | STATE: A Test Structure for Rapid Prediction of Resistive RAM Electrical Parameter Variability. | Hassen Aziza, Jrmy Postel-Pellerin, Hussein Bazzi, Mathieu Moreau, Adnan Harb |
| 2022 | ISCAS | Digital-to-analog converters to benchmark the matching performance of a new zero-cost transistor. | Paul Devoge, Hassen Aziza, Philippe Lorenzini, Alexandre Malherbe, Franck Julien, Abderrezak Marzaki, Arnaud Rgnier, Stephan Niel |
| 2021 | DATE | Density Enhancement of RRAMs using a RESET Write Termination for MLC Operation. | Hassen Aziza, Said Hamdioui, Moritz Fieback, Mottaqiallah Taouil, Mathieu Moreau |
| 2021 | DDECS | Tutorial: Silicon Systems for Wireless LAN. | Zoran Stamenkovic, Hassen Aziza, Ernesto Snchez, Alberto Bosio |
| 2021 | ETS | Intermittent Undefined State Fault in RRAMs. | Moritz Fieback, Guilherme Cardoso Medeiros, Anteneh Gebregiorgis, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui |
| 2020 | IOLTS | A CMOS OxRAM-Based Neuron Circuit Hardened with Enclosed Layout Transistors for Aerospace Applications. | Pablo Ilha Vaz, Patrick Girard, Arnaud Virazel, Hassen Aziza |
| 2019 | ITC | Device-Aware Test: A New Test Approach Towards DPPB Level. | Moritz Fieback, Lizhou Wu, Guilherme Cardoso Medeiros, Hassen Aziza, Siddharth Rao, Erik Jan Marinissen, Mottaqiallah Taouil, Said Hamdioui |
| 2014 | IOLTS | An innovative standard cells remapping method for in-circuit critical parameters monitoring. | Loic Welter, Philippe Dreux, Hassen Aziza, Jean-Michel Portal |
| 2013 | IOLTS | Embedded high-precision frequency-based capacitor measurement system. | Loic Welter, Philippe Dreux, Jean-Michel Portal, Hassen Aziza |
| 2013 | VTS | On the investigation of built-in tuning of RF receivers using on-chip polyphase filters. | Fayrouz Haddad, Wenceslas Rahajandraibe, Hassen Aziza, Karine Castellani-Couli, Jean-Michel Portal |
| 2011 | ISCAS | Temperature and hump effect impact on output voltage spread of low power bandgap designed in the sub-threshold area. | Y. Joly, L. Truphemus, Laurent Lopez, Jean-Michel Portal, Hassen Aziza, Franck Julien, Pascal Fornara |
| 2009 | DDECS | An on-line testing scheme for repairing purposes in Flash memories. | Olivier Ginez, Jean-Michel Portal, Hassen Aziza |
| 2008 | ITC | A High-Speed Structural Method for Testing Address Decoder Faults in Flash Memories. | Olivier Ginez, Jean-Michel Portal, Hassen Aziza |
| 2003 | ITC | EEPROM Memory: Threshold Voltage Built In Self Diagnosis. | Jean-Michel Portal, Hassen Aziza, Didier Ne |
| 2002 | ITC | An Automated Methodology to Diagnose Geometric Defect in the EEPROM Cell. | Jean-Michel Portal, L. Forli, Hassen Aziza, Didier Ne |