Hayk T. Grigoryan
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
7
Venues
3
Active years
2011–2020
Best venue rank
A
Where they publish
Papers
7 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2020 | ITC | Die-to-Die Testing and ECC Error Mitigation in Automotive and Industrial Safety Applications. | Gabriele Boschi, Elisa Spano, Hayk T. Grigoryan, Arun Kumar, Gurgen Harutyunyan |
| 2019 | IOLTS | Variation-aware Fault Modeling and Test Generation for STT-MRAM. | Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori, Hayk T. Grigoryan, Grigor Tshagharyan |
| 2019 | ITC | Memory FIT Rate Mitigation Technique for Automotive SoCs. | Gabriele Boschi, Donato Luongo, Duccio Lazzarotti, Hanna Shaheen, Hayk T. Grigoryan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian |
| 2019 | VTS | Innovative Practices on In-System Test and Reliability of Memories. | S. Bandyopadhyay, J. Mekkoth, Marc Hutner, Hayk T. Grigoryan, Arun Kumar, Samvel K. Shoukourian, Grigor Tshagharyan, Yervant Zorian, Gabriele Boschi, Duccio Lazzarotti, Donato Luongo, Hanna Shaheen, Gurgen Harutyunyan |
| 2018 | ITC | Advanced ECC-Based FIT Rate Mitigation Technique for Automotive SoCs. | Hayk T. Grigoryan, Samvel K. Shoukourian, Gurgen Harutyunyan, Yervant Zorian, Costas Argyrides |
| 2018 | ITC | Defect injection, Fault Modeling and Test Algorithm Generation Methodology for STT-MRAM. | Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori, Grigor Tshagharyan, Hayk T. Grigoryan, Gurgen Harutyunyan, Yervant Zorian |
| 2011 | IOLTS | Generic BIST architecture for testing of content addressable memories. | Hayk T. Grigoryan, Gurgen Harutunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian |