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Defect injection, Fault Modeling and Test Algorithm Generation Methodology for STT-MRAM.

Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori, Grigor Tshagharyan, Hayk T. Grigoryan, Gurgen Harutyunyan, Yervant Zorian

VenueAITC
Year2018
ProceedingsITC

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