Mehdi Baradaran Tahoori

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

179

Venues

Active years

2002–2025

Best venue rank

Where they publish

Papers

179 indexed papers, newest first.

Year	Venue	Title	Authors
2025	ETS	European Test Symposium Teams: an Anniversary Snapshot.	Maksim Jenihhin, Jaan Raik, Artur Jutman, Natalia Cherezova, Raimund Ubar, Liviu Miclea, Szilrd Enyedi, Iulia Stefan, Ovidiu Stan, Cosmina Corches, Zebo Peng, Petru Eles, Rolf Drechsler, S. Eggersgl, Grschwin Fey, Andreas Glowatz, Daniel Tille, Georges G. E. Gielen, Anthony Coyette, Wim Dobbelaere, Ronny Vanhooren, Po-Yao Chuang, Erik Jan Marinissen, Giorgio Di Natale, M. Barragan, Paolo Maistri, S. Mir, Vatajelu I. Vatajelu, Paolo Bernardi, Stefano Di Carlo, Paolo Prinetto, Matteo Sonza Reorda, Massimo Violante, Haralampos-G. Stratigopoulos, M. K. Michael, Stelios Neophytou, Stavros Hadjitheophanous, Kyriakos Christou, M. Skitsas, Alberto Bosio, Bastien Deveautour, Patrick Girard, Marcello Traiola, Arnaud Virazel, Fernando Fernandes dos Santos, Angeliki Kritikakou, Gioele Casagranda, Marzio Vallero, Flavio Vella, Paolo Rech, Letcia Maria Bolzani Poehls, Milos Krstic, Marko S. Andjelkovic, Fabian Luis Vargas, Grigor Tshagharyan, Gurgen Harutyunyan, Valery A. Vardanian, Samvel K. Shoukourian, Yervant Zorian, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas, Mottaqiallah Taouil, Moritz Fieback, Anteneh Gebregiorgis, Rajendra Bishnoi, Said Hamdioui, Abhijit Chatterjee, Anurup Saha, Suhasini Komarraju, K. Ma, Chandramouli N. Amarnath, Mehdi Baradaran Tahoori, Mahta Mayahinia, Maryam Rajabalipanah, Katayoon Basharkhah, N. Nosrati, Zahra Jahanpeima, Zain Navabi, Hans-Joachim Wunderlich, Sybille Hellebrand
2025	ETS	MBIST-guided Reliability Improvement Scheme for SRAM-based Computation in Memory.	Sina Bakhtavari Mamaghani, Jongsin Yun, Martin Keim, Mehdi Baradaran Tahoori
2025	ICCAD	SpikeSynth: Energy-Efficient Adaptive Analog Printed Spiking Neural Networks.	Priyanjana Pal, Alexander Studt, Tara Gheshlaghi, Michael Hefenbrock, Michael Beigl, Mehdi Baradaran Tahoori
2025	ITC	Sisyphus: Cross-Layer Efficiency Across NVM Technologies in Compute-in-Memory Architectures.	Ali Nezhadi, Odysseas Chatzopoulos, Mahta Mayahinia, George Papadimitriou, Mehdi Baradaran Tahoori, Dimitris Gizopoulos
2025	VTS	Fault Modeling and Testing of ReRAM-based CAM Array.	Haneen G. Hezayyin, Mahta Mayahinia, Mehdi Baradaran Tahoori
2025	VTS	Electromigration Reliability Analysis of SRAM-based Register Files in GPUs and AI Accelerators.	Mahta Mayahinia, Mehdi Baradaran Tahoori
2024	ASPDAC	A Dynamic Testing Scheme for Resistive-Based Computation-In-Memory Architectures.	Sina Bakhtavari Mamaghani, Priyanjana Pal, Mehdi Baradaran Tahoori
2024	DATE	Out-of-Distribution Detection Using Power-Side Channels for Improving Functional Safety of Neural Network FPGA Accelerators.	Vincent Meyers, Dennis Gnad, Mehdi Baradaran Tahoori
2024	ICCAD	DoS-FPGA: Denial of Service on Cloud FPGAs via Coordinated Power Hammering.	Hassan Nassar, Philipp Machauer, Lars Bauer, Dennis Gnad, Mehdi Baradaran Tahoori, Jrg Henkel
2024	VTS	Fuzz Wars: The Voltage Awakens - Voltage-Guided Blackbox Fuzzing on FPGAs.	Kai Su, Mark Giraud, Anne Borcherding, Jonas Krautter, Philipp Nenninger, Mehdi Baradaran Tahoori
2023	DATE	Smart Hammering: A practical method of pinhole detection in MRAM memories.	Sina Bakhtavari Mamaghani, Christopher Mnch, Jongsin Yun, Martin Keim, Mehdi Baradaran Tahoori
2023	ETS	On-chip Electromigration Sensor for Silicon Lifecycle Management of Nanoscale VLSI.	Mahta Mayahinia, Mehdi Baradaran Tahoori, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian
2023	FPL	Remote Identification of Neural Network FPGA Accelerators by Power Fingerprints.	Vincent Meyers, Michael Hefenbrock, Dennis Gnad, Mehdi Baradaran Tahoori
2023	IOLTS	A Learning-Based Approach for Single Event Transient Analysis in Pass Transistor Logic.	Zhe Zhang, Zhihang Wu, Christian Weis, Norbert Wehn, Mehdi Baradaran Tahoori
2020	ASPDAC	Tolerating Retention Failures in Neuromorphic Fabric based on Emerging Resistive Memories.	Christopher Mnch, Rajendra Bishnoi, Mehdi Baradaran Tahoori
2020	ASPDAC	Programmable Neuromorphic Circuit based on Printed Electrolyte-Gated Transistors.	Dennis D. Weller, Michael Hefenbrock, Mehdi Baradaran Tahoori, Jasmin Aghassi-Hagmann, Michael Beigl
2020	DATE	Fast and Accurate High-Sigma Failure Rate Estimation through Extended Bayesian Optimized Importance Sampling.	Michael Hefenbrock, Dennis D. Weller, Michael Beigl, Mehdi Baradaran Tahoori
2020	DATE	Dynamic Faults based Hardware Trojan Design in STT-MRAM.	Sarath Mohanachandran Nair, Rajendra Bishnoi, Arunkumar Vijayan, Mehdi Baradaran Tahoori
2020	DATE	A Universal Spintronic Technology based on Multifunctional Standardized Stack.	Mehdi Baradaran Tahoori, Sarath Mohanachandran Nair, Rajendra Bishnoi, Lionel Torres, Sophiane Senni, Guillaume Patrigeon, Pascal Benoit, Gregory di Pendina, Guillaume Prenat
2020	ETS	Defect Characterization and Test Generation for Spintronic-based Compute-In-Memory.	Sarath Mohanachandran Nair, Christopher Mnch, Mehdi Baradaran Tahoori
2020	VTS	Special Session - Emerging Memristor Based Memory and CIM Architecture: Test, Repair and Yield Analysis.	Rajendra Bishnoi, Lizhou Wu, Moritz Fieback, Christopher Mnch, Sarath Mohanachandran Nair, Mehdi Baradaran Tahoori, Ying Wang, Huawei Li, Said Hamdioui
2020	VTS	Mitigating Read Failures in STT-MRAM.	Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori
2019	ASPDAC	Reliable in-memory neuromorphic computing using spintronics.	Christopher Mnch, Rajendra Bishnoi, Mehdi Baradaran Tahoori
2019	DATE	Inkjet-Printed True Random Number Generator based on Additive Resistor Tuning.	Ahmet Turan Erozan, Rajendra Bishnoi, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori
2019	DATE	Test Pattern Generation for Approximate Circuits Based on Boolean Satisfiability.	Anteneh Gebregiorgis, Mehdi Baradaran Tahoori
2019	DATE	Predictive Modeling and Design Automation of Inorganic Printed Electronics.	Farhan Rasheed, Michael Hefenbrock, Rajendra Bishnoi, Michael Beigl, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori
2019	DATE	Bayesian Optimized Importance Sampling for High Sigma Failure Rate Estimation.	Dennis D. Weller, Michael Hefenbrock, Mohammad Saber Golanbari, Michael Beigl, Mehdi Baradaran Tahoori
2019	ICCAD	Active Fences against Voltage-based Side Channels in Multi-Tenant FPGAs.	Jonas Krautter, Dennis R. E. Gnad, Falk Schellenberg, Amir Moradi, Mehdi Baradaran Tahoori
2019	IOLTS	Variation-aware Fault Modeling and Test Generation for STT-MRAM.	Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori, Hayk T. Grigoryan, Grigor Tshagharyan
2019	ITC	IEEE European Test Symposium (ETS).	Stephan Eggersgl, Said Hamdioui, Artur Jutman, Maria K. Michael, Jaan Raik, Matteo Sonza Reorda, Mehdi Baradaran Tahoori, Elena-Ioana Vatajelu
2019	ITC	Testing of Neuromorphic Circuits: Structural vs Functional.	Anteneh Gebregiorgis, Mehdi Baradaran Tahoori
2018	ASPDAC	Balancing resiliency and energy efficiency of functional units in ultra-low power systems.	Mohammad Saber Golanbari, Anteneh Gebregiorgis, Elyas Moradi, Saman Kiamehr, Mehdi Baradaran Tahoori
2018	ASPDAC	From silicon to printed electronics: A coherent modeling and design flow approach based on printed electrolyte gated FETs.	Gabriel Cadilha Marques, Farhan Rasheed, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori
2018	ASPDAC	Process variation and temperature aware adaptive scrubbing for retention failures in STT-MRAM.	Nour Sayed, Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori
2018	DAC	Runtime adjustment of IoT system-on-chips for minimum energy operation.	Mohammad Saber Golanbari, Mehdi Baradaran Tahoori
2018	DATE	Spintronic normally-off heterogeneous system-on-chip design.	Anteneh Gebregiorgis, Rajendra Bishnoi, Mehdi Baradaran Tahoori
2018	DATE	Multi-bit non-volatile spintronic flip-flop.	Christopher Mnch, Rajendra Bishnoi, Mehdi Baradaran Tahoori
2018	DATE	Parametric failure modeling and yield analysis for STT-MRAM.	Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori
2018	DATE	A cross-layer adaptive approach for performance and power optimization in STT-MRAM.	Nour Sayed, Rajendra Bishnoi, Fabian Oboril, Mehdi Baradaran Tahoori
2018	DATE	An inside job: Remote power analysis attacks on FPGAs.	Falk Schellenberg, Dennis R. E. Gnad, Amir Moradi, Mehdi Baradaran Tahoori
2018	DATE	Using multifunctional standardized stack as universal spintronic technology for IoT.	Mehdi Baradaran Tahoori, Sarath Mohanachandran Nair, Rajendra Bishnoi, Sophiane Senni, Jad Mohdad, Frdrick Mailly, Lionel Torres, Pascal Benoit, Abdoulaye Gamati, Pascal Nouet, Frederic Ouattara, Gilles Sassatelli, Kotb Jabeur, Pierre Vanhauwaert, A. Atitoaie, I. Firastrau, Gregory di Pendina, Guillaume Prenat
2018	ICCAD	Remote inter-chip power analysis side-channel attacks at board-level.	Falk Schellenberg, Dennis R. E. Gnad, Amir Moradi, Mehdi Baradaran Tahoori
2018	IOLTS	Reliability And Performance Challenges Of Ultra-Low Voltage Caches: A Trade-Off Analysis.	Anteneh Gebregiorgis, Mehdi Baradaran Tahoori
2018	ITC	Defect injection, Fault Modeling and Test Algorithm Generation Methodology for STT-MRAM.	Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori, Grigor Tshagharyan, Hayk T. Grigoryan, Gurgen Harutyunyan, Yervant Zorian
2018	ITC	Modeling and Testing of Aging Faults in FinFET Memories for Automotive Applications.	Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian, Anteneh Gebregiorgis, Mohammad Saber Golanbari, Rajendra Bishnoi, Mehdi Baradaran Tahoori
2017	ASPDAC	Workload-aware static aging monitoring of timing-critical flip-flops.	Arunkumar Vijayan, Saman Kiamehr, Fabian Oboril, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori
2017	DAC	Error Propagation Aware Timing Relaxation For Approximate Near Threshold Computing.	Anteneh Gebregiorgis, Saman Kiamehr, Mehdi Baradaran Tahoori
2017	DATE	Computing with nano-crossbar arrays: Logic synthesis and fault tolerance.	Mustafa Altun, Valentina Ciriani, Mehdi Baradaran Tahoori
2017	DATE	Leveraging aging effect to improve SRAM-based true random number generators.	Saman Kiamehr, Mohammad Saber Golanbari, Mehdi Baradaran Tahoori
2017	DATE	VAET-STT: A variation aware estimator tool for STT-MRAM based memories.	Sarath Mohanachandran Nair, Rajendra Bishnoi, Mohammad Saber Golanbari, Fabian Oboril, Mehdi Baradaran Tahoori
2017	DATE	Opportunistic write for fast and reliable STT-MRAM.	Nour Sayed, Mojtaba Ebrahimi, Rajendra Bishnoi, Mehdi Baradaran Tahoori
2017	DATE	Recovery-aware proactive TSV repair for electromigration in 3D ICs.	Shengcheng Wang, Hengyang Zhao, Sheldon X.-D. Tan, Mehdi Baradaran Tahoori
2017	ETS	Aging-aware coding scheme for memory arrays.	Mohammad Saber Golanbari, Nour Sayed, Mojtaba Ebrahimi, Mohammad Hadi Moshrefpour Esfahany, Saman Kiamehr, Mehdi Baradaran Tahoori
2017	ETS	Exploiting STT-MRAM for approximate computing.	Nour Sayed, Fabian Oboril, Azadeh Shirvanian, Rajendra Bishnoi, Mehdi Baradaran Tahoori
2017	FPGA	Energy Efficient Scientific Computing on FPGAs using OpenCL.	Dennis Weller, Fabian Oboril, Dimitar Lukarski, Jrgen Becker, Mehdi Baradaran Tahoori
2017	FPL	Voltage drop-based fault attacks on FPGAs using valid bitstreams.	Dennis R. E. Gnad, Fabian Oboril, Mehdi Baradaran Tahoori
2017	ICCAD	Leveraging recovery effect to reduce electromigration degradation in power/ground TSV.	Shengcheng Wang, Zeyu Sun, Yuan Cheng, Sheldon X.-D. Tan, Mehdi Baradaran Tahoori
2017	IOLTS	Design flows for resilient energy-efficient systems.	Mohammad Saber Golanbari, Mehdi Baradaran Tahoori
2017	ITC	Run-time hardware trojan detection using performance counters.	Rana Elnaggar, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori
2017	VTS	Leveraging Systematic Unidirectional Error-Detecting Codes for fast STT-MRAM cache.	Nour Sayed, Fabian Oboril, Rajendra Bishnoi, Mehdi Baradaran Tahoori
2016	ASPDAC	Non-Volatile Non-Shadow flip-flop using Spin Orbit Torque for efficient normally-off computing.	Rajendra Bishnoi, Fabian Oboril, Mehdi Baradaran Tahoori
2016	DAC	Fault injection acceleration by simultaneous injection of non-interacting faults.	Mojtaba Ebrahimi, Mohammad Hadi Moshrefpour, Mohammad Saber Golanbari, Mehdi Baradaran Tahoori
2016	DAC	Invited - Cross-layer approaches for soft error modeling and mitigation.	Mojtaba Ebrahimi, Mehdi Baradaran Tahoori
2016	DATE	Fault Tolerant Non-Volatile spintronic flip-flop.	Rajendra Bishnoi, Fabian Oboril, Mehdi Baradaran Tahoori
2016	DATE	A cross-layer analysis of Soft Error, aging and process variation in Near Threshold Computing.	Anteneh Gebregiorgis, Saman Kiamehr, Fabian Oboril, Rajendra Bishnoi, Mehdi Baradaran Tahoori
2016	DATE	Variation-aware near threshold circuit synthesis.	Mohammad Saber Golanbari, Saman Kiamehr, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori
2016	DATE	Cross-Layer Approaches for an Aging-Aware Design Space Exploration for Microprocessors.	Fabian Oboril, Mehdi Baradaran Tahoori
2016	DATE	Thermal-aware TSV repair for electromigration in 3D ICs.	Shengcheng Wang, Mehdi Baradaran Tahoori, Krishnendu Chakrabarty
2016	DDECS	System-level reliability evaluation through cache-aware software-based fault injection.	Firas Kaddachi, Maha Kooli, Giorgio Di Natale, Alberto Bosio, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori
2016	DSD	Synthesis and Performance Optimization of a Switching Nano-Crossbar Computer.	Dan Alexandrescu, Mustafa Altun, Lorena Anghel, Anna Bernasconi, Valentina Ciriani, Luca Frontini, Mehdi Baradaran Tahoori
2016	ICCAD	A cross-layer approach for resiliency and energy efficiency in near threshold computing.	Mohammad Saber Golanbari, Anteneh Gebregiorgis, Fabian Oboril, Saman Kiamehr, Mehdi Baradaran Tahoori
2016	IOLTS	Revisiting software-based soft error mitigation techniques via accurate error generation and propagation models.	Mojtaba Ebrahimi, Maryam Rashvand, Firas Kaddachi, Mehdi Baradaran Tahoori, Giorgio Di Natale
2016	ISLPED	Maximizing Energy Efficiency in NTC by Variation-Aware Microprocessor Pipeline Optimization.	Anteneh Gebregiorgis, Mohammad Saber Golanbari, Saman Kiamehr, Fabian Oboril, Mehdi Baradaran Tahoori
2016	ISLPED	Normally-OFF STT-MRAM Cache with Zero-Byte Compression for Energy Efficient Last-Level Caches.	Fabian Oboril, Fazal Hameed, Rajendra Bishnoi, Ali Ahari, Helia Naeimi, Mehdi Baradaran Tahoori
2016	VTS	Fault tolerant approximate computing using emerging non-volatile spintronic memories.	Fabian Oboril, Azadeh Shirvanian, Mehdi Baradaran Tahoori
2016	VTS	Test implications and challenges in near threshold computing special session.	Mehdi Baradaran Tahoori, Rob Aitken, Sriram R. Vangal, Bal Sandhu
2016	VTS	Online soft-error vulnerability estimation for memory arrays.	Arunkumar Vijayan, Abhishek Koneru, Mojtaba Ebrahimi, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori
2015	ASPDAC	Event-driven transient error propagation: A scalable and accurate soft error rate estimation approach.	Mojtaba Ebrahimi, Razi Seyyedi, Liang Chen, Mehdi Baradaran Tahoori
2015	ASPDAC	Aging mitigation in memory arrays using self-controlled bit-flipping technique.	Anteneh Gebregiorgis, Mojtaba Ebrahimi, Saman Kiamehr, Fabian Oboril, Said Hamdioui, Mehdi Baradaran Tahoori
2015	ASPDAC	Stress-aware P/G TSV planning in 3D-ICs.	Shengcheng Wang, Farshad Firouzi, Fabian Oboril, Mehdi Baradaran Tahoori
2015	DATE	On-line prediction of NBTI-induced aging rates.	Rafal Baranowski, Farshad Firouzi, Saman Kiamehr, Chang Liu, Mehdi Baradaran Tahoori, Hans-Joachim Wunderlich
2015	DATE	High-resolution online power monitoring for modern microprocessors.	Fabian Oboril, Jos Ewert, Mehdi Baradaran Tahoori
2015	ETS	Protecting caches against multi-bit errors using embedded erasure coding.	Abbas BanaiyanMofrad, Mojtaba Ebrahimi, Fabian Oboril, Mehdi Baradaran Tahoori, Nikil D. Dutt
2015	ETS	Reliability-aware operation chaining in high level synthesis.	Liang Chen, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori
2015	ETS	Re-using BIST for circuit aging monitoring.	Farshad Firouzi, Fangming Ye, Arunkumar Vijayan, Abhishek Koneru, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori
2015	ETS	Aging guardband reduction through selective flip-flop optimization.	Mohammad Saber Golanbari, Saman Kiamehr, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori
2015	FPL	Energy efficient partitioning of dynamic reconfigurable MRAM-FPGAs.	Ali Ahari, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori
2015	ICCAD	Fine-Grained Aging Prediction Based on the Monitoring of Run-Time Stress Using DfT Infrastructure.	Abhishek Koneru, Arunkumar Vijayan, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori
2015	ICCAD	Defect Clustering-Aware Spare-TSV Allocation for 3D ICs.	Shengcheng Wang, Mehdi Baradaran Tahoori, Krishnendu Chakrabarty
2015	ICCD	Improving reliability, performance, and energy efficiency of STT-MRAM with dynamic write latency.	Ali Ahari, Mojtaba Ebrahimi, Fabian Oboril, Mehdi Baradaran Tahoori
2015	IOLTS	Self-awareness and self-learning for resiliency in real-time systems.	Mehdi Baradaran Tahoori, Abhijit Chatterjee, Krishnendu Chakrabarty, Abhishek Koneru, Arunkumar Vijayan, Debashis Banerjee
2015	ISCAS	Cross-layer resilient system design flow.	Fabian Oboril, Mojtaba Ebrahimi, Saman Kiamehr, Mehdi Baradaran Tahoori
2015	ITC	Stepped parity: A low-cost multiple bit upset detection technique.	Mojtaba Ebrahimi, Mehdi Baradaran Tahoori
2015	ITC	Cross-layer approaches for an aging-aware design of nanoscale microprocessors: Dissertation summary: IEEE TTTC E.J. McCluskey doctoral thesis award competition finalist.	Fabian Oboril, Mehdi Baradaran Tahoori
2015	VTS	Resiliency challenges in sub-10nm technologies.	Rob Aitken, Ethan H. Cannon, Mondira Pant, Mehdi Baradaran Tahoori
2014	ASPDAC	Architectural aspects in design and analysis of SOT-based memories.	Rajendra Bishnoi, Mojtaba Ebrahimi, Fabian Oboril, Mehdi Baradaran Tahoori
2014	ASPDAC	ArISE: Aging-aware instruction set encoding for lifetime improvement.	Fabian Oboril, Mehdi Baradaran Tahoori
2014	DAC	Reliability-aware Register Binding for Control-Flow Intensive Designs.	Liang Chen, Mehdi Baradaran Tahoori
2014	DAC	Radiation-Induced Soft Error Analysis of SRAMs in SOI FinFET Technology: A Device to Circuit Approach.	Saman Kiamehr, Thomas H. Osiecki, Mehdi Baradaran Tahoori, Sani R. Nassif
2014	DAC	Protecting SRAM-based FPGAs Against Multiple Bit Upsets Using Erasure Codes.	Parthasarathy M. B. Rao, Mojtaba Ebrahimi, Razi Seyyedi, Mehdi Baradaran Tahoori
2014	DATE	A power-efficient reconfigurable architecture using PCM configuration technology.	Ali Ahari, Hossein Asadi, Behnam Khaleghi, Mehdi Baradaran Tahoori
2014	DATE	Asynchronous Asymmetrical Write Termination (AAWT) for a low power STT-MRAM.	Rajendra Bishnoi, Mojtaba Ebrahimi, Fabian Oboril, Mehdi Baradaran Tahoori
2014	DATE	Comprehensive analysis of alpha and neutron particle-induced soft errors in an embedded processor at nanoscales.	Mojtaba Ebrahimi, Adrian Evans, Mehdi Baradaran Tahoori, Razi Seyyedi, Enrico Costenaro, Dan Alexandrescu
2014	DATE	Aging-aware standard cell library design.	Saman Kiamehr, Farshad Firouzi, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori
2014	DATE	P/G TSV planning for IR-drop reduction in 3D-ICs.	Shengcheng Wang, Farshad Firouzi, Fabian Oboril, Mehdi Baradaran Tahoori
2014	ETS	Quantitative evaluation of register vulnerabilities in RTL control paths.	Liang Chen, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori
2014	FPL	Towards dark silicon era in FPGAs using complementary hard logic design.	Ali Ahari, Behnam Khaleghi, Zahra Ebrahimi, Hossein Asadi, Mehdi Baradaran Tahoori
2014	FPL	Aging effects in FPGAs: an experimental analysis.	Abdulazim Amouri, Florent Bruguier, Saman Kiamehr, Pascal Benoit, Lionel Torres, Mehdi Baradaran Tahoori
2014	ITC	Read disturb fault detection in STT-MRAM.	Rajendra Bishnoi, Mojtaba Ebrahimi, Fabian Oboril, Mehdi Baradaran Tahoori
2014	VLSID	Layout-Aware Delay Variation Optimization for CNTFET-Based Circuits.	Matthias Beste, Saman Kiamehr, Mehdi Baradaran Tahoori
2014	VTS	Self-heating thermal-aware testing of FPGAs.	Abdulazim Amouri, Jochen Hepp, Mehdi Baradaran Tahoori
2014	VTS	On-chip voltage-droop prediction using support-vector machines.	Fangming Ye, Farshad Firouzi, Yang Yang, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori
2013	ASPDAC	CLASS: Combined logic and architectural soft error sensitivity analysis.	Mojtaba Ebrahimi, Liang Chen, Hossein Asadi, Mehdi Baradaran Tahoori
2013	ASPDAC	Statistical analysis of BTI in the presence of process-induced voltage and temperature variations.	Farshad Firouzi, Saman Kiamehr, Mehdi Baradaran Tahoori
2013	DAC	A layout-based approach for multiple event transient analysis.	Mojtaba Ebrahimi, Hossein Asadi, Mehdi Baradaran Tahoori
2013	DAC	Reliable on-chip systems in the nano-era: lessons learnt and future trends.	Jrg Henkel, Lars Bauer, Nikil D. Dutt, Puneet Gupta, Sani R. Nassif, Muhammad Shafique, Mehdi Baradaran Tahoori, Norbert Wehn
2013	DATE	Incorporating the impacts of workload-dependent runtime variations into timing analysis.	Farshad Firouzi, Saman Kiamehr, Mehdi Baradaran Tahoori, Sani R. Nassif
2013	DATE	Instruction-set extension under process variation and aging effects.	Yuko Hara-Azumi, Farshad Firouzi, Saman Kiamehr, Mehdi Baradaran Tahoori
2013	DATE	MTTF-balanced pipeline design.	Fabian Oboril, Mehdi Baradaran Tahoori
2013	DDECS	Cross-layer resilient system design.	Mehdi Baradaran Tahoori
2013	ETS	A layout-aware x-filling approach for dynamic power supply noise reduction in at-speed scan testing.	Saman Kiamehr, Farshad Firouzi, Mehdi Baradaran Tahoori
2013	FCCM	Accurate Thermal-Profile Estimation and Validation for FPGA-Mapped Circuits.	Abdulazim Amouri, Hussam Amrouch, Thomas Ebi, Jrg Henkel, Mehdi Baradaran Tahoori
2013	FPL	Degradation in FPGAs: Monitoring, modeling and mitigation (PHD forum paper: Thesis broad overview).	Abdulazim Amouri, Mehdi Baradaran Tahoori
2013	FPL	Altering LUT configuration for wear-out mitigation of FPGA-mapped designs.	Parthasarathy M. B. Rao, Abdulazim Amouri, Saman Kiamehr, Mehdi Baradaran Tahoori
2013	ICCAD	Aging-aware logic synthesis.	Mojtaba Ebrahimi, Fabian Oboril, Saman Kiamehr, Mehdi Baradaran Tahoori
2013	IOLTS	A-SOFT-AES: Self-adaptive software-implemented fault-tolerance for AES.	Fabian Oboril, Ilias Sagar, Mehdi Baradaran Tahoori
2013	ITC	Representative critical-path selection for aging-induced delay monitoring.	Farshad Firouzi, Fangming Ye, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori
2013	VTS	Chip-level modeling and analysis of electrical masking of soft errors.	Saman Kiamehr, Mojtaba Ebrahimi, Farshad Firouzi, Mehdi Baradaran Tahoori
2012	DATE	Layout-Driven Robustness Analysis for misaligned Carbon Nanotubes in CNTFET-based standard cells.	Matthias Beste, Mehdi Baradaran Tahoori
2012	DATE	NBTI mitigation by optimized NOP assignment and insertion.	Farshad Firouzi, Saman Kiamehr, Mehdi Baradaran Tahoori
2012	DSN	ExtraTime: Modeling and analysis of wearout due to transistor aging at microarchitecture-level.	Fabian Oboril, Mehdi Baradaran Tahoori
2012	ETS	Reducing wearout in embedded processors using proactive fine-grain dynamic runtime adaptation.	Fabian Oboril, Mehdi Baradaran Tahoori
2012	ETS	Online detection and recovery of transient errors in front-end structures of microprocessors.	Syed Zafar Shazli, Mehdi Baradaran Tahoori
2012	FPL	High-level aging estimation for FPGA-mapped designs.	Abdulazim Amouri, Mehdi Baradaran Tahoori
2012	IOLTS	An efficient probability framework for error propagation and correlation estimation.	Liang Chen, Mehdi Baradaran Tahoori
2012	VTS	Ping-pong test: Compact test vector generation for reversible circuits.	Masoud Zamani, Mehdi Baradaran Tahoori, Krishnendu Chakrabarty
2012	RTCSA	Reliability-Aware Instruction Set Customization for ASIPs with Hardened Logic.	Unmesh D. Bordoloi, Bogdan Tanasa, Mehdi Baradaran Tahoori, Petru Eles, Zebo Peng, Syed Zafar Shazli, Samarjit Chakraborty
2011	ASPDAC	Variation-aware logic mapping for crossbar nano-architectures.	Masoud Zamani, Mehdi Baradaran Tahoori
2011	DATE	Soft error rate estimation of digital circuits in the presence of Multiple Event Transients (METs).	Mahdi Fazeli, Seyed Nematollah Ahmadian, Seyed Ghassem Miremadi, Hossein Asadi, Mehdi Baradaran Tahoori
2011	ETS	Fault Masking and Diagnosis in Reversible Circuits.	Masoud Zamani, Navid Farazmand, Mehdi Baradaran Tahoori
2011	FPL	A Low-Cost Sensor for Aging and Late Transitions Detection in Modern FPGAs.	Abdulazim Amouri, Mehdi Baradaran Tahoori
2011	ICCAD	Modeling and estimation of power supply noise using linear programming.	Farshad Firouzi, Saman Kiamehr, Mehdi Baradaran Tahoori
2011	PRDC	Numerical Defect Correction as an Algorithm-Based Fault Tolerance Technique for Iterative Solvers.	Fabian Oboril, Mehdi Baradaran Tahoori, Vincent Heuveline, Dimitar Lukarski, Jan-Philipp Weiss
2010	ASPDAC	Variation tolerant logic mapping for crossbar array nano architectures.	Cihan Tunc, Mehdi Baradaran Tahoori
2010	DATE	Panel: Reliability of data centers: Hardware vs. software.	Mehdi Baradaran Tahoori, Ishwar Parulkar, Dan Alexandrescu, Kevin Granlund, Allan Silburt, Bapi Vinnakota
2010	DSD	A Fast Analytical Approach to Multi-cycle Soft Error Rate Estimation of Sequential Circuits.	Mahdi Fazeli, Seyed Ghassem Miremadi, Hossein Asadi, Mehdi Baradaran Tahoori
2010	ETS	Multiple fault diagnosis in crossbar nano-architectures.	Navid Farazmand, Mehdi Baradaran Tahoori
2010	ETS	A transient error tolerant self-timed asynchronous architecture.	Masoud Zamani, Mehdi Baradaran Tahoori
2010	IOLTS	Online fault testing of reversible logic using dual rail coding.	Navid Farazmand, Masoud Zamani, Mehdi Baradaran Tahoori
2010	ITC	Soft error reliability aware placement and routing for FPGAs.	Mohammed A. Abdul-Aziz, Mehdi Baradaran Tahoori
2010	VTS	On-the-fly variation tolerant mapping in crossbar nano-architectures.	Cihan Tunc, Mehdi Baradaran Tahoori
2009	ICCD	Online multiple error detection in crossbar nano-architectures.	Navid Farazmand, Mehdi Baradaran Tahoori
2008	ITC	A Field Analysis of System-level Effects of Soft Errors Occurring in Microprocessors used in Information Systems.	Syed Zafar Shazli, Mohammed A. Abdul-Aziz, Mehdi Baradaran Tahoori, David R. Kaeli
2007	VTS	Case Study: Soft Error Rate Analysis in Storage Systems.	Brian Mullins, Hossein Asadi, Mehdi Baradaran Tahoori, David R. Kaeli, Kevin Granlund, Rudy Bauer, Scott Romano
2006	DATE	Vulnerability analysis of L2 cache elements to single event upsets.	Hossein Asadi, Vilas Sridharan, Mehdi Baradaran Tahoori, David R. Kaeli
2006	ICCAD	Soft error derating computation in sequential circuits.	Hossein Asadi, Mehdi Baradaran Tahoori
2006	ICCAD	Application-independent defect-tolerant crossbar nano-architectures.	Mehdi Baradaran Tahoori
2006	ISCAS	Soft error hardening for logic-level designs.	Hossein Asadi, Mehdi Baradaran Tahoori
2006	ITC	Test Compression for FPGAs.	Mehdi Baradaran Tahoori, Subhasish Mitra
2005	DATE	An Accurate SER Estimation Method Based on Propagation Probability.	Ghazanfar Asadi, Mehdi Baradaran Tahoori
2005	FPGA	Soft error rate estimation and mitigation for SRAM-based FPGAs.	Ghazanfar Asadi, Mehdi Baradaran Tahoori
2005	ICCAD	A mapping algorithm for defect-tolerance of reconfigurable nano-architectures.	Mehdi Baradaran Tahoori
2005	ISCAS	An analytical approach for soft error rate estimation in digital circuits.	Ghazanfar Asadi, Mehdi Baradaran Tahoori
2005	ISPASS	Balancing Performance and Reliability in the Memory Hierarchy.	Hossein Asadi, Vilas Sridharan, Mehdi Baradaran Tahoori, David R. Kaeli
2005	VTS	Soft Error Mitigation for SRAM-Based FPGAs.	Ghazanfar Asadi, Mehdi Baradaran Tahoori
2004	DATE	Fault Tolerance of Programmable Switch Blocks.	Jing Huang, Mehdi Baradaran Tahoori, Fabrizio Lombardi
2004	DATE	Sensitivity-Based Modeling and Methodology for Full-Chip Substrate Noise Analysis.	Rajeev Murgai, Subodh M. Reddy, Takashi Miyoshi, Takeshi Horie, Mehdi Baradaran Tahoori
2004	DATE	Testing of Quantum Dot Cellular Automata Based Designs.	Mehdi Baradaran Tahoori, Fabrizio Lombardi
2004	FCCM	Defect and Fault Tolerance of Reconfigurable Molecular Computing.	Mehdi Baradaran Tahoori, Subhasish Mitra
2004	ITC	Routability and Fault Tolerance of FPGA Interconnect Architectures.	Jing Huang, Mehdi Baradaran Tahoori, Fabrizio Lombardi
2004	ITC	Application-Dependent Diagnosis of FPGAs.	Mehdi Baradaran Tahoori
2004	ITC	Interconnect Delay Testing of Designs on Programmable Logic Devices.	Mehdi Baradaran Tahoori, Subhasish Mitra
2004	VTS	Defects and Faults in Quantum Cellular Automata at Nano Scale.	Mehdi Baradaran Tahoori, Mariam Momenzadeh, Jing Huang, Fabrizio Lombardi
2004	VTS	A Multi-Configuration Strategy for an Application Dependent Testing of FPGAs.	Mehdi Baradaran Tahoori, Edward J. McCluskey, Michel Renovell, Philippe Faure
2003	DAC	Using satisfiability in application-dependent testing of FPGA interconnects.	Mehdi Baradaran Tahoori
2003	FPGA	A high resolution diagnosis technique for open and short defects in FPGA interconnects.	Mehdi Baradaran Tahoori
2003	FPGA	Application-dependent testing of FPGAs for bridging faults.	Mehdi Baradaran Tahoori
2003	VTS	Automatic Configuration Generation for FPGA Interconnect Testing.	Mehdi Baradaran Tahoori, Subhasish Mitra
2002	ITC	Fault Grading FPGA Interconnect Test Configurations.	Mehdi Baradaran Tahoori, Subhasish Mitra, Shahin Toutounchi, Edward J. McCluskey