Grigor Tshagharyan
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
19
Venues
4
Active years
2014–2025
Best venue rank
A
Where they publish
Papers
19 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2025 | ETS | European Test Symposium Teams: an Anniversary Snapshot. | Maksim Jenihhin, Jaan Raik, Artur Jutman, Natalia Cherezova, Raimund Ubar, Liviu Miclea, Szilrd Enyedi, Iulia Stefan, Ovidiu Stan, Cosmina Corches, Zebo Peng, Petru Eles, Rolf Drechsler, S. Eggersgl, Grschwin Fey, Andreas Glowatz, Daniel Tille, Georges G. E. Gielen, Anthony Coyette, Wim Dobbelaere, Ronny Vanhooren, Po-Yao Chuang, Erik Jan Marinissen, Giorgio Di Natale, M. Barragan, Paolo Maistri, S. Mir, Vatajelu I. Vatajelu, Paolo Bernardi, Stefano Di Carlo, Paolo Prinetto, Matteo Sonza Reorda, Massimo Violante, Haralampos-G. Stratigopoulos, M. K. Michael, Stelios Neophytou, Stavros Hadjitheophanous, Kyriakos Christou, M. Skitsas, Alberto Bosio, Bastien Deveautour, Patrick Girard, Marcello Traiola, Arnaud Virazel, Fernando Fernandes dos Santos, Angeliki Kritikakou, Gioele Casagranda, Marzio Vallero, Flavio Vella, Paolo Rech, Letcia Maria Bolzani Poehls, Milos Krstic, Marko S. Andjelkovic, Fabian Luis Vargas, Grigor Tshagharyan, Gurgen Harutyunyan, Valery A. Vardanian, Samvel K. Shoukourian, Yervant Zorian, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas, Mottaqiallah Taouil, Moritz Fieback, Anteneh Gebregiorgis, Rajendra Bishnoi, Said Hamdioui, Abhijit Chatterjee, Anurup Saha, Suhasini Komarraju, K. Ma, Chandramouli N. Amarnath, Mehdi Baradaran Tahoori, Mahta Mayahinia, Maryam Rajabalipanah, Katayoon Basharkhah, N. Nosrati, Zahra Jahanpeima, Zain Navabi, Hans-Joachim Wunderlich, Sybille Hellebrand |
| 2025 | ETS | Analysis and Mitigation of Radiation Effects in SRAM-based Register Files. | Zhe Zhang, Surendra Hemaram, Mahta Mayahinia, Christian Weis, Norbert Wehn, Mehdi B. Tahoori, Sani R. Nassif, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian |
| 2025 | ITC | Leveraging UCIe Interface for Silicon Health & Reliabiilty of Chiplets in a 3D Stack. | Sandeep Kumar Goel, Ankita Patidar, Stanley John, Frank Lee, Min-Jer Wang, Daniel F. J. Yang, Yervant Zorian, Manish Arora, Firooz Massoudi, Shaan Awasthi, Stelios Balalis, Velmurugan Pathervellaichamy, Bharath Shankaranarayanan, Narasimhalu Raju, Gurgen Harutyunyan, Grigor Tshagharyan, Vahagn Hovakimyan, Arman Karagyozyan, Alvina Manucharyan |
| 2024 | ITC | Testing for aging in advanced SRAM: From front end of the line transistors to back end of the line interconnects. | Zhe Zhang, Mahta Mayahinia, Christian Weis, Norbert Wehn, Mehdi B. Tahoori, Sani R. Nassif, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian |
| 2024 | VTS | Addressing the Combined Effect of Transistor and Interconnect Aging in SRAM towards Silicon Lifecycle Management. | Zhe Zhang, Mahta Mayahinia, Christian Weis, Norbert Wehn, Mehdi B. Tahoori, Sani R. Nassif, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian |
| 2023 | ETS | On-chip Electromigration Sensor for Silicon Lifecycle Management of Nanoscale VLSI. | Mahta Mayahinia, Mehdi Baradaran Tahoori, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian |
| 2023 | ITC | Utilizing ECC Analytics to Improve Memory Lifecycle Management. | Costas Argyrides, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian |
| 2023 | ITC | SLM Subsystem for Automotive SoC: Case Study on Path Margin Monitor. | Kranthi Kandula, Ramalingam Kolisetti, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian |
| 2023 | VTS | Overcoming Embedded Memory Test & Repair Challenges in the Gate-All-Around Era. | Artur Ghukasyan, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian |
| 2023 | VTS | An Efficient External Memory Test Solution: Case Study for HPC Application. | Keqing Ouyang, Minqiang Peng, Yunnong Zhu, Kang Qi, Grigor Tshagharyan, Arun Kumar, Gurgen Harutyunyan, Isaac Wang |
| 2022 | ITC | An Efficient Test Strategy for Detection of Electromigration Impact in Advanced FinFET Memories. | Mahta Mayahinia, Mehdi B. Tahoori, Gurgen Harutyunyan, Grigor Tshagharyan, Karen Amirkhanyan |
| 2022 | VTS | Innovative Practices Track: What's Next for Automotive: Where and How to Improve Field Test and Enhance SoC Safety. | Minqiang Peng, Youfa Wu, Jialiang Li, Alex Yu, Grigor Tshagharyan, Costas Argyrides, Vilas Sridharan, Gurgen Harutyunyan, Yervant Zorian, Nilanjan Mukherjee |
| 2019 | IOLTS | Variation-aware Fault Modeling and Test Generation for STT-MRAM. | Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori, Hayk T. Grigoryan, Grigor Tshagharyan |
| 2019 | VTS | Innovative Practices on In-System Test and Reliability of Memories. | S. Bandyopadhyay, J. Mekkoth, Marc Hutner, Hayk T. Grigoryan, Arun Kumar, Samvel K. Shoukourian, Grigor Tshagharyan, Yervant Zorian, Gabriele Boschi, Duccio Lazzarotti, Donato Luongo, Hanna Shaheen, Gurgen Harutyunyan |
| 2018 | ITC | Defect injection, Fault Modeling and Test Algorithm Generation Methodology for STT-MRAM. | Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori, Grigor Tshagharyan, Hayk T. Grigoryan, Gurgen Harutyunyan, Yervant Zorian |
| 2018 | ITC | Modeling and Testing of Aging Faults in FinFET Memories for Automotive Applications. | Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian, Anteneh Gebregiorgis, Mohammad Saber Golanbari, Rajendra Bishnoi, Mehdi Baradaran Tahoori |
| 2017 | ITC | An effective functional safety solution for automotive systems-on-chip. | Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian |
| 2015 | VTS | Impact of parameter variations on FinFET faults. | Gurgen Harutyunyan, Grigor Tshagharyan, Yervant Zorian |
| 2014 | VTS | Fault modeling and test algorithm creation strategy for FinFET-based memories. | Gurgen Harutyunyan, Grigor Tshagharyan, Valery A. Vardanian, Yervant Zorian |