Sarath Mohanachandran Nair
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
11
Venues
6
Active years
2017–2020
Best venue rank
A
Where they publish
Papers
11 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2020 | DATE | Dynamic Faults based Hardware Trojan Design in STT-MRAM. | Sarath Mohanachandran Nair, Rajendra Bishnoi, Arunkumar Vijayan, Mehdi Baradaran Tahoori |
| 2020 | DATE | A Universal Spintronic Technology based on Multifunctional Standardized Stack. | Mehdi Baradaran Tahoori, Sarath Mohanachandran Nair, Rajendra Bishnoi, Lionel Torres, Sophiane Senni, Guillaume Patrigeon, Pascal Benoit, Gregory di Pendina, Guillaume Prenat |
| 2020 | ETS | Defect Characterization and Test Generation for Spintronic-based Compute-In-Memory. | Sarath Mohanachandran Nair, Christopher Mnch, Mehdi Baradaran Tahoori |
| 2020 | VTS | Special Session - Emerging Memristor Based Memory and CIM Architecture: Test, Repair and Yield Analysis. | Rajendra Bishnoi, Lizhou Wu, Moritz Fieback, Christopher Mnch, Sarath Mohanachandran Nair, Mehdi Baradaran Tahoori, Ying Wang, Huawei Li, Said Hamdioui |
| 2020 | VTS | Mitigating Read Failures in STT-MRAM. | Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori |
| 2019 | IOLTS | Variation-aware Fault Modeling and Test Generation for STT-MRAM. | Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori, Hayk T. Grigoryan, Grigor Tshagharyan |
| 2018 | ASPDAC | Process variation and temperature aware adaptive scrubbing for retention failures in STT-MRAM. | Nour Sayed, Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori |
| 2018 | DATE | Parametric failure modeling and yield analysis for STT-MRAM. | Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori |
| 2018 | DATE | Using multifunctional standardized stack as universal spintronic technology for IoT. | Mehdi Baradaran Tahoori, Sarath Mohanachandran Nair, Rajendra Bishnoi, Sophiane Senni, Jad Mohdad, Frdrick Mailly, Lionel Torres, Pascal Benoit, Abdoulaye Gamati, Pascal Nouet, Frederic Ouattara, Gilles Sassatelli, Kotb Jabeur, Pierre Vanhauwaert, A. Atitoaie, I. Firastrau, Gregory di Pendina, Guillaume Prenat |
| 2018 | ITC | Defect injection, Fault Modeling and Test Algorithm Generation Methodology for STT-MRAM. | Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori, Grigor Tshagharyan, Hayk T. Grigoryan, Gurgen Harutyunyan, Yervant Zorian |
| 2017 | DATE | VAET-STT: A variation aware estimator tool for STT-MRAM based memories. | Sarath Mohanachandran Nair, Rajendra Bishnoi, Mohammad Saber Golanbari, Fabian Oboril, Mehdi Baradaran Tahoori |