| 2023 | COMPSAC | A Resource Estimation Method in Multi-Cloud Environment with a Model Based on a Repairable-Item Inventory System. | Naoki Okuda, Kaori Maeda, Chisa Takano, Hideyuki Ichihara |
| 2015 | ETS | A fault tolerant response analyzer with self-error-correction capability. | Yuki Fukazawa, Hideyuki Ichihara, Tomoo Inoue |
| 2015 | ETS | A practical approach for logic simplification based on fault acceptability for error tolerant application. | Hideyuki Ichihara, Junpei Kamei, Tsuyoshi Iwagaki, Tomoo Inoue |
| 2015 | ETS | Designing area-efficient controllers for multi-cycle transient fault tolerant systems. | Tsuyoshi Iwagaki, Yutaro Ishimori, Hideyuki Ichihara, Tomoo Inoue |
| 2015 | ICCD | Logic simplification by minterm complement for error tolerant application. | Hideyuki Ichihara, Tomoya Inaoka, Tsuyoshi Iwagaki, Tomoo Inoue |
| 2014 | ICCD | Compact and accurate stochastic circuits with shared random number sources. | Hideyuki Ichihara, Shota Ishii, Daiki Sunamori, Tsuyoshi Iwagaki, Tomoo Inoue |
| 2012 | ICCD | Modeling economics of LSI design and manufacturing for test design selection. | Hideyuki Ichihara, Noboru Shimizu, Tsuyoshi Iwagaki, Tomoo Inoue |
| 2011 | IOLTS | High-level synthesis for multi-cycle transient fault tolerant datapaths. | Tomoo Inoue, Hayato Henmi, Yuki Yoshikawa, Hideyuki Ichihara |
| 2010 | ETS | Hybrid test application in hybrid delay scan design. | Yuki Yoshikawa, Tomomi Nuwa, Hideyuki Ichihara, Tomoo Inoue |
| 2010 | IOLTS | An FPGA-based fail-soft system with adaptive reconfiguration. | Ryoji Noji, Satoshi Fujie, Yuki Yoshikawa, Hideyuki Ichihara, Tomoo Inoue |
| 2007 | ETS | Optimal Contexts for the Self-Test of Coarse Grain Dynamically Reconfigurable Processors. | Tomoo Inoue, Takashi Fujii, Hideyuki Ichihara |
| 2007 | VTS | TAM Design and Optimization for Transparency-Based SoC Test. | Tomokazu Yoneda, Akiko Shuto, Hideyuki Ichihara, Tomoo Inoue, Hideo Fujiwara |
| 2005 | ASPDAC | A Huffman-based coding with efficient test application. | Michihiro Shintani, Toshihiro Ohara, Hideyuki Ichihara, Tomoo Inoue |
| 2003 | DATE | Test Generation for Acyclic Sequential Circuits with Single Stuck-at Fault Combinational ATPG. | Hideyuki Ichihara, Tomoo Inoue |
| 2003 | VLSID | Channel Width Test Data Compression under a Limited Number of Test Inputs and Outputs. | Hideyuki Ichihara, Kozo Kinoshita, Koji Isodono, Shigeki Nishikawa |
| 2000 | VLSID | Test Transformation to Improve Compaction by Statistical Encoding. | Hideyuki Ichihara, Kozo Kinoshita, Irith Pomeranz, Sudhakar M. Reddy |