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Huaxing Tang

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

17

Venues

5

Active years

2002–2020

Best venue rank

A

Where they publish

Papers

17 indexed papers, newest first.

YearVenueTitleAuthors
2020ITCUsing Volume Cell-aware Diagnosis Results to Improve Physical Failure Analysis Efficiency.Hanson Peng, Mao-Yuan Hsia, Man-Ting Pang, I.-Y. Chang, Jeff Fan, Huaxing Tang, Manish Sharma, Wu Yang
2019ETSA supervised machine learning application in volume diagnosis.Yue Tian, Gaurav Veda, Wu-Tung Cheng, Manish Sharma, Huaxing Tang, Neerja Bawaskar, Sudhakar M. Reddy
2018DATEA case study for using dynamic partitioning based solution in volume diagnosis.Tao Wang, Zhangchun Shi, Junlin Huang, Huaxing Tang, Wu Yang, Junna Zhong
2016ETSCell-aware diagnosis: Defective inmates exposed in their cells.Peter C. Maxwell, Friedrich Hapke, Huaxing Tang
2013VTSDistributed dynamic partitioning based diagnosis of scan chain.Yu Huang, Xiaoxin Fan, Huaxing Tang, Manish Sharma, Wu-Tung Cheng, Brady Benware, Sudhakar M. Reddy
2012ITCImproved volume diagnosis throughput using dynamic design partitioning.Xiaoxin Fan, Huaxing Tang, Yu Huang, Wu-Tung Cheng, Sudhakar M. Reddy, Brady Benware
2011ITCDeterministic IDDQ diagnosis using a net activation based model.Andras Kun, Ralf Arnold, Peter Heinrich, Gwenol Maugard, Huaxing Tang, Wu-Tung Cheng
2008ITCEfficiently Performing Yield Enhancements by Identifying Dominant Physical Root Cause from Test Fail Data.Manish Sharma, Brady Benware, Lei Ling, David Abercrombie, Lincoln Lee, Martin Keim, Huaxing Tang, Wu-Tung Cheng, Ting-Pu Tai, Yi-Jung Chang, Reinhart Lin, Albert Mann
2007ETSAnalyzing Volume Diagnosis Results with Statistical Learning for Yield Improvement.Huaxing Tang, Manish Sharma, Janusz Rajski, Martin Keim, Brady Benware
2007ITCInterconnect open defect diagnosis with minimal physical information.Chen Liu, Wei Zou, Sudhakar M. Reddy, Wu-Tung Cheng, Manish Sharma, Huaxing Tang
2007VTSSpeeding Up Effect-Cause Defect Diagnosis Using a Small Dictionary.Wei Zou, Wu-Tung Cheng, Sudhakar M. Reddy, Huaxing Tang
2006ITCA Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis.Martin Keim, Nagesh Tamarapalli, Huaxing Tang, Manish Sharma, Janusz Rajski, Chris Schuermyer, Brady Benware
2006VLSIDOn Methods to Improve Location Based Logic Diagnosis.Wei Zou, Wu-Tung Cheng, Sudhakar M. Reddy, Huaxing Tang
2005DATEDefect Aware Test Patterns.Huaxing Tang, Gang Chen, Sudhakar M. Reddy, Chen Wang, Janusz Rajski, Irith Pomeranz
2005VLSIDOn Efficient X-Handling Using a Selective Compaction Scheme to Achieve High Test Response Compaction Ratios.Huaxing Tang, Chen Wang, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Irith Pomeranz
2003ITCOn Reducing Test Data Volume and Test Application Time for Multiple Scan Chain Designs.Huaxing Tang, Sudhakar M. Reddy, Irith Pomeranz
2002ITCOn Testing of Interconnect Open Defects in Combinational Logic Circuits with Stems of Large Fanout.Sudhakar M. Reddy, Irith Pomeranz, Huaxing Tang, Seiji Kajihara, Kozo Kinoshita