Jayashree Saxena
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
14
Venues
3
Active years
1992–2008
Best venue rank
A
Where they publish
Papers
14 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2008 | ITC | Modeling Test Escape Rate as a Function of Multiple Coverages. | Kenneth M. Butler, John M. Carulli Jr., Jayashree Saxena |
| 2004 | ITC | Minimizing Power Consumption in Scan Testing: Pattern Generation and DFT Techniques. | Kenneth M. Butler, Jayashree Saxena, Tony Fryars, Graham Hetherington |
| 2003 | ITC | A Case Study of IR-Drop in Structured At-Speed Testing. | Jayashree Saxena, Kenneth M. Butler, Vinay B. Jayaram, Subhendu Kundu, N. V. Arvind, Pravin Sreeprakash, Manfred Hachinger |
| 2002 | ITC | Scan-Based Transition Fault Testing - Implementation and Low Cost Test Challenges . | Jayashree Saxena, Kenneth M. Butler, John Gatt, R. Raghuraman, Sudheendra Phani Kumar, Supatra Basu, David J. Campbell, John Berech |
| 2001 | ITC | An analysis of power reduction techniques in scan testing. | Jayashree Saxena, Kenneth M. Butler, Lee Whetsel |
| 2000 | ITC | An empirical study on the effects of test type ordering on overall test efficiency. | Jayashree Saxena, Kenneth M. Butler |
| 2000 | ITC | Computer-aided fault to defect mapping (CAFDM) for defect diagnosis. | Zoran Stanojevic, Hari Balachandran, D. M. H. Walker, Fred Lakbani, Jayashree Saxena, Kenneth M. Butler |
| 1998 | ITC | IC diagnosis: preventing wars and war stories. | Jayashree Saxena |
| 1998 | ITC | On applying non-classical defect models to automated diagnosis. | Jayashree Saxena, Kenneth M. Butler, Hari Balachandran, David B. Lavo, Tracy Larrabee, F. Joel Ferguson, Brian Chess |
| 1997 | ITC | Bridging Fault Diagnosis in the Absence of Physical Information. | David B. Lavo, Tracy Larrabee, F. Joel Ferguson, Brian Chess, Jayashree Saxena, Kenneth M. Butler |
| 1996 | ITC | Integrating Automated Diagnosis into the Testing and Failure Analysis Operations. | Kenneth M. Butler, Karl Johnson, Jeff Platt, Anjali Jones, Jayashree Saxena |
| 1993 | ICCD | Desgin for Testability of Asynchronous Sequential Circuits. | Jayashree Saxena, Dhiraj K. Pradhan |
| 1993 | ITC | A Method to Derive Compact Test Sets for Path Delay Faults in Combinational Circuits. | Jayashree Saxena, Dhiraj K. Pradhan |
| 1992 | VTS | A design for testability scheme to reduce test application time in full scan. | Dhiraj K. Pradhan, Jayashree Saxena |