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Jorge Semio

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

22

Venues

8

Active years

1999–2026

Best venue rank

C

Where they publish

Papers

22 indexed papers, newest first.

YearVenueTitleAuthors
2026HCIPhonIA: A Web-Based Human-Machine Cooperative System for Accessible Vocal Health Monitoring.Talles Silva, Jorge Semio, Susana Rodrigues
2025IECONQuasi-Resonant DC-DC Combination Converter CSC-Zeta Full-Wave for Bipolar Outputs.Cristian Daz Martn, Eladio Durn Aranda, Salvador Prez Litrn, Jorge Semio
2022HCIDRAM Performance Sensor.Jorge Semio, Lus Santos, Marcelino B. Santos
2022IECONQuasi-Resonant DC-DC Converter Single-Switch for Single-Input Bipolar-Output Applications.Cristian Daz Martn, Eladio Durn Aranda, Salvador Prez Litrn, Jorge Semio
2019IECONA Zeta-CSC Converter Combination for Single-Input and Bipolar Output.Salvador P. Litran, Eladio Durn, Mara Bella Ferrera, Jorge Semio, Rafael S. Barroso
2018HCIDevelopment of an Energy Management System for the Charge Scheduling of Plug-in Electric Vehicles.Dario Cruz, Nelson Pinto, Jnio M. Monteiro, Pedro J. S. Cardoso, Cristiano Cabrita, Jorge Semio, Lus M. R. Oliveira, Joo M. F. Rodrigues
2018HCIPerformance Sensor for Reliable Operation.Jorge Semio, Ruben Cabral, Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira
2013FPLAging monitoring with local sensors in FPGA-based designs.Carlos Leong, Jorge Semio, Isabel C. Teixeira, Marcelino B. Santos, Joo Paulo Teixeira, Mara Dolores Valds, Judit Freijedo, Juan J. Rodrguez-Andina, Fabian Vargas
2012IOLTSThe influence of clock-gating on NBTI-induced delay degradation.Jackson Pachito, Celestino V. Martins, Jorge Semio, Marcelino Bicho Dos Santos, Isabel C. Teixeira, Joo Paulo Teixeira
2011FPLPerformance Failure Prediction Using Built-In Delay Sensors in FPGAs.Vasco Bexiga, Carlos Leong, Jorge Semio, Isabel C. Teixeira, Joo Paulo Teixeira, Mara Dolores Valds, Judit Freijedo, Juan J. Rodrguez-Andina, Fabian Vargas
2011VTSAdaptive Error-Prediction Flip-flop for performance failure prediction with aging sensors.Celestino V. Martins, Jorge Semio, Julio Csar Vzquez, Vctor H. Champac, Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira
2010IOLTSInvestigating the Use of BICS to detect resistive-open defects in SRAMs.Raul Chipana, Letcia Maria Veiras Bolzani, Fabian Vargas, Jorge Semio, Juan J. Rodrguez-Andina, Isabel C. Teixeira, Joo Paulo Teixeira
2010IOLTSPredictive error detection by on-line aging monitoring.Julio Csar Vzquez, Vctor H. Champac, Adriel Ziesemer, Ricardo Reis, Jorge Semio, Isabel C. Teixeira, Marcelino B. Santos, Joo Paulo Teixeira
2009IOLTSDelay-fault tolerance to power supply Voltage disturbances analysis in nanometer technologies.Jorge Semio, Judit Freijedo, Juan J. Rodrguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira
2008DDECSProcess Tolerant Design Using Thermal and Power-Supply Tolerance in Pipeline Based Circuits.Jorge Semio, Juan J. Rodrguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira
2008IOLTSExploiting Parametric Power Supply and/or Temperature Variations to Improve Fault Tolerance in Digital Circuits.Jorge Semio, Judit Freijedo, Juan J. Rodrguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira
2007DDECSImproving Tolerance to Power-Supply and Temperature Variations in Synchronous Circuits.Jorge Semio, Judit Freijedo, Juan J. Rodrguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira
2007IOLTSOn-line Dynamic Delay Insertion to Improve Signal Integrity in Synchronous Circuits.Jorge Semio, Judit Freijedo, Juan J. Rodrguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira
2006DDECSFunctional-Oriented BIST of Sequential Circuits Aiming at Dynamic Faults Coverage.F. Guerreiro, Jorge Semio, A. Pierce, Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira
2006IOLTSDynamic Fault Detection in Digital Systems Using Dynamic Voltage Scaling and Multi-Temperature Schemes.Marcial Jess Rodrguez-Irago, Juan J. Rodrguez-Andina, Fabian Vargas, Jorge Semio, Isabel C. Teixeira, Joo Paulo Teixeira
2001DATEEmbedded tutorial: TRP: integrating embedded test and ATE.Yervant Zorian, Paolo Prinetto, Joo Paulo Teixeira, Isabel C. Teixeira, Carlos Eduardo Pereira, Octvio Pscoa Dias, Jorge Semio, Peter Muhmenthaler, W. Radermacher
1999ETSFrom system level to defect-oriented test: a case study.Octvio Pscoa Dias, Jorge Semio, Marcelino B. Santos, Isabel Maria Cacho Teixeira, Joo Paulo Teixeira