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Jrgen Schlffel

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

15

Venues

7

Active years

2005–2012

Best venue rank

A*

Where they publish

Papers

15 indexed papers, newest first.

YearVenueTitleAuthors
2012ETSIntroduction to the defect-oriented cell-aware test methodology for significant reduction of DPPM rates.Friedrich Hapke, Jrgen Schlffel
2012ITCCell-aware Production test results from a 32-nm notebook processor.Friedrich Hapke, Michael Reese, Jason Rivers, A. Over, V. Ravikumar, Wilfried Redemund, Andreas Glowatz, Jrgen Schlffel, Janusz Rajski
2011ITCCell-aware analysis for small-delay effects and production test results from different fault models.Friedrich Hapke, Jrgen Schlffel, Wilfried Redemund, Andreas Glowatz, Janusz Rajski, Michael Reese, J. Rearick, Jason Rivers
2010ETSImproving CNF representations in SAT-based ATPG for industrial circuits using BDDs.Daniel Tille, Stephan Eggersgl, Rene Krenz-Baath, Jrgen Schlffel, Rolf Drechsler
2010ITCDefect-oriented cell-internal testing.Friedrich Hapke, Wilfried Redemund, Jrgen Schlffel, Rene Krenz-Baath, Andreas Glowatz, Michael Wittke, Hamidreza Hashempour, Stefan Eichenberger
2009ITCDefect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs.Friedrich Hapke, Rene Krenz-Baath, Andreas Glowatz, Jrgen Schlffel, Hamidreza Hashempour, Stefan Eichenberger, Camelia Hora, Dan Adolfsson
2009VTSRestrict Encoding for Mixed-Mode BIST.Abdul Wahid Hakmi, Stefan Holst, Hans-Joachim Wunderlich, Jrgen Schlffel, Friedrich Hapke, Andreas Glowatz
2008DATEResistive Bridging Fault Simulation of Industrial Circuits.Piet Engelke, Ilia Polian, Jrgen Schlffel, Bernd Becker
2007ETSComputation and Application of Absolute Dominators in Industrial Designs.Rene Krenz-Baath, Andreas Glowatz, Jrgen Schlffel
2007ITCProgrammable deterministic Built-In Self-Test.Abdul Wahid Hakmi, Hans-Joachim Wunderlich, Christian G. Zoellin, Andreas Glowatz, Friedrich Hapke, Jrgen Schlffel, Laurent Souef
2007MEMOCODECombining Multi-Valued Logics in SAT-based ATPG for Path Delay Faults.Stephan Eggersgl, Grschwin Fey, Rolf Drechsler, Andreas Glowatz, Friedrich Hapke, Jrgen Schlffel
2006DACFault detection and diagnosis with parity trees for space compaction of test responses.Harald P. E. Vranken, Sandeep Kumar Goel, Andreas Glowatz, Jrgen Schlffel, Friedrich Hapke
2006ETSDeterministic Logic BIST for Transition Fault Testing.Valentin Gherman, Hans-Joachim Wunderlich, Jrgen Schlffel, Michael Garbers
2005VLSIDABCD Modeling of Crosstalk Coupling Noise to Analyze the Signal Integrity Losses on the Victim Interconnect in DSM Chips.Ajoy Kumar Palit, Volker Meyer, Walter Anheier, Jrgen Schlffel
2005VTSImplementing a Scheme for External Deterministic Self-Test.Abdul Wahid Hakmi, Hans-Joachim Wunderlich, Valentin Gherman, Michael Garbers, Jrgen Schlffel