| 2009 | ITC | Test access mechanism for multiple identical cores. | Grady Giles, Jing Wang, Anuja Sehgal, Kedarnath J. Balakrishnan, James Wingfield |
| 2008 | ITC | Test Access Mechanism for Multiple Identical Cores. | Grady Giles, Jing Wang, Anuja Sehgal, Kedarnath J. Balakrishnan, James Wingfield |
| 2007 | DATE | Test cost reduction for SoC using a combined approach to test data compression and test scheduling. | Quming Zhou, Kedarnath J. Balakrishnan |
| 2007 | VLSID | Efficient Scan-Based BIST Using Multiple LFSRs and Dictionary Coding. | Kedarnath J. Balakrishnan |
| 2007 | VTS | RTL Test Point Insertion to Reduce Delay Test Volume. | Kedarnath J. Balakrishnan, Lei Fang |
| 2006 | DATE | Efficient unknown blocking using LFSR reseeding. | Seongmoon Wang, Kedarnath J. Balakrishnan, Srimat T. Chakradhar |
| 2006 | VLSID | PIDISC: Pattern Independent Design Independent Seed Compression Technique. | Kedarnath J. Balakrishnan, Seongmoon Wang, Srimat T. Chakradhar |
| 2005 | DATE | Reconfigurable Linear Decompressors Using Symbolic Gaussian Elimination. | Kedarnath J. Balakrishnan, Nur A. Touba |
| 2005 | ITC | XWRC: externally-loaded weighted random pattern testing for input test data compression. | Seongmoon Wang, Kedarnath J. Balakrishnan, Srimat T. Chakradhar |
| 2004 | ASPDAC | Re-configurable embedded core test protocol. | Seongmoon Wang, Srimat T. Chakradhar, Kedarnath J. Balakrishnan |
| 2004 | ETS | Relating entropy theory to test data compression. | Kedarnath J. Balakrishnan, Nur A. Touba |
| 2004 | ITC | Improving Encoding Efficiency for Linear Decompressors Using Scan Inversion. | Kedarnath J. Balakrishnan, Nur A. Touba |
| 2003 | VTS | Deterministic Test Vector Decompression in Software Using Linear Operations. | Kedarnath J. Balakrishnan, Nur A. Touba |