Ken Chau-Cheung Cheng
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
8
Venues
4
Active years
2019–2022
Best venue rank
A
Where they publish
Papers
8 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2022 | ITC | Wafer Defect Pattern Classification with Explainable-Decision Tree Technique. | Ken Chau-Cheung Cheng, Katherine Shu-Min Li, Sying-Jyan Wang, Andrew Yi-Ann Huang, Chen-Shiun Lee, Leon Li-Yang Chen, Peter Yi-Yu Liao, Nova Cheng-Yen Tsai |
| 2021 | ETS | Automatic Inspection for Wafer Defect Pattern Recognition with Unsupervised Clustering. | Katherine Shu-Min Li, Leon Li-Yang Chen, Ken Chau-Cheung Cheng, Peter Yi-Yu Liao, Sying-Jyan Wang, Andrew Yi-Ann Huang, Nova Cheng-Yen Tsai, Leon Chou, Gus Chang-Hung Han, Jwu E. Chen, Hsing-Chung Liang, Chun-Lung Hsu |
| 2021 | ITC | WGrid: Wafermap Grid Pattern Recognition with Machine Learning Techniques. | Peter Yi-Yu Liao, Katherine Shu-Min Li, Leon Li-Yang Chen, Sying-Jyan Wang, Andrew Yi-Ann Huang, Ken Chau-Cheung Cheng, Nova Cheng-Yen Tsai, Leon Chou |
| 2020 | DATE | Wafer-Level Test Path Pattern Recognition and Test Characteristics for Test-Induced Defect Diagnosis. | Ken Chau-Cheung Cheng, Katherine Shu-Min Li, Andrew Yi-Ann Huang, Ji-Wei Li, Leon Li-Yang Chen, Nova Cheng-Yen Tsai, Sying-Jyan Wang, Chen-Shiun Lee, Leon Chou, Peter Yi-Yu Liao, Hsing-Chung Liang, Jwu E. Chen |
| 2020 | ETS | PWS: Potential Wafermap Scratch Defect Pattern Recognition with Machine Learning Techniques. | Katherine Shu-Min Li, Peter Yi-Yu Liao, Leon Chou, Ken Chau-Cheung Cheng, Andrew Yi-Ann Huang, Sying-Jyan Wang, Gus Chang-Hung Han |
| 2020 | ITC | TestDNA-E: Wafer Defect Signature for Pattern Recognition by Ensemble Learning. | Leon Li-Yang Chen, Katherine Shu-Min Li, Ken Chau-Cheung Cheng, Sying-Jyan Wang, Andrew Yi-Ann Huang, Leon Chou, Nova Cheng-Yen Tsai, Chen-Shiun Lee |
| 2020 | VTS | Innovative Practice on Wafer Test Innovations. | Dyi-Chung Hu, Hirohito Hashimoto, Li-Fong Tseng, Ken Chau-Cheung Cheng, Katherine Shu-Min Li, Sying-Jyan Wang, Sean Y.-S. Chen, Jwu E. Chen, Clark Liu, Andrew Yi-Ann Huang |
| 2019 | ITC | TestDNA: Novel Wafer Defect Signature for Diagnosis and Yield Learning. | Andrew Yi-Ann Huang, Katherine Shu-Min Li, Cheng-Yen Tsai, Ken Chau-Cheung Cheng, Sying-Jyan Wang, Xu-Hao Jiang, Leon Chou, Chen-Shiun Lee |