LeRoy Winemberg
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
24
Venues
6
Active years
2005–2019
Best venue rank
A*
Where they publish
Papers
24 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2019 | ETS | Digital Built-in Self-Test for Phased Locked Loops to Enable Fault Detection. | Mehmet Ince, Ender Yilmaz, Wei Fu, Joonsung Park, Krishnaswamy Nagaraj, LeRoy Winemberg, Sule Ozev |
| 2017 | ITC | Built-in self-test for stability measurement of low dropout regulator. | Jae Woong Jeong, Ender Yilmaz, LeRoy Winemberg, Sule Ozev |
| 2017 | ITC | Some considerations on choosing an outlier method for automotive product lines. | Li-C. Wang, Sebastian Siatkowski, Chuanhe Jay Shan, Matthew Nero, Nikolas Sumikawa, LeRoy Winemberg |
| 2017 | VTS | Learning the process for correlation analysis. | Sebastian Siatkowski, Li-C. Wang, Nik Sumikawa, LeRoy Winemberg |
| 2016 | ISCAS | An efficient all-digital IR-Drop Alarmer for DVFS-based SoC. | Liting Yu, Xiaoxiao Wang, Yuanqing Cheng, Xiaoying Zhao, Pengyuan Jiao, Aixin Chen, Donglin Su, LeRoy Winemberg, Mehdi Sadi, Mark Tehranipoor |
| 2016 | ITC | BIST-RM: BIST-assisted reliability management of SoCs using on-chip clock sweeping and machine learning. | Mehdi Sadi, Gustavo K. Contreras, Dat Tran, Jifeng Chen, LeRoy Winemberg, Mark Tehranipoor |
| 2016 | ITC | Putting wasted clock cycles to use: Enhancing fortuitous cell-aware fault detection with scan shift capture. | Fanchen Zhang, Daphne Hwong, Yi Sun, Allison Garcia, Soha Alhelaly, Geoff Shofner, LeRoy Winemberg, Jennifer Dworak |
| 2016 | VTS | Test-point insertion efficiency analysis for LBIST applications. | Miao Tony He, Gustavo K. Contreras, Mark Tehranipoor, Dat Tran, LeRoy Winemberg |
| 2015 | ITC | Generalization of an outlier model into a "global" perspective. | Sebastian Siatkowski, Chia-Ling Chang, Li-C. Wang, Nikolas Sumikawa, LeRoy Winemberg, W. Robert Daasch |
| 2015 | VTS | A robust digital sensor IP and sensor insertion flow for in-situ path timing slack monitoring in SoCs. | Mehdi Sadi, LeRoy Winemberg, Mark Tehranipoor |
| 2014 | VTS | Identification of testable representative paths for low-cost verification of circuit performance during manufacturing and in-field tests. | Jifeng Chen, LeRoy Winemberg, Mohammad Tehranipoor |
| 2013 | DATE | Fault analysis and simulation of large scale industrial mixed-signal circuits. | Ender Yilmaz, Geoff Shofner, LeRoy Winemberg, Sule Ozev |
| 2012 | ITC | Screening customer returns with multivariate test analysis. | Nik Sumikawa, Jeff Tikkanen, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir |
| 2012 | ITC | Radic: A standard-cell-based sensor for on-chip aging and flip-flop metastability measurements. | Xiaoxiao Wang, Dat Tran, Saji George, LeRoy Winemberg, Nisar Ahmed, Steve Palosh, Allan Dobin, Mohammad Tehranipoor |
| 2011 | DAC | In-field aging measurement and calibration for power-performance optimization. | Shuo Wang, Mohammad Tehranipoor, LeRoy Winemberg |
| 2011 | DATE | Multidimensional parametric test set optimization of wafer probe data for predicting in field failures and setting tighter test limits. | Dragoljub Gagi Drmanac, Nik Sumikawa, LeRoy Winemberg, Li-C. Wang, Magdy S. Abadir |
| 2011 | ETS | Critical Fault-Based Pattern Generation for Screening SDDs. | Fang Bao, Ke Peng, Mahmut Yilmaz, Krishnendu Chakrabarty, LeRoy Winemberg, Mohammad Tehranipoor |
| 2011 | ITC | Forward prediction based on wafer sort data - A case study. | Nik Sumikawa, Dragoljub Gagi Drmanac, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir |
| 2011 | VTS | Case Study: Efficient SDD test generation for very large integrated circuits. | Ke Peng, Fang Bao, Geoff Shofner, LeRoy Winemberg, Mohammad Tehranipoor |
| 2011 | VTS | Understanding customer returns from a test perspective. | Nik Sumikawa, Dragoljub Gagi Drmanac, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir |
| 2011 | VTS | Special session 5B: Panel How much toggle activity should we be testing with? | Xiaoqing Wen, Mohammad Tehranipoor, Rohit Kapur, Anand Bhat, Amitava Majumdar, LeRoy Winemberg |
| 2011 | VTS | Special session: Hot topic: Smart silicon. | LeRoy Winemberg, Mohammad Tehranipoor |
| 2010 | ITC | Detecting and diagnosing open defects. | Dat Tran, LeRoy Winemberg, Darrell Carder, Xijiang Lin, Joe LeBritton, Bruce Swanson |
| 2005 | ITC | Outsourcing DFT: it can be done but it isn't easy. | LeRoy Winemberg |