Mark Kassab
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
26
Venues
4
Active years
1995–2022
Best venue rank
A*
Where they publish
Papers
26 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2022 | VTS | Accurate Estimation of Test Pattern Counts for a Wide-Range of EDT Input/Output Channel Configurations. | Shi-Xuan Zheng, Chung-Yu Yeh, Kuen-Jong Lee, Chen Wang, Wu-Tung Cheng, Mark Kassab, Janusz Rajski, Sudhakar M. Reddy |
| 2020 | ETS | Efficient Prognostication of Pattern Count with Different Input Compression Ratios. | Fong-Jyun Tsai, Chong-Siao Ye, Yu Huang, Kuen-Jong Lee, Wu-Tung Cheng, Sudhakar M. Reddy, Mark Kassab, Janusz Rajski |
| 2020 | ITC | Streaming Scan Network (SSN): An Efficient Packetized Data Network for Testing of Complex SoCs. | Jean-Franois Ct, Mark Kassab, Wojciech Janiszewski, Ricardo Rodrigues, Reinhard Meier, Bartosz Kaczmarek, Peter Orlando, Geir Eide, Janusz Rajski, Glenn Coln-Bonet, Naveen Mysore, Ya Yin, Pankaj Pant |
| 2020 | ITC | Prediction of Test Pattern Count and Test Data Volume for Scan Architectures under Different Input Channel Configurations. | Fong-Jyun Tsai, Chong-Siao Ye, Kuen-Jong Lee, Shi-Xuan Zheng, Yu Huang, Wu-Tung Cheng, Sudhakar M. Reddy, Mark Kassab, Janusz Rajski, Chen Wang, Justyna Zawada |
| 2020 | VTS | Effective Design of Layout-Friendly EDT Decompressor. | Yu Huang, Janusz Rajski, Mark Kassab, Nilanjan Mukherjee, Jeffrey Mayer |
| 2014 | ETS | Using dynamic shift to reduce test data volume in high-compression designs. | Xijiang Lin, Mark Kassab, Janusz Rajski |
| 2014 | ITC | Isometric test compression with low toggling activity. | Amit Kumar, Mark Kassab, Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Chen Wang |
| 2013 | ITC | EDT bandwidth management - Practical scenarios for large SoC designs. | Jakub Janicki, Jerzy Tyszer, Wu-Tung Cheng, Yu Huang, Mark Kassab, Nilanjan Mukherjee, Janusz Rajski, Yan Dong, Grady Giles |
| 2011 | ITC | EDT channel bandwidth management in SoC designs with pattern-independent test access mechanism. | Jakub Janicki, Jerzy Tyszer, Avijit Dutta, Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski |
| 2011 | ITC | A novel Test Access Mechanism for failure diagnosis of multiple isolated identical cores. | Manish Sharma, Avijit Dutta, Wu-Tung Cheng, Brady Benware, Mark Kassab |
| 2010 | ITC | Dynamic channel allocation for higher EDT compression in SoC designs. | Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jakub Janicki, Jerzy Tyszer |
| 2010 | ITC | Low capture power at-speed test in EDT environment. | Elham K. Moghaddam, Janusz Rajski, Sudhakar M. Reddy, Xijiang Lin, Nilanjan Mukherjee, Mark Kassab |
| 2010 | ITC | Clock control architecture and ATPG for reducing pattern count in SoC designs with multiple clock domains. | Tom Waayers, Richard Morren, Xijiang Lin, Mark Kassab |
| 2010 | VTS | At-speed scan test with low switching activity. | Elham K. Moghaddam, Janusz Rajski, Sudhakar M. Reddy, Mark Kassab |
| 2008 | ITC | Low Power Scan Shift and Capture in the EDT Environment. | Dariusz Czysz, Mark Kassab, Xijiang Lin, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer |
| 2007 | DAC | Test Generation in the Presence of Timing Exceptions and Constraints. | Dhiraj Goswami, Kun-Han Tsai, Mark Kassab, Janusz Rajski |
| 2006 | ITC | OCI: Open Compression Interface. | Bruce Cory, Rohit Kapur, Mick Tegethoff, Mark Kassab, Brion L. Keller, Kee Sup Kim, Dwayne Burek, Steven F. Oakland, Benoit Nadeau-Dostie |
| 2006 | ITC | X-Press Compactor for 1000x Reduction of Test Data. | Janusz Rajski, Jerzy Tyszer, Grzegorz Mrugalski, Wu-Tung Cheng, Nilanjan Mukherjee, Mark Kassab |
| 2004 | ITC | Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model. | Brady Benware, Cam Lu, John Van Slyke, Prabhu Krishnamurthy, Robert Madge, Martin Keim, Mark Kassab, Janusz Rajski |
| 2004 | ITC | Realizing High Test Quality Goals with Smart Test Resource Usage. | Xinli Gu, Cyndee Wang, Abby Lee, Bill Eklow, Kun-Han Tsai, Jan Arild Tofte, Mark Kassab, Janusz Rajski |
| 2003 | ITC | Industrial Experience with Adoption of EDT for Low-Cost Test without Concessions. | Frank Poehl, Matthias Beck, Ralf Arnold, Peter Muhmenthaler, Nagesh Tamarapalli, Mark Kassab, Nilanjan Mukherjee, Janusz Rajski |
| 2002 | ITC | Embedded Deterministic Test for Low-Cost Manufacturing Test. | Janusz Rajski, Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee, Rob Thompson, Kun-Han Tsai, Andre Hertwig, Nagesh Tamarapalli, Grzegorz Mrugalski, Geir Eide, Jun Qian |
| 1999 | ITC | Logic BIST for large industrial designs: real issues and case studies. | Graham Hetherington, Tony Fryars, Nagesh Tamarapalli, Mark Kassab, Abu S. M. Hassan, Janusz Rajski |
| 1998 | DAC | A Fast Sequential Learning Technique for Real Circuits with Application to Enhancing ATPG Performance. | Aiman H. El-Maleh, Mark Kassab, Janusz Rajski |
| 1995 | DAC | Software Accelerated Functional Fault Simulation for Data-Path Architectures. | Mark Kassab, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer |
| 1995 | ITC | Hierarchical Functional-Fault Simulation for High-Level Synthesis. | Mark Kassab, Janusz Rajski, Jerzy Tyszer |