Michelangelo Grosso
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
32
Venues
9
Active years
2005–2026
Best venue rank
B
Where they publish
Papers
32 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2026 | VTS | Pre-processing Functional And Physical Defect Equivalences To Accelerate Cell-Aware Model Generation. | Reza Khoshzaban, Gianmarco Mongelli, Dorian Ronga, Iacopo Guglielminetti, Michelangelo Grosso, Eric Faehn, Patrick Girard, Arnaud Virazel, Riccardo Cantoro |
| 2025 | ITC | Exploiting the correlation with traditional fault models to speed-up cell-aware fault simulation. | Reza Khoshzaban, Iacopo Guglielminetti, Michelangelo Grosso, Matteo Sonza Reorda, Riccardo Cantoro |
| 2024 | DATE | AMBEATion: Analog Mixed-Signal Back-End Design Automation with Machine Learning and Artificial Intelligence Techniques. | Giulia Elena Aliffi, Joao Baixinho, Dalibor Barri, Francesco Daghero, Nicola Di Carolo, Gabriele Faraone, Michelangelo Grosso, Daniele Jahier Pagliari, Jiri Jakovenko, Vladimr Jancek, Dario Licastro, Vazgen Melikyan, Matteo Risso, Vittorio Romano, Eugenio Serianni, Martin Stastn, Patrik Vacula, Giorgia Vitanza, Chen Xie |
| 2024 | ETS | Assessing the Effectiveness of Software-Based Self-Test Programs for Static Cell-Aware Test. | Riccardo Cantoro, Michelangelo Grosso, Iacopo Guglielminetti, Reza Khoshzaban, Matteo Sonza Reorda |
| 2023 | DSD | Targeting different defect-oriented fault models in IC testing: an experimental approach. | Nunzio Mirabella, Andrea Floridia, Riccardo Cantoro, Michelangelo Grosso, Matteo Sonza Reorda |
| 2022 | IOLTS | Recent Trends and Perspectives on Defect-Oriented Testing. | Paolo Bernardi, Riccardo Cantoro, Anthony Coyette, W. Dobbeleare, Moritz Fieback, Andrea Floridia, G. Gielenk, Jhon Gomez, Michelangelo Grosso, Andrea Guerriero, Iacopo Guglielminetti, Said Hamdioui, Giorgio Insinga, N. Mautone, Nunzio Mirabella, Sandro Sartoni, Matteo Sonza Reorda, Rudolf Ullmann, Ronny Vanhooren, N. Xamak, Lizhou Wu |
| 2020 | DDECS | On the test of single via related defects in digital VLSI designs. | Nunzio Mirabella, Maurizio Ricci, Michelangelo Grosso |
| 2016 | IECON | A compact IGBT electro-thermal model in Verilog-A for fast system-level simulation. | Davide Lena, Michelangelo Grosso, Alberto Bocca, Alberto Macii, Salvatore Rinaudo |
| 2015 | DATE | A new distributed framework for integration of district energy data from heterogeneous devices. | Francesco Gavino Brundu, Edoardo Patti, Andrea Acquaviva, Michelangelo Grosso, Gaetano Rascon, Salvatore Rinaudo, Enrico Macii |
| 2012 | DDECS | A SBST strategy to test microprocessors' Branch Target Buffer. | Paolo Bernardi, Lyl M. Ciganda, Michelangelo Grosso, Ernesto Snchez, Matteo Sonza Reorda |
| 2012 | ETS | On-line software-based self-test of the Address Calculation Unit in RISC processors. | Paolo Bernardi, Lyl M. Ciganda, Mauricio de Carvalho, Michelangelo Grosso, Jorge Luis Lagos-Benites, Ernesto Snchez, Matteo Sonza Reorda, Oscar Ballan |
| 2011 | DATE | Fault grading of software-based self-test procedures for dependable automotive applications. | Paolo Bernardi, Michelangelo Grosso, Ernesto Snchez, Oscar Ballan |
| 2011 | ETS | A Low-Cost Emulation System for Fast Co-verification and Debug. | Jorge Luis Lagos-Benites, Michelangelo Grosso, Luca Sterpone, Matteo Sonza Reorda, G. Audisio, M. Pipponzi, Marco Sabatini |
| 2010 | ETS | An adaptive tester architecture for volume diagnosis. | Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda |
| 2010 | ETS | A software-based self-test methodology for system peripherals. | Michelangelo Grosso, Wilson J. Prez H., Danilo Ravotto, Edgar E. Snchez, Matteo Sonza Reorda, Jaime Velasco-Medina |
| 2010 | IOLTS | An on-line fault detection technique based on embedded debug features. | Michelangelo Grosso, Matteo Sonza Reorda, Marta Portela-Garca, Mario Garca-Valderas, Celia Lpez-Ongil, Luis Entrena |
| 2010 | IOLTS | Analysis of root causes of alpha sensitivity variations on microprocessors manufactured using different cell layouts. | Paolo Rech, Michelangelo Grosso, Fabio Melchiori, Domenico Loparco, Davide Appello, Luigi Dilillo, Alessandro Paccagnella, Matteo Sonza Reorda |
| 2010 | ISCAS | A novel scalable and reconfigurable emulation platform for embedded systems verification. | M. Di Marzio, Michelangelo Grosso, Matteo Sonza Reorda, Luca Sterpone, G. Audisio, Marco Sabatini |
| 2010 | ITC | A programmable BIST for DRAM testing and diagnosis. | Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda, Y. Zhang |
| 2009 | ETS | Automatic Functional Stress Pattern Generation for SoC Reliability Characterization. | Davide Appello, Paolo Bernardi, R. Cagliesi, M. Giancarlini, Michelangelo Grosso, Edgar E. Snchez, Matteo Sonza Reorda |
| 2009 | IOLTS | Exploiting embedded FPGA in on-line software-based test strategies for microprocessor cores. | Michelangelo Grosso, Matteo Sonza Reorda |
| 2009 | IOLTS | Evaluating Alpha-induced soft errors in embedded microprocessors. | Paolo Rech, Simone Gerardin, Alessandro Paccagnella, Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda, Davide Appello |
| 2009 | VTS | DfT Reuse for Low-Cost Radiation Testing of SoCs: A Case Study. | Davide Appello, Paolo Bernardi, Simone Gerardin, Michelangelo Grosso, Alessandro Paccagnella, Paolo Rech, Matteo Sonza Reorda |
| 2008 | ETS | An Innovative and Low-Cost Industrial Flow for Reliability Characterization of SoCs. | Davide Appello, Paolo Bernardi, R. Cagliesi, M. Giancarlini, Michelangelo Grosso |
| 2008 | VTS | A Novel SBST Generation Technique for Path-Delay Faults in Microprocessors Exploiting Gate- and RT-Level Descriptions. | Kyriakos Christou, Maria K. Michael, Paolo Bernardi, Michelangelo Grosso, Ernesto Snchez, Matteo Sonza Reorda |
| 2007 | ETS | On the Automatic Generation of Test Programs for Path-Delay Faults in Microprocessor Cores. | Paolo Bernardi, Michelangelo Grosso, Ernesto Snchez, Matteo Sonza Reorda |
| 2006 | DDECS | Test Considerations about the Structured ASIC Paradigm. | Paolo Bernardi, Michelangelo Grosso |
| 2006 | ITC | Embedded Memory Diagnosis: An Industrial Workflow. | Davide Appello, Vincenzo Tancorre, Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda |
| 2006 | VTS | On the Automation of the Test Flow of Complex SoCs. | Davide Appello, Vincenzo Tancorre, Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda |
| 2006 | VTS | A Pattern Ordering Algorithm for Reducing the Size of Fault Dictionaries. | Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda |
| 2005 | ETS | Exploiting an infrastructure IP to reduce memory diagnosis costs in SoCs. | Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda |
| 2005 | IOLTS | Integrating BIST Techniques for On-Line SoC Testing. | Alberto Manzone, Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Ernesto Snchez, Matteo Sonza Reorda |