| 2009 | VLSID | Design for Manufacturability and Reliability in Nano Era. | Goutam Debnath, Paul J. Thadikaran |
| 2006 | VLSID | Design Challenges for High Performance Nano-Technology. | Goutam Debnath, Paul J. Thadikaran |
| 2005 | DATE | Extraction Error Modeling and Automated Model Debugging in High-Performance Low Power Custom Designs. | Yu-Shen Yang, Andreas G. Veneris, Paul J. Thadikaran, Srikanth Venkataraman |
| 2004 | VTS | Razor: A Tool for Post-Silicon Scan ATPG Pattern Debug and Its Application. | Debashis Nayak, Srikanth Venkataraman, Paul J. Thadikaran |
| 2003 | ITC | Extraction Error Diagnosis and Correction in High-Performance Designs. | Yu-Shen Yang, Jiang Brandon Liu, Paul J. Thadikaran, Andreas G. Veneris |
| 2002 | ETS | Novel ATPG algorithms for transition faults. | Xiao Liu, Michael S. Hsiao, Sreejit Chakravarty, Paul J. Thadikaran |
| 2002 | ITC | Techniques to Reduce Data Volume and Application Time for Transition Test. | Xiao Liu, Michael S. Hsiao, Sreejit Chakravarty, Paul J. Thadikaran |
| 1996 | VLSID | Fast Algorithms for Computer IDDQ Tests for Combination Circuits. | Paul J. Thadikaran, Sreejit Chakravarty |
| 1994 | ITC | A Study of I | Sreejit Chakravarty, Paul J. Thadikaran |
| 1993 | VTS | Simulation and generation of I | Sreejit Chakravarty, Paul J. Thadikaran |