| 2019 | IOLTS | Automated Die Inking through On-line Machine Learning. | Constantinos Xanthopoulos, Arnold Neckermann, Paulus List, Klaus-Peter Tschernay, Peter Sarson, Yiorgos Makris |
| 2019 | VTS | Innovative Practices on Automotive Test. | Wim Dobbelaere, Marco Restifo, Peter Sarson |
| 2018 | IOLTS | Towards an automatic approach for hardware verification according to ISO 26262 functional safety standard. | Jacopo Sini, Matteo Sonza Reorda, Massimo Violante, Peter Sarson |
| 2018 | VTS | Online information utility assessment for per-device adaptive test flow. | Yanjun Li, Ender Yilmaz, Peter Sarson, Sule Ozev |
| 2018 | VTS | Group delay measurement of frequency down-converter devices using chirped RF modulated signal. | Peter Sarson, Tomonori Yanagida, Kosuke Machida |
| 2018 | VTS | IP session on ISO26262 EDA. | Art Schaldenbrand, Yervant Zorian, Stephen Sunter, Peter Sarson |
| 2018 | VTS | High efficient low cost EEPROM screening method in combination with an area optimized byte replacement strategy which enables high reliability EEPROMs. | Gregor Schatzberger, Friedrich Peter Leisenberger, Peter Sarson, Andreas Wiesner |
| 2018 | VTS | Special session on BIST/calibration of A/MS devices. | Hans-Mart von Staudt, James Izon, Sule Ozev, Peter Sarson |
| 2017 | ITC | Use models for extending IEEE 1687 to analog test. | Peter Sarson, Jeff Rearick |
| 2017 | ITC | A/MS benchmark circuits for comparing fault simulation, DFT, and test generation methods. | Stephen Sunter, Peter Sarson |
| 2017 | ITC | Automated die inking: A pattern recognition-based approach. | Constantinos Xanthopoulos, Peter Sarson, Heinz Reiter, Yiorgos Makris |
| 2017 | VTS | Innovative practices session 7C automotive quality assurance. | Peter Sarson |
| 2017 | VTS | A technique for dynamic range improvement of intermodulation distortion products for an Interpolating DAC-based Arbitrary Waveform Generator using a phase switching algorithm. | Peter Sarson, Shohei Shibuya, Tomonori Yanagida, Haruo Kobayashi |
| 2016 | ETS | Group delay filter measurement using a chirp. | Peter Sarson |
| 2016 | ITC | Variation and failure characterization through pattern classification of test data from multiple test stages. | Chun-Kai Hsu, Peter Sarson, Gregor Schatzberger, Friedrich Peter Leisenberger, John M. Carulli Jr., Siddhartha Siddhartha, Kwang-Ting Cheng |
| 2016 | ITC | Test time efficient group delay filter characterization technique using a discrete chirped excitation signal. | Peter Sarson |
| 2016 | VTS | Yield improvement of an EEPROM for automotive applications while maintaining high reliability. | Gregor Schatzberger, Friedrich Peter Leisenberger, Peter Sarson |