| 2001 | ITC | BIST-based delay path testing in FPGA architectures. | Ian G. Harris, Premachandran R. Menon, Russell Tessier |
| 1999 | ITC | Robust testability of primitive faults using test points. | Ramesh C. Tekumalla, Premachandran R. Menon |
| 1998 | ICCAD | On primitive fault test generation in non-scan sequential circuits. | Ramesh C. Tekumalla, Premachandran R. Menon |
| 1997 | ICCAD | Test generation for primitive path delay faults in combinational circuits. | Ramesh C. Tekumalla, Premachandran R. Menon |
| 1997 | ICCD | Synthesis of Delay Verifiable Sequential Circuits using Partial Enhanced Scan. | Ramesh C. Tekumalla, Premachandran R. Menon |
| 1997 | ITC | Delay Testing with Clock Control: An Alternative to Enhanced Scan. | Ramesh C. Tekumalla, Premachandran R. Menon |
| 1996 | VLSID | Identifying Redundant Path Delay Faults in Sequential Circuits. | Ramesh C. Tekumalla, Premachandran R. Menon |
| 1995 | VTS | Multifault testability of delay-testable circuits. | Wuudiann Ke, Premachandran R. Menon |
| 1994 | ICCD | Delay-Verifiability of Combinational Circuits Based on Primitive Faults. | Wuudiann Ke, Premachandran R. Menon |
| 1994 | VTS | Realization of fully path-delay-fault testable non-scan sequential circuits. | Wuudiann Ke, Premachandran R. Menon |
| 1991 | ITC | Robustly Scan-Testable CMOS Sequential Circuits. | Bong-Hee Park, Premachandran R. Menon |
| 1990 | ITC | Design of scan-testable CMOS sequential circuits. | Bong-Hee Park, Premachandran R. Menon |
| 1990 | ITC | Parallel pattern fault simulation based on stem faults in combinational circuits. | Ohyoung Song, Premachandran R. Menon |
| 1989 | ITC | Symbolic Test Generation for Hierarchically Modeled Digital Systems. | P. N. Anirudhan, Premachandran R. Menon |
| 1989 | ITC | An Approach to Functional Level Testability Analysis. | C. H. Chen, Premachandran R. Menon |
| 1985 | ITC | Test Generation In Lamp2: System Overview. | Miron Abramovici, James J. Kulikowski, Premachandran R. Menon, David T. Miller |
| 1985 | ITC | Test Generation In Lamp2: Concepts and Algorithms. | Miron Abramovici, James J. Kulikowski, Premachandran R. Menon, David T. Miller |
| 1983 | ITC | A Practical Approach to Fault Simulation and Test Generation for Bridging Faults. | Miron Abramovici, Premachandran R. Menon |