| 2007 | DDECS | Memories in Scaled Technologies: A Review of Process Induced Failures, Test Methodologies, and Fault Tolerance. | Saibal Mukhopadhyay, Qikai Chen, Kaushik Roy |
| 2007 | VLSID | An Accurate Analytical SNM Modeling Technique for SRAMs Based on Butterworth Filter Function. | Qikai Chen, Arjun Guha, Kaushik Roy |
| 2006 | DATE | Circuit-aware device design methodology for nanometer technologies: a case study for low power SRAM design. | Qikai Chen, Saibal Mukhopadhyay, Aditya Bansal, Kaushik Roy |
| 2006 | ISLPED | Analysis of super cut-off transistors for ultralow power digital logic circuits. | Arijit Raychowdhury, Xuanyao Fong, Qikai Chen, Kaushik Roy |
| 2005 | DAC | A novel synthesis approach for active leakage power reduction using dynamic supply gating. | Swarup Bhunia, Nilanjan Banerjee, Qikai Chen, Hamid Mahmoodi-Meimand, Kaushik Roy |
| 2005 | ICCD | A Soft Error Monitor Using Switching Current Detection. | Patrick Ndai, Amit Agarwal, Qikai Chen, Kaushik Roy |
| 2005 | IOLTS | Process Variation Tolerant Online Current Monitor for Robust Systems. | Qikai Chen, Saibal Mukhopadhyay, Hamid Mahmoodi, Kaushik Roy |
| 2005 | VTS | Modeling and Testing of SRAM for New Failure Mechanisms Due to Process Variations in Nanoscale CMOS. | Qikai Chen, Hamid Mahmoodi-Meimand, Swarup Bhunia, Kaushik Roy |