Rohit Kapur
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
46
Venues
8
Active years
1991–2017
Best venue rank
A*
Where they publish
Papers
46 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2017 | ITC | Diagnosing multiple faulty chains with low pin convolution compressor using compressed production test set. | Subhadip Kundu, Kuldip Kumar, Rishi Kumar, Rohit Kapur |
| 2017 | VLSID | A New Logic Encryption Strategy Ensuring Key Interdependency. | Rajit Karmakar, N. Prasad, Santanu Chattopadhyay, Rohit Kapur, Indranil Sengupta |
| 2016 | ITC | Handling wrong mapping: A new direction towards better diagnosis with low pin convolution compressors. | Subhadip Kundu, Parthajit Bhattacharya, Rohit Kapur |
| 2015 | DATE | Fault diagnosis in designs with extreme low pin test data compressors. | Subhadip Kundu, Parthajit Bhattacharya, Rohit Kapur |
| 2014 | VTS | Innovative practices session 10C: Advances in DFT and compression. | Rohit Kapur, Irith Pomeranz |
| 2013 | DAC | An ATE assisted DFD technique for volume diagnosis of scan chains. | Subhadip Kundu, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur |
| 2013 | ETS | Aggresive scan chain masking for improved diagnosis of multiple scan chain failures. | Subhadip Kundu, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur |
| 2012 | VLSID | A Diagnosability Metric for Test Set Selection Targeting Better Fault Detection. | Subhadip Kundu, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur |
| 2011 | VLSID | Multiple Fault Diagnosis Based on Multiple Fault Simulation Using Particle Swarm Optimization. | Subhadip Kundu, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur |
| 2011 | VTS | Special session 5B: Panel How much toggle activity should we be testing with? | Xiaoqing Wen, Mohammad Tehranipoor, Rohit Kapur, Anand Bhat, Amitava Majumdar, LeRoy Winemberg |
| 2009 | DATE | Scalable Adaptive Scan (SAS). | Anshuman Chandra, Rohit Kapur, Yasunari Kanzawa |
| 2008 | DATE | Low Power Illinois Scan Architecture for Simultaneous Power and Test Data Volume Reduction. | Anshuman Chandra, Felix Ng, Rohit Kapur |
| 2008 | VTS | Bounded Adjacent Fill for Low Capture Power Scan Testing. | Anshuman Chandra, Rohit Kapur |
| 2007 | DATE | Testing in the year 2020. | Rajesh Galivanche, Rohit Kapur, Antonio Rubio |
| 2007 | DDECS | Accurately Determining Bridging Defects from Layout. | Maria Gkatziani, Rohit Kapur, Qing Su, Ben Mathew, Roberto Mattiuzzo, Laura Tarantini, Cy Hay, Salvatore Talluto, Thomas W. Williams |
| 2007 | ITC | Fundamentals of timing information for test: How simple can we get? | Rohit Kapur, Jindrich Zejda, Thomas W. Williams |
| 2007 | VTS | Multimode Illinois Scan Architecture for Test Application Time and Test Data Volume Reduction. | Anshuman Chandra, Haihua Yan, Rohit Kapur |
| 2007 | VTS | Minimizing the Impact of Scan Compression. | Peter Wohl, John A. Waicukauski, Rohit Kapur, Sanjay Ramnath, Emil Gizdarski, Thomas W. Williams, P. Jaini |
| 2006 | ITC | OCI: Open Compression Interface. | Bruce Cory, Rohit Kapur, Mick Tegethoff, Mark Kassab, Brion L. Keller, Kee Sup Kim, Dwayne Burek, Steven F. Oakland, Benoit Nadeau-Dostie |
| 2005 | ITC | Test the test experts: do we know what we are doing? | Rohit Kapur |
| 2005 | ITC | Efficient compression of deterministic patterns into multiple PRPG seeds. | Peter Wohl, John A. Waicukauski, Sanjay Patel, Francisco DaSilva, Thomas W. Williams, Rohit Kapur |
| 2004 | ITC | Security vs. Test Quality: Are they mutually exclusive? | Rohit Kapur |
| 2004 | VTS | Changing the Scan Enable during Shift. | Nodari Sitchinava, Samitha Samaranayake, Rohit Kapur, Emil Gizdarski, Frederic Neuveux, Thomas W. Williams |
| 2003 | DATE | Test Pattern Compression Using Prelude Vectors in Fan-Out Scan Chain with Feedback Architecture. | Nahmsuk Oh, Rohit Kapur, Thomas W. Williams, Jim Sproch |
| 2003 | ITC | Overview of the IEEE P1500 Standard. | Francisco DaSilva, Yervant Zorian, Lee Whetsel, Karim Arabi, Rohit Kapur |
| 2003 | VTS | A Reconfigurable Shared Scan-in Architecture. | Samitha Samaranayake, Emil Gizdarski, Nodari Sitchinava, Frederic Neuveux, Rohit Kapur, Thomas W. Williams |
| 2002 | DAC | Enhancing test efficiency for delay fault testing using multiple-clocked schemes. | Jing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng, Jennifer Dworak, M. Ray Mercer, Rohit Kapur, Thomas W. Williams |
| 2002 | DATE | Directed-Binary Search in Logic BIST Diagnostics. | Rohit Kapur, Thomas W. Williams, M. Ray Mercer |
| 2002 | ICCAD | Fast seed computation for reseeding shift register in test pattern compression. | Nahmsuk Oh, Rohit Kapur, Thomas W. Williams |
| 2002 | ITC | Integrating DFT in the Physical Synthesis Flow. | Los Guiller, Frederic Neuveux, S. Duggirala, R. Chandramouli, Rohit Kapur |
| 2002 | ITC | Analysis of Delay Test Effectiveness with a Multiple-Clock Scheme. | Jing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng, Jennifer Dworak, M. Ray Mercer, Rohit Kapur, Thomas W. Williams |
| 2001 | ITC | CTL the language for describing core-based test. | Rohit Kapur, Maurice Lousberg, Tony Taylor, Brion L. Keller, Paul Reuter, Douglas Kay |
| 2001 | ITC | Tester retargetable patterns. | Rohit Kapur, Thomas W. Williams |
| 2001 | ITC | A new methodology for improved tester utilization. | Ajay Khoche, Rohit Kapur, David Armstrong, Thomas W. Williams, Mick Tegethoff, Jochen Rivoir |
| 2001 | VTS | IP and Automation to Support IEEE P1500. | Dwayne Burek, Garen Darbinyan, Rohit Kapur, Maurice Lousberg, Teresa L. McLaurin, Mike Ricchetti |
| 2000 | ITC | On using IEEE P1500 SECT for test plug-n-play. | Yervant Zorian, Erik Jan Marinissen, Rohit Kapur |
| 1999 | ITC | High level ATPG is important and is on its way! | Rohit Kapur |
| 1999 | ITC | Towards a standard for embedded core test: an example. | Yervant Zorian, Erik Jan Marinissen, Rohit Kapur, Tony Taylor, Lee Whetsel |
| 1996 | DATE | Iddq Testing for High Performance CMOS - The Next Ten Years. | Thomas W. Williams, Rohit Kapur, M. Ray Mercer, Robert H. Dennard, Wojciech Maly |
| 1996 | ITC | I | Thomas W. Williams, Robert H. Dennard, Rohit Kapur, M. Ray Mercer, Wojciech Maly |
| 1994 | ITC | Design of an Efficient Weighted-Random-Pattern Generation System. | Rohit Kapur, Srinivas Patil, Thomas J. Snethen, Thomas W. Williams |
| 1994 | VTS | Limitations in predicting defect level based on stuck-at fault coverage. | Jaehong Park, Mark Naivar, Rohit Kapur, M. Ray Mercer, Thomas W. Williams |
| 1992 | DAC | Functional Approaches to Generating Orderings for Efficient Symbolic Representations. | M. Ray Mercer, Rohit Kapur, Don E. Ross |
| 1992 | ITC | All Tests for a Fault Are Not Equally Valuable for Defect Detection. | Rohit Kapur, Jaehong Park, M. Ray Mercer |
| 1992 | VTS | The roles of controllability and observability in design for test. | Kenneth M. Butler, Rohit Kapur, M. Ray Mercer, Don E. Ross |
| 1991 | DAC | Heuristics to Compute Variable Orderings for Efficient Manipulation of Ordered Binary Decision Diagrams. | Kenneth M. Butler, Don E. Ross, Rohit Kapur, M. Ray Mercer |