| 2024 | VTS | Logic-AAA: Debug of Logic Failures with an on-ATE Expert System. | Chris Nigh, Ronald D. Blanton |
| 2022 | ITC | PEPR: Pseudo-Exhaustive Physically-Aware Region Testing. | Wei Li, Chris Nigh, Danielle Duvalsaint, Subhasish Mitra, Ronald D. Blanton |
| 2021 | ITC | AAA: Automated, On-ATE AI Debug of Scan Chain Failures. | Chris Nigh, Gaurav Bhargava, Ronald D. Blanton |
| 2020 | ETS | Design Obfuscation versus Test. | Farimah Farahmandi, Ozgur Sinanoglu, Ronald D. Blanton, Samuel Pagliarini |
| 2018 | ICCD | Back-End Layout Reflection for Test Chip Design. | Zeye Liu, Ronald D. Blanton |
| 2017 | ITC | Fault simulation acceleration for TRAX dictionary construction using GPUs. | Matthew Beckler, Ronald D. Blanton |
| 2017 | ITC | Front-end layout reflection for test chip design. | Zeye Liu, Phillip Fynan, Ronald D. Blanton |
| 2016 | ITC | Diagnostic resolution improvement through learning-guided physical failure analysis. | Carlston Lim, Yang Xue, Xin Li, Ronald D. Blanton, M. Enamul Amyeen |
| 2015 | ICCAD | Statistical Learning in Chip (SLIC). | Ronald D. Blanton, Xin Li, Ken Mai, Diana Marculescu, Radu Marculescu, Jeyanandh Paramesh, Jeff G. Schneider, Donald E. Thomas |
| 2015 | VTS | Special session: Hot topics: Statistical test methods. | Manuel J. Barragn, Gildas Lger, Florence Azas, Ronald D. Blanton, Adit D. Singh, Stephen Sunter |
| 2015 | VTS | Efficient built-in self test of regular logic characterization vehicles. | Ben Niewenhuis, Ronald D. Blanton |
| 2015 | VTS | Improving accuracy of on-chip diagnosis via incremental learning. | Xuanle Ren, Mitchell Martin, Ronald D. Blanton |
| 2014 | ITC | Logic characterization vehicle design for maximal information extraction for yield learning. | Ronald D. Blanton, Ben Niewenhuis, Carl Taylor |
| 2014 | ITC | Bayesian model fusion: Enabling test cost reduction of analog/RF circuits via wafer-level spatial variation modeling. | Shanghang Zhang, Xin Li, Ronald D. Blanton, Jos Machado da Silva, John M. Carulli Jr., Kenneth M. Butler |
| 2013 | ICCAD | DREAMS: DFM rule EvAluation using manufactured silicon. | Ronald D. Blanton, Fa Wang, Cheng Xue, Pranab K. Nag, Yang Xue, Xin Li |
| 2013 | ITC | SCAN-PUF: A low overhead Physically Unclonable Function from scan chain power-up states. | Ben Niewenhuis, Ronald D. Blanton, Mudit Bhargava, Ken Mai |
| 2013 | ITC | PADRE: Physically-Aware Diagnostic Resolution Enhancement. | Yang Xue, Osei Poku, Xin Li, Ronald D. Blanton |
| 2012 | DAC | Test-data volume optimization for diagnosis. | Hongfei Wang, Osei Poku, Xiaochun Yu, Sizhe Liu, Ibrahima Komara, Ronald D. Blanton |
| 2011 | VTS | SLIDER: A fast and accurate defect simulation framework. | Wing Chiu Tam, Ronald D. Blanton |
| 2010 | ITC | Automatic classification of bridge defects. | Jeffrey E. Nelson, Wing Chiu Tam, Ronald D. Blanton |
| 2010 | ITC | Systematic defect identification through layout snippet clustering. | Wing Chiu Tam, Osei Poku, Ronald D. Blanton |
| 2010 | ITC | Estimating defect-type distributions through volume diagnosis and defect behavior attribution. | Xiaochun Yu, Ronald D. Blanton |
| 2009 | ITC | Test effectiveness evaluation through analysis of readily-available tester data. | Yen-Tzu Lin, Ronald D. Blanton |
| 2009 | VTS | Maintaining Accuracy of Test Compaction through Adaptive Re-learning. | Sounil Biswas, Ronald D. Blanton |
| 2009 | VTS | Physically-Aware N-Detect Test Relaxation. | Yen-Tzu Lin, Chukwuemeka U. Ezekwe, Ronald D. Blanton |
| 2009 | VTS | Controlling DPPM through Volume Diagnosis. | Xiaochun Yu, Yen-Tzu Lin, Wing Chiu Tam, Osei Poku, Ronald D. Blanton |
| 2008 | DATE | Automated Testability Enhancements for Logic Brick Libraries. | Jason G. Brown, Brian Taylor, Ronald D. Blanton, Larry T. Pileggi |
| 2008 | DATE | Physically-Aware N-Detect Test Pattern Selection. | Yen-Tzu Lin, Osei Poku, Naresh K. Bhatti, Ronald D. Blanton |
| 2008 | ITC | Improving the Accuracy of Test Compaction through Adaptive Test Update. | Sounil Biswas, Ronald D. Blanton |
| 2008 | ITC | Evaluating the Effectiveness of Physically-Aware N-Detect Test using Real Silicon. | Yen-Tzu Lin, Osei Poku, Ronald D. Blanton, Phil Nigh, Peter Lloyd, Vikram Iyengar |
| 2008 | ITC | An Effective and Flexible Multiple Defect Diagnosis Methodology Using Error Propagation Analysis. | Xiaochun Yu, Ronald D. Blanton |
| 2007 | ITC | Delay defect diagnosis using segment network faults. | Osei Poku, Ronald D. Blanton |
| 2006 | ITC | Diagnostic Test Generation for Arbitrary Faults. | Naresh K. Bhatti, Ronald D. Blanton |
| 2006 | ITC | A Logic Diagnosis Methodology for Improved Localization and Extraction of Accurate Defect Behavior. | Rao Desineni, Osei Poku, Ronald D. Blanton |
| 2002 | ITC | Fault Tuples in Diagnosis of Deep-Submicron Circuits. | Ronald D. Blanton, John T. Chen, Rao Desineni, Kumar N. Dwarakanath, Wojciech Maly, Thomas J. Vogels |
| 2001 | DAC | False Coupling Interactions in Static Timing Analysis. | Ravishankar Arunachalam, Ronald D. Blanton, Lawrence T. Pileggi |
| 2000 | DAC | Universal fault simulation using fault tuples. | Kumar N. Dwarakanath, Ronald D. Blanton |
| 2000 | ITC | Analysis of failure sources in surface-micromachined MEMS. | Nilmoni Deb, Ronald D. Blanton |
| 2000 | ITC | Universal test generation using fault tuples. | Rao Desineni, Kumar N. Dwarakanath, Ronald D. Blanton |
| 2000 | ITC | Identification of crosstalk switch failures in domino CMOS circuits. | Rahul Kundu, Ronald D. Blanton |
| 1999 | ITC | Particulate failures for surface-micromachined MEMS. | Tao Jiang, Ronald D. Blanton |
| 1998 | ITC | Failure modes for stiction in surface-micromachined MEMS. | Abhijeet Kolpekwar, Ronald D. Blanton, David Woodilla |
| 1998 | ITC | MEMS fault model generation using CARAMEL. | Abhijeet Kolpekwar, Chris S. Kellen, Ronald D. Blanton |
| 1997 | DATE | The input pattern fault model and its application. | Ronald D. Blanton, John P. Hayes |
| 1997 | ICCD | Properties of the Input Pattern Fault Model. | Ronald D. Blanton, John P. Hayes |
| 1997 | ITC | Development of a MEMS Testing Methodology. | Abhijeet Kolpekwar, Ronald D. Blanton |
| 1997 | ITC | To DFT or Not to DFT? | Sichao Wei, Pranab K. Nag, Ronald D. Blanton, Anne E. Gattiker, Wojciech Maly |
| 1996 | ITC | Synthesis of Self-Testing Finite State Machines from High-Level Specifications. | Vishwani D. Agrawal, Ronald D. Blanton, Maurizio Damiani |