Rosa Rodrguez-Montas
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
24
Venues
7
Active years
1991–2017
Best venue rank
B
Where they publish
Papers
24 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2017 | ETS | Mitigating read & write errors in STT-MRAM memories under DVS. | Elena-Ioana Vatajelu, Rosa Rodrguez-Montas, Michel Renovell, Joan Figueras |
| 2015 | DATE | Read/write robustness estimation metrics for spin transfer torque (STT) MRAM cell. | Elena I. Vatajelu, Rosa Rodrguez-Montas, Marco Indaco, Michel Renovell, Paolo Prinetto, Joan Figueras |
| 2015 | ETS | Power-aware voltage tuning for STT-MRAM reliability. | Elena I. Vatajelu, Rosa Rodrguez-Montas, Stefano Di Carlo, Marco Indaco, Michel Renovell, Paolo Prinetto, Joan Figueras |
| 2014 | ETS | Post-bond test of Through-Silicon Vias with open defects. | Rosa Rodrguez-Montas, Daniel Arum, Joan Figueras |
| 2014 | IOLTS | Pre-bond testing of weak defects in TSVs. | Daniel Arum, Rosa Rodrguez-Montas, Joan Figueras |
| 2013 | ETS | BIST architecture to detect defects in tsvs during pre-bond testing. | Daniel Arum, Rosa Rodrguez-Montas, Joan Figueras |
| 2010 | ETS | Diagnosis of full open defects in interconnect lines with fan-out. | Rosa Rodrguez-Montas, Daniel Arum, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman |
| 2008 | ITC | Time-dependent Behaviour of Full Open Defects in Interconnect Lines. | Rosa Rodrguez-Montas, Daniel Arum, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman |
| 2008 | VTS | Full Open Defects in Nanometric CMOS. | Daniel Arum, Rosa Rodrguez-Montas, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman |
| 2007 | VTS | Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages. | Daniel Arum, Rosa Rodrguez-Montas, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi |
| 2007 | VTS | Diagnosis of Full Open Defects in Interconnecting Lines. | Rosa Rodrguez-Montas, Daniel Arum, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi |
| 2006 | DDECS | Lissajous Based Mixed-Signal Testing for N-Observable Signals. | Luz Balado, Emili Lupon, L. Garca, Rosa Rodrguez-Montas, Joan Figueras |
| 2005 | ETS | Defective behaviours of resistive opens in interconnect lines. | Daniel Arum, Rosa Rodrguez-Montas, Joan Figueras |
| 2004 | VTS | BIST Technique by Equally Spaced Test Vector Sequences. | Salvador Manich, L. Garca, Luz Balado, Emili Lupon, Josep Rius, Rosa Rodrguez-Montas, Joan Figueras |
| 2003 | DSN | A Combinatorial Method for the Evaluation of Yield of Fault-Tolerant Systems-on-Chip. | Doru P. Munteanu, Vctor Su, Rosa Rodrguez-Montas, Juan A. Carrasco |
| 2003 | ETS | Process-variability aware delay fault testing of ΔV | Daniel Arum-Delgado, Rosa Rodrguez-Montas, Jos Pineda de Gyvez, Guido Gronthoud |
| 2003 | ETS | On the selection of efficient arithmetic additive test pattern generators [logic test]. | Salvador Manich, L. Garca, Luz Balado, Emili Lupon, Josep Rius, Rosa Rodrguez-Montas, Joan Figueras |
| 2003 | VTS | Threshold Voltage Mismatch (DeltaVT) Fault Modeling. | Jos Pineda de Gyvez, Rosa Rodrguez-Montas |
| 2002 | IOLTS | Analog Switches in Programmable Analog Devices: Quiescent Defective Behaviours. | Rosa Rodrguez-Montas, D. Muoz, Luz Balado, Joan Figueras |
| 2002 | ITC | RTL Level Preparation of High-Quality/Low-Energy/Low-Power BIST. | Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira, Salvador Manich, Rosa Rodrguez-Montas, Joan Figueras |
| 1998 | DATE | Estimation of the Defective IDDQ Caused by Shorts in Deep-Submicron CMOS ICs. | Rosa Rodrguez-Montas, Joan Figueras |
| 1997 | VTS | Bridges in sequential CMOS circuits: current-voltage signatur. | Rosa Rodrguez-Montas, Joan Figueras |
| 1992 | ITC | Bridging Defects Resistance Measurements in a CMOS Process. | Rosa Rodrguez-Montas, Joan Figueras, Eric Bruls |
| 1991 | ITC | Current vs. Logic Testing of Gate Oxide Short, Floating Gate and Bridging Failures in CMOS. | Rosa Rodrguez-Montas, Jaume A. Segura, Vctor H. Champac, Joan Figueras, J. A. Rubio |