S. Saqib Khursheed
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
13
Venues
6
Active years
2008–2021
Best venue rank
B
Where they publish
Papers
13 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2021 | DATE | Differential Aging Sensor to Detect Recycled ICs using Sub-threshold Leakage Current. | Turki Alnuayri, S. Saqib Khursheed, Antonio Leonel Hernndez Martnez, Daniele Rossi |
| 2021 | ISCAS | IC Age Estimation Methodology Using IO Pad Protection Diodes for Prevention of Recycled ICs. | Srisubha Kalanadhabhatta, Rashi Dutt, S. Saqib Khursheed, Amit Acharyya |
| 2020 | IOLTS | Leveraging CMOS Aging for Efficient Microelectronics Design. | Antonio Leonel Hernndez Martnez, S. Saqib Khursheed, Daniele Rossi |
| 2018 | ETS | Recycled IC detection through aging sensor. | Daniele Rossi, Vasileios Tenentes, S. Saqib Khursheed, Sudhakar M. Reddy |
| 2015 | ETS | NBTI and leakage aware sleep transistor design for reliable and energy efficient power gating. | Daniele Rossi, Vasileios Tenentes, S. Saqib Khursheed, Bashir M. Al-Hashimi |
| 2015 | ETS | Diagnosis of power switches with power-distribution-network consideration. | Vasileios Tenentes, Daniele Rossi, S. Saqib Khursheed, Bashir M. Al-Hashimi |
| 2015 | IOLTS | BTI and leakage aware dynamic voltage scaling for reliable low power cache memories. | Daniele Rossi, Vasileios Tenentes, S. Saqib Khursheed, Bashir M. Al-Hashimi |
| 2015 | RSP | Application-specific memory protection policies for energy-efficient reliable design. | Sheng Yang, Rishad A. Shafik, S. Saqib Khursheed, David Flynn, Geoff V. Merrett, Bashir M. Al-Hashimi |
| 2011 | ETS | Improved DFT for Testing Power Switches. | S. Saqib Khursheed, Sheng Yang, Bashir M. Al-Hashimi, Xiaoyu Huang, David Flynn |
| 2010 | DATE | Scan based methodology for reliable state retention power gating designs. | Sheng Yang, Bashir M. Al-Hashimi, David Flynn, S. Saqib Khursheed |
| 2010 | ITC | Modeling the impact of process variation on resistive bridge defects. | S. Saqib Khursheed, Shida Zhong, Robert C. Aitken, Bashir M. Al-Hashimi, Sandip Kundu |
| 2009 | DATE | Test cost reduction for multiple-voltage designs with bridge defects through Gate-Sizing. | S. Saqib Khursheed, Bashir M. Al-Hashimi, Peter Harrod |
| 2008 | ETS | Bridge Defect Diagnosis for Multiple-Voltage Design. | S. Saqib Khursheed, Paul M. Rosinger, Bashir M. Al-Hashimi, Sudhakar M. Reddy, Peter Harrod |