| 2011 | VTS | An efficient method to screen resistive opens under presence of process variation. | Seongmoon Wang |
| 2009 | DATE | Machine learning-based volume diagnosis. | Seongmoon Wang, Wenlong Wei |
| 2009 | DSN | A self-diagnosis technique using Reed-Solomon codes for self-repairing chips. | Xiangyu Tang, Seongmoon Wang |
| 2008 | ETS | Low Overhead Partial Enhanced Scan Technique for Compact and High Fault Coverage Transition Delay Test Patterns. | Seongmoon Wang, Wenlong Wei |
| 2007 | ASPDAC | A Technique to Reduce Peak Current and Average Power Dissipation in Scan Designs by Limited Capture. | Seongmoon Wang, Wenlong Wei |
| 2007 | DATE | SoC testing using LFSR reseeding, and scan-slice-based TAM optimization and test scheduling. | Zhanglei Wang, Krishnendu Chakrabarty, Seongmoon Wang |
| 2007 | DATE | Unknown blocking scheme for low control data volume and high observability. | Seongmoon Wang, Wenlong Wei, Srimat T. Chakradhar |
| 2007 | ICCAD | A hybrid scheme for compacting test responses with unknown values. | Mango Chia-Tso Chao, Kwang-Ting Cheng, Seongmoon Wang, Srimat T. Chakradhar, Wenlong Wei |
| 2007 | ITC | A low cost test data compression technique for high n-detection fault coverage. | Seongmoon Wang, Zhanglei Wang, Wenlong Wei, Srimat T. Chakradhar |
| 2007 | VLSID | Zero Cost Test Point Insertion Technique for Structured ASICs. | Rajamani Sethuram, Seongmoon Wang, Srimat T. Chakradhar, Michael L. Bushnell |
| 2006 | DAC | Unknown-tolerance analysis and test-quality control for test response compaction using space compactors. | Mango Chia-Tso Chao, Kwang-Ting Cheng, Seongmoon Wang, Srimat T. Chakradhar, Wenlong Wei |
| 2006 | DATE | Coverage loss by using space compactors in presence of unknown values. | Mango Chia-Tso Chao, Seongmoon Wang, Srimat T. Chakradhar, Wenlong Wei, Kwang-Ting Cheng |
| 2006 | DATE | Efficient unknown blocking using LFSR reseeding. | Seongmoon Wang, Kedarnath J. Balakrishnan, Srimat T. Chakradhar |
| 2006 | VLSID | PIDISC: Pattern Independent Design Independent Seed Compression Technique. | Kedarnath J. Balakrishnan, Seongmoon Wang, Srimat T. Chakradhar |
| 2005 | ICCAD | Response shaper: a novel technique to enhance unknown tolerance for output response compaction. | Mango Chia-Tso Chao, Seongmoon Wang, Srimat T. Chakradhar, Kwang-Ting Cheng |
| 2005 | ICCD | ChiYun Compact: A Novel Test Compaction Technique for Responses with Unknown Values. | Mango Chia-Tso Chao, Seongmoon Wang, Srimat T. Chakradhar, Kwang-Ting Cheng |
| 2005 | ITC | XWRC: externally-loaded weighted random pattern testing for input test data compression. | Seongmoon Wang, Kedarnath J. Balakrishnan, Srimat T. Chakradhar |
| 2005 | VLSID | Distance Restricted Scan Chain Reordering to Enhance Delay Fault Coverage. | Wei Li, Seongmoon Wang, Srimat T. Chakradhar, Sudhakar M. Reddy |
| 2004 | ASPDAC | Re-configurable embedded core test protocol. | Seongmoon Wang, Srimat T. Chakradhar, Kedarnath J. Balakrishnan |
| 2004 | DATE | Hybrid Delay Scan: A Low Hardware Overhead Scan-Based Delay Test Technique for High Fault Coverage and Compact Test Sets. | Seongmoon Wang, Xiao Liu, Srimat T. Chakradhar |
| 2003 | ITC | A Scalable Scan-Path Test Point Insertion Technique to Enhance Delay Fault Coverage for Standard Scan Designs. | Seongmoon Wang, Srimat T. Chakradhar |
| 2002 | ITC | Generation of Low Power Dissipation and High Fault Coverage Patterns for Scan-Based BIST. | Seongmoon Wang |
| 1999 | ITC | LT-RTPG: a new test-per-scan BIST TPG for low heat dissipation. | Seongmoon Wang, Sandeep K. Gupta |
| 1997 | DAC | ATPG for Heat Dissipation Minimization During Scan Testing. | Seongmoon Wang, Sandeep K. Gupta |
| 1997 | ITC | DS-LFSR: A New BIST TPG for Low Heat Dissipation. | Seongmoon Wang, Sandeep K. Gupta |
| 1994 | ITC | ATPG for Heat Dissipation Minimization During Test Application. | Seongmoon Wang, Sandeep K. Gupta |