| 2020 | ITC | Automating Design For Yield: Silicon Learning to Predictive Models and Design Optimization. | Srikanth Venkataraman, Pongpachara Limpisathian, Pascal Meinerzhagen, Suriyaprakash Natarajan, Eric Yang |
| 2019 | DATE | Resynthesis for Avoiding Undetectable Faults Based on Design-for-Manufacturability Guidelines. | Naixing Wang, Irith Pomeranz, Sudhakar M. Reddy, Arani Sinha, Srikanth Venkataraman |
| 2019 | VTS | Observation Point Placement for Improved Logic Diagnosis based on Large Sets of Candidate Faults. | Irith Pomeranz, Vivek Chickermane, Srikanth Venkataraman |
| 2018 | ETS | Interconnect-aware tests to complement gate-exhaustive tests. | Irith Pomeranz, Srikanth Venkataraman |
| 2018 | ITC | DPPM Reduction Methods and New Defect Oriented Test Methods Applied to Advanced FinFET Technologies. | Will Howell, Friedrich Hapke, Edward Brazil, Srikanth Venkataraman, R. Datta, Andreas Glowatz, Wilfried Redemund, J. Schmerberg, Anja Fast, Janusz Rajski |
| 2017 | ITC | Test reordering for improved scan chain diagnosis using an enhanced defect diagnosis procedure. | Srikanth Venkataraman, Irith Pomeranz, Shraddha Bodhe, M. Enamul Amyeen |
| 2016 | ITC | A novel diagnostic test generation methodology and its application in production failure isolation. | M. Enamul Amyeen, Dongok Kim, Maheshwar Chandrasekar, Mohammad Noman, Srikanth Venkataraman, Anurag Jain, Neha Goel, Ramesh Sharma |
| 2016 | VTS | Reduction of diagnostic fail data volume and tester time using a dynamic N-cover algorithm. | Shraddha Bodhe, M. Enamul Amyeen, Clariza Galendez, Houston Mooers, Irith Pomeranz, Srikanth Venkataraman |
| 2013 | ETS | Panel session what is the electronics industry doing to win the battle against the expected scary failure rates in future technology nodes? | Said Hamdioui, Davide Appello, Arnaud Grasset, Xinli Gu, Bram Kruseman, Riccardo Mariani, Hermann Obermeir, Srikanth Venkataraman |
| 2012 | VLSID | Tutorial T3: DFM, DFT, Silicon Debug and Diagnosis - The Loop to Ensure Product Yield. | Srikanth Venkataraman, Nagesh Tamarapalli |
| 2011 | ITC | Logic BIST silicon debug and volume diagnosis methodology. | M. Enamul Amyeen, Andal Jayalakshmi, Srikanth Venkataraman, Sundar V. Pathy, Ewe C. Tan |
| 2010 | VTS | Defect diagnosis based on DFM guidelines. | Dongok Kim, Irith Pomeranz, M. Enamul Amyeen, Srikanth Venkataraman |
| 2009 | ITC | Microprocessor system failures debug and fault isolation methodology. | M. Enamul Amyeen, Srikanth Venkataraman, Mun Wai Mak |
| 2009 | VTS | Automated Debug of Speed Path Failures Using Functional Tests. | Richard McLaughlin, Srikanth Venkataraman, Carlston Lim |
| 2008 | VLSID | DFM / DFT / SiliconDebug / Diagnosis. | Srikanth Venkataraman, Nagesh Tamarapalli |
| 2008 | VTS | Diagnosis of Scan Clock Failures. | King Leong Lee, Nadir Z. Basturkmen, Srikanth Venkataraman |
| 2007 | DAC | Making Manufacturing Work For You. | Srikanth Venkataraman, Ruchir Puri, Steve Griffith, Ankush Oberai, Robert Madge, Greg Yeric, Walter Ng, Yervant Zorian |
| 2007 | ITC | Testing for systematic defects based on DFM guidelines. | Dongok Kim, M. Enamul Amyeen, Srikanth Venkataraman, Irith Pomeranz, Swagato Basumallick, Berni Landau |
| 2007 | VTS | Using Scan-Dump Values to Improve Functional-Diagnosis Methodology. | Vishnu C. Vimjam, M. Enamul Amyeen, Ruifeng Guo, Srikanth Venkataraman, Michael S. Hsiao, Kai Yang |
| 2006 | ITC | Improving Precision Using Mixed-level Fault Diagnosis. | M. Enamul Amyeen, Debashis Nayak, Srikanth Venkataraman |
| 2006 | VLSID | DFM, DFT, Silicon Debug and Diagnosis - The Loop to Ensure Product Yield. | David Abercrombie, Bernd Koenemann, Nagesh Tamarapalli, Srikanth Venkataraman |
| 2006 | VTS | Evaluation of Test Metrics: Stuck-at, Bridge Coverage Estimate and Gate Exhaustive. | Ruifeng Guo, Subhasish Mitra, M. Enamul Amyeen, Jinkyu Lee, Srihari Sivaraj, Srikanth Venkataraman |
| 2006 | VTS | Dominance Based Analysis for Large Volume Production Fail Diagnosis. | Bharath Seshadri, Irith Pomeranz, Srikanth Venkataraman, M. Enamul Amyeen, Sudhakar M. Reddy |
| 2006 | VTS | Accelerating Diagnostic Fault Simulation Using Z-diagnosis and Concurrent Equivalence Identification. | Bharath Seshadri, Xiaoming Yu, Srikanth Venkataraman |
| 2005 | DATE | Extraction Error Modeling and Automated Model Debugging in High-Performance Low Power Custom Designs. | Yu-Shen Yang, Andreas G. Veneris, Paul J. Thadikaran, Srikanth Venkataraman |
| 2005 | ITC | Enabling yield analysis with X-compact. | Zoran Stanojevic, Ruifeng Guo, Subhasish Mitra, Srikanth Venkataraman |
| 2005 | ITC | Achieving higher yield through diagnosis? | Srikanth Venkataraman |
| 2004 | DATE | Z-Sets and Z-Detections: Circuit Characteristics that Simplify Fault Diagnosis. | Irith Pomeranz, Srikanth Venkataraman, Sudhakar M. Reddy, Bharath Seshadri |
| 2004 | ITC | Evaluation of the Quality of N-Detect Scan ATPG Patterns on a Processor. | M. Enamul Amyeen, Srikanth Venkataraman, Ajay Ojha, Sangbong Lee |
| 2004 | ITC | Z-DFD: Design-for-Diagnosability Based on the Concept of Z-Detection. | Irith Pomeranz, Srikanth Venkataraman, Sudhakar M. Reddy |
| 2004 | ITC | Diagnosis meets Physical Failure Analysis: What is needed to succeed? | Srikanth Venkataraman |
| 2004 | VLSID | Defect Diagnosis Based on Pattern-Dependent Stuck-At Faults. | Irith Pomeranz, Srikanth Venkataraman, Sudhakar M. Reddy, M. Enamul Amyeen |
| 2004 | VTS | Razor: A Tool for Post-Silicon Scan ATPG Pattern Debug and Its Application. | Debashis Nayak, Srikanth Venkataraman, Paul J. Thadikaran |
| 2004 | VTS | An Experimental Study of N-Detect Scan ATPG Patterns on a Processor. | Srikanth Venkataraman, Srihari Sivaraj, M. Enamul Amyeen, Sangbong Lee, Ajay Ojha, Ruifeng Guo |
| 2003 | VTS | Concurrent Execution of Diagnostic Fault Simulation and Equivalence Identification During Diagnostic Test Generation. | Xiaoming Yu, M. Enamul Amyeen, Srikanth Venkataraman, Ruifeng Guo, Irith Pomeranz |
| 2001 | ITC | A technique for fault diagnosis of defects in scan chains. | Ruifeng Guo, Srikanth Venkataraman |
| 2001 | VTS | On Diagnosing Path Delay Faults in an At-Speed Environment. | Ramesh C. Tekumalla, Srikanth Venkataraman, Jayabrata Ghosh-Dastidar |
| 2000 | ITC | POIROT: a logic fault diagnosis tool and its applications. | Srikanth Venkataraman, Scott Brady Drummonds |
| 2000 | VTS | A Technique for Logic Fault Diagnosis of Interconnect Open Defects. | Srikanth Venkataraman, Scott Brady Drummonds |
| 1999 | VTS | Multiple Design Error Diagnosis and Correction in Digital VLSI Circuits. | Andreas G. Veneris, Ibrahim N. Hajj, Srikanth Venkataraman, W. Kent Fuchs |
| 1998 | VLSID | Diagnostic Simulation of Sequential Circuits Using Fault Sampling. | Srikanth Venkataraman, W. Kent Fuchs, Janak H. Patel |
| 1997 | ICCAD | A deductive technique for diagnosis of bridging faults. | Srikanth Venkataraman, W. Kent Fuchs |
| 1997 | ITC | Diagnosis of Bridging Faults in Sequential Circuits Using Adaptive Simulation, State Storage, and Path-Tracing. | Srikanth Venkataraman, W. Kent Fuchs |
| 1997 | VLSID | Distributed Diagnostic Simulation of Stuck-At Faults in Sequential Circuits. | Srikanth Venkataraman, W. Kent Fuchs |
| 1996 | DAC | Partial Scan Design Based on Circuit State Information. | Dong Xiang, Srikanth Venkataraman, W. Kent Fuchs, Janak H. Patel |
| 1996 | VTS | Dynamic diagnosis of sequential circuits based on stuck-at faults. | Srikanth Venkataraman, Ismed Hartanto, W. Kent Fuchs |
| 1995 | DAC | Rapid Diagnostic Fault Simulation of Stuck-at Faults in Sequential Circuits Using Compact Lists. | Srikanth Venkataraman, Ismed Hartanto, W. Kent Fuchs, Elizabeth M. Rudnick, Sreejit Chakravarty, Janak H. Patel |