Stefan Eichenberger
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
17
Venues
5
Active years
2002–2010
Best venue rank
A
Where they publish
Papers
17 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2010 | ETS | Diagnosis of full open defects in interconnect lines with fan-out. | Rosa Rodrguez-Montas, Daniel Arum, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman |
| 2010 | ITC | Defect-oriented cell-internal testing. | Friedrich Hapke, Wilfried Redemund, Jrgen Schlffel, Rene Krenz-Baath, Andreas Glowatz, Michael Wittke, Hamidreza Hashempour, Stefan Eichenberger |
| 2010 | VLSID | Impact of Temperature on Test Quality. | Lavanya Jagan, Camelia Hora, Bram Kruseman, Stefan Eichenberger, Ananta K. Majhi, V. Kamakoti |
| 2009 | ITC | Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs. | Friedrich Hapke, Rene Krenz-Baath, Andreas Glowatz, Jrgen Schlffel, Hamidreza Hashempour, Stefan Eichenberger, Camelia Hora, Dan Adolfsson |
| 2008 | ITC | Towards a World Without Test Escapes: The Use of Volume Diagnosis to Improve Test Quality. | Stefan Eichenberger, Jeroen Geuzebroek, Camelia Hora, Bram Kruseman, Ananta K. Majhi |
| 2008 | ITC | Time-dependent Behaviour of Full Open Defects in Interconnect Lines. | Rosa Rodrguez-Montas, Daniel Arum, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman |
| 2008 | VTS | Full Open Defects in Nanometric CMOS. | Daniel Arum, Rosa Rodrguez-Montas, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman |
| 2007 | VTS | Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages. | Daniel Arum, Rosa Rodrguez-Montas, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi |
| 2007 | VTS | Diagnosis of Full Open Defects in Interconnecting Lines. | Rosa Rodrguez-Montas, Daniel Arum, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi |
| 2006 | ITC | Power Supply Noise in Delay Testing. | Jing Wang, D. M. H. Walker, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul van de Wiel, Stefan Eichenberger |
| 2005 | DATE | Memory Testing Under Different Stress Conditions: An Industrial Evaluation. | Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, Fred Bowen |
| 2004 | ITC | On Hazard-free Patterns for Fine-delay Fault Testing. | Bram Kruseman, Ananta K. Majhi, Guido Gronthoud, Stefan Eichenberger |
| 2004 | ITC | Systematic Defects in Deep Sub-Micron Technologies. | Bram Kruseman, Ananta K. Majhi, Camelia Hora, Stefan Eichenberger, Johan Meirlevede |
| 2004 | VTS | Delay Defect Screening using Process Monitor Structures. | Subhasish Mitra, Erik H. Volkerink, Edward J. McCluskey, Stefan Eichenberger |
| 2003 | ITC | Design for Manufacturability - or the meaning of 'subtle'. | Stefan Eichenberger |
| 2003 | VTS | Improving Diagnostic Resolution of Delay Faults using Path Delay Fault Model. | Ananta K. Majhi, Guido Gronthoud, Camelia Hora, Maurice Lousberg, Pop Valer, Stefan Eichenberger |
| 2002 | ITC | An Effective Diagnosis Method to Support Yield Improvement. | Camelia Hora, Rene Segers, Stefan Eichenberger, Maurice Lousberg |