| 2021 | VTS | Two Pattern Timing Tests Capturing Defect-Induced Multi-Gate Delay Impact of Shorts. | Sujay Pandey, Zhiwei Liao, Shreyas Nandi, Suriyaprakash Natarajan, Arani Sinha, Adit D. Singh, Abhijit Chatterjee |
| 2020 | ITC | SAT-ATPG Generated Multi-Pattern Scan Tests for Cell Internal Defects: Coverage Analysis for Resistive Opens and Shorts. | Sujay Pandey, Zhiwei Liao, Shreyas Nandi, Sanya Gupta, Suriyaprakash Natarajan, Arani Sinha, Adit D. Singh, Abhijit Chatterjee |
| 2019 | ITC | Characterization of Library Cells for Open-circuit Defect Exposure: A Systematic Methodology. | Sujay Pandey, Sanya Gupta, Madhu Sudhan L., Suriya Natarajan, Arani Sinha, Abhijit Chatterjee |
| 2018 | ETS | ReiNN: Efficient error resilience in artificial neural networks using encoded consistency checks. | Sujay Pandey, Suvadeep Banerjee, Abhijit Chatterjee |
| 2018 | IOLTS | Cross-Layer Control Adaptation for Autonomous System Resilience. | Md Imran Momtaz, Suvadeep Banerjee, Sujay Pandey, Jacob A. Abraham, Abhijit Chatterjee |
| 2018 | IOLTS | Error Resilient Neuromorphic Networks Using Checker Neurons. | Sujay Pandey, Suvadeep Banerjee, Abhijit Chatterjee |
| 2017 | ITC | DFM-aware fault model and ATPG for intra-cell and inter-cell defects. | Arani Sinha, Sujay Pandey, Ayush Singhal, Alodeep Sanyal, Alan Schmaltz |
| 2016 | IOLTS | Concurrent error detection and tolerance in Kalman filters using encoded state and statistical covariance checks. | Sujay Pandey, Suvadeep Banerjee, Abhijit Chatterjee |