| 2015 | ETS | Efficient diagnosis technique for aging defects on automotive semiconductor chips. | Jihun Jung, Muhammad Adil Ansari, Dooyoung Kim, Hyunbean Yi, Sungju Park |
| 2010 | HRI | A trial english class with a teaching assistant robot in elementary school. | Jeonghye Han, Seungmin Lee, Bokhyun Kang, Sungju Park, Jungkwan Kim, Myungsook Kim, Mihee Kim |
| 2008 | ITC | An Efficient Secure Scan Design for an SoC Embedding AES Core. | Jaehoon Song, Taejin Jung, Junseop Lee, Hyeran Jeong, Byeongjin Kim, Sungju Park |
| 2008 | RO-MAN | Comparative study of effects of language instruction program using intelligence robot and multimedia on linguistic ability of young children. | Eun-ja Hyun, So-yeon Kim, Siekyung Jang, Sungju Park |
| 2007 | VTS | Design of Test Access Mechanism for AMBA-Based System-on-a-Chip. | Jaehoon Song, Piljae Min, Hyunbean Yi, Sungju Park |
| 2006 | ITC | Interconnect Delay Fault Test on Boards and SoCs with Multiple Clock Domains. | Hyunbean Yi, Jaehoon Song, Sungju Park |
| 2005 | RO-MAN | The educational use of home robots for children. | Jeonghye Han, Miheon Jo, Sungju Park, Sungho Kim |
| 2004 | DAC | A new state assignment technique for testing and low power. | Sungju Park, Sangwook Cho, Seiyang Yang, Maciej J. Ciesielski |
| 2001 | DSD | Minimization of OPKFDDs Using Genetic Algorithms. | Migyoung Jung, Gueesang Lee, Sungju Park, Rolf Drechsler |
| 2001 | VRST | Scalable data management using user-based caching and prefetching in distributed virtual environments. | Sungju Park, Dongman Lee, Mingyu Lim, Chansu Yu |
| 2000 | DATE | A New IEEE 1149.1 Boundary Scan Design for the Detection of Delay Defects. | Sungju Park, Taehyung Kim |
| 2000 | ISCAS | A partial scan design by unifying structural analysis and testabilities. | Jongwook Park, Sang-Hoon Shin, Sungju Park |
| 1996 | DAC | A New Complete Diagnosis Patterns for Wiring Interconnects. | Sungju Park |
| 1992 | ITC | A Graph Theoretic Approach to Partial Scan Design by K-Cycle Elimination. | Sungju Park, Sheldon B. Akers |
| 1991 | ITC | Parity Bit Calculation and Test Signal Compaction for BIST Applications. | Sungju Park, Sheldon B. Akers |
| 1990 | ITC | Why is less information from logic simulation more useful in fault simulation? | Sheldon B. Akers Jr., Sungju Park, Balakrishnan Krishnamurthy, Ashok Swaminathan |