| 2026 | IOLTS | A Statistical Test Methodology for MTJ Stochastic Neurons in Neuromorphic Hardware. | Jesus Gamez, Vctor H. Champac, Elena-Ioana Vatajelu, Leticia Bolzani Poehls |
| 2019 | ETS | B-open: A New Defect in Nanometer Technologies due to SADP Process. | Freddy Forero, Michel Renovell, Vctor H. Champac |
| 2016 | ETS | Behavior and test of open-gate defects in FinFET based cells. | Francisco Mesalles, Hector Villacorta, Michel Renovell, Vctor H. Champac |
| 2015 | VTS | An early prediction methodology for aging sensor insertion to assure safe circuit operation due to NBTI aging. | Andres F. Gomez, Leticia B. Poehls, Fabian Vargas, Vctor H. Champac |
| 2014 | VTS | Hot topic session 12B: Stay relevant with standards-based DFT. | C. J. Clark, Vctor H. Champac |
| 2012 | VTS | Small-delay defects detection under process variation using Inter-Path Correlation. | Francisco J. Galarza-Medina, Jose Luis Garcia-Gervacio, Vctor H. Champac, Alex Orailoglu |
| 2011 | VTS | Adaptive Error-Prediction Flip-flop for performance failure prediction with aging sensors. | Celestino V. Martins, Jorge Semio, Julio Csar Vzquez, Vctor H. Champac, Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira |
| 2011 | VTS | A new methodology for realistic open defect detection probability evaluation under process variations. | Jess Moreno, Vctor H. Champac, Michel Renovell |
| 2010 | DATE | Programmable aging sensor for automotive safety-critical applications. | Julio Csar Vzquez, Vctor H. Champac, Isabel C. Teixeira, Marcelino B. Santos, Joo Paulo Teixeira |
| 2010 | ETS | Computing the detection of Small Delay Defects caused by resistive opens of nanometer ICs. | Jose Luis Garcia-Gervacio, Vctor H. Champac |
| 2010 | IOLTS | Predictive error detection by on-line aging monitoring. | Julio Csar Vzquez, Vctor H. Champac, Adriel Ziesemer, Ricardo Reis, Jorge Semio, Isabel C. Teixeira, Marcelino B. Santos, Joo Paulo Teixeira |
| 2010 | VTS | Low-sensitivity to process variations aging sensor for automotive safety-critical applications. | Julio Csar Vzquez, Vctor H. Champac, Adriel Ziesemer, Ricardo Reis, Isabel Maria Cacho Teixeira, Marcelino B. Santos, Joo Paulo Teixeira |
| 2009 | IOLTS | Detectability analysis of small delays due to resistive opens considering process variations. | Jose Luis Garcia-Gervacio, Vctor H. Champac |
| 2009 | IOLTS | Built-in aging monitoring for safety-critical applications. | Julio Csar Vzquez, Vctor H. Champac, Adriel Ziesemer, Ricardo Reis, Isabel C. Teixeira, Marcelino B. Santos, Joo Paulo Teixeira |
| 2009 | VTS | Stuck-Open Fault Leakage and Testing in Nanometer Technologies. | Julio Csar Vzquez, Vctor H. Champac, Chuck Hawkins, Jaume Segura |
| 2008 | ISCAS | A design methodology for logic paths tolerant to local intra-die variations. | Daniel Iparraguirre-Cardenas, Jose Luis Garcia-Gervacio, Vctor H. Champac |
| 2005 | ETS | Testing of resistive opens in CMOS latches and flip-flops. | Vctor H. Champac, Antonio Zenteno, Jos L. Garcia |
| 2004 | ETS | Signal integrity verification using high speed monitors. | Victor Avendao, Vctor H. Champac, Joan Figueras |
| 2003 | ETS | Signal integrity loss in bus lines due to open shielding defects. | Victor Avendao, Vctor H. Champac, Joan Figueras |
| 2002 | ISCAS | A new technique for noise-tolerant pipelined dynamic digital circuits. | Fernando Mendoza-Hernandez, Mnico Linares Aranda, Vctor H. Champac, Alejandro Daz-Snchez |
| 2001 | VTS | Resistive Opens in a Class of CMOS Latches: Analysis and DFT. | Antonio Zenteno, Vctor H. Champac |
| 2000 | VTS | Detectability Conditions for Interconnection Open Defect. | Vctor H. Champac, Antonio Zenteno |
| 1998 | VTS | IDDQ Testing of Opens in CMOS SRAMs. | Vctor H. Champac, Jos Castillejos, Joan Figueras |
| 1995 | VTS | Testability of floating gate defects in sequential circuits. | Vctor H. Champac, Joan Figueras |
| 1991 | ITC | Current vs. Logic Testing of Gate Oxide Short, Floating Gate and Bridging Failures in CMOS. | Rosa Rodrguez-Montas, Jaume A. Segura, Vctor H. Champac, Joan Figueras, J. A. Rubio |