| 2018 | ITC | Online Scan Diagnosis : A Novel Approach to Volume Diagnosis. | I-De Huang, Pallav Gupta, Loganathan Lingappan, Vijay Gangaram |
| 2013 | ETS | Test generation for circuits with embedded memories using SMT. | Sarvesh Prabhu, Michael S. Hsiao, Loganathan Lingappan, Vijay Gangaram |
| 2012 | VLSID | A Novel SMT-Based Technique for LFSR Reseeding. | Sarvesh Prabhu, Michael S. Hsiao, Loganathan Lingappan, Vijay Gangaram |
| 2012 | VTS | A SMT-based diagnostic test generation method for combinational circuits. | Sarvesh Prabhu, Michael S. Hsiao, Loganathan Lingappan, Vijay Gangaram |
| 2007 | VLSID | Fast Enhancement of Validation Test Sets to Improve Stuck-at Fault Coverage for RTL circuits. | Loganathan Lingappan, Vijay Gangaram, Niraj K. Jha |
| 2007 | VTS | Efficient RTL Coverage Metric for Functional Test Selection. | Jian Kang, Sharad C. Seth, Vijay Gangaram |
| 2006 | VTS | Upper Bounding Fault Coverage by Structural Analysis and Signal Monitoring. | Vishwani D. Agrawal, Soumitra Bose, Vijay Gangaram |
| 1997 | VLSID | Deriving Signal Constraints to Accelerate Sequential Test Generation. | Srimat T. Chakradhar, Vijay Gangaram, Steven G. Rothweiler |
| 1995 | ICCAD | A controller-based design-for-testability technique for controller-data path circuits. | Sujit Dey, Vijay Gangaram, Miodrag Potkonjak |