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Vincenzo Tancorre

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

16

Venues

5

Active years

2002–2026

Best venue rank

C

Where they publish

Papers

16 indexed papers, newest first.

YearVenueTitleAuthors
2026IOLTSOptimizing Scan Test Economics Trade-Offs in Homogeneous 3D SICs via Cost Modeling.Giusy Iaria, Paolo Bernardi, Claudia Bertani, Giuseppe Garozzo, Vincenzo Tancorre
2023DDECSCollecting diagnostic information through dichotomic search from Logic BIST of failing in-field automotive SoCs with delay faults.Paolo Bernardi, Gabriele Filipponi, Matteo Sonza Reorda, Davide Appello, Claudia Bertani, Vincenzo Tancorre
2023IOLTSAbout the Correlation between Logical Identified Faulty Gates and their Layout Characteristics.Paolo Bernardi, Lorenzo Cardone, Giusy Iaria, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre
2023VTSA guided debugger-based fault injection methodology for assessing functional test programs.Francesco Angione, Paolo Bernardi, Nicola Di Gruttola Giardino, Davide Appello, Claudia Bertani, Vincenzo Tancorre
2022ETSTest, Reliability and Functional Safety Trends for Automotive System-on-Chip.Francesco Angione, Davide Appello, Joseph Aribido, Jyotika Athavale, Nicol Bellarmino, Paolo Bernardi, Riccardo Cantoro, Corrado De Sio, Tommaso Foscale, Gabriele Gavarini, Juan-David Guerrero-Balaguera, Martin Huch, Giusy Iaria, Tobias Kilian, Riccardo Mariani, Raffaele Martone, Annachiara Ruospo, Ernesto Snchez, Ulf Schlichtmann, Giovanni Squillero, Matteo Sonza Reorda, Luca Sterpone, Vincenzo Tancorre, Roberto Ugioli
2022ETSAn Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip.Francesco Angione, Paolo Bernardi, Gabriele Filipponi, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre, Roberto Ugioli
2022ITCAn innovative Strategy to Quickly Grade Functional Test Programs.Francesco Angione, Paolo Bernardi, Andrea Calabrese, Lorenzo Cardone, A. Niccoletti, Davide Piumatti, Stefano Quer, Davide Appello, Vincenzo Tancorre, Roberto Ugioli
2022ITCIn-field Data Collection System through Logic BIST for large Automotive Systems-on-Chip.Gabriele Filipponi, Giusy Iaria, Matteo Sonza Reorda, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre
2021DDECSAccelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures.Davide Appello, Paolo Bernardi, Andrea Calabrese, Stefano Littardi, Giorgio Pollaccia, Stefano Quer, Vincenzo Tancorre, Roberto Ugioli
2019DDECSEffective Screening of Automotive SoCs by Combining Burn-In and System Level Test.F. Almeida, Paolo Bernardi, D. Calabrese, Marco Restifo, Matteo Sonza Reorda, Davide Appello, Giorgio Pollaccia, Vincenzo Tancorre, Roberto Ugioli, Gulio Zoppi
2011DDECSOptimized embedded memory diagnosis.Mauricio de Carvalho, Paolo Bernardi, Matteo Sonza Reorda, Nicola Campanelli, Tamas Kerekes, Davide Appello, Mario Barone, Vincenzo Tancorre, Marco Terzi
2006ITCEmbedded Memory Diagnosis: An Industrial Workflow.Davide Appello, Vincenzo Tancorre, Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda
2006VTSOn the Automation of the Test Flow of Complex SoCs.Davide Appello, Vincenzo Tancorre, Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda
2004VTSYield Analysis of Logic Circuits.Davide Appello, Alessandra Fudoli, Katia Giarda, Emil Gizdarski, Ben Mathew, Vincenzo Tancorre
2003ITCExploiting Programmable BIST For The Diagnosis of Embedded Memory Cores.Davide Appello, Paolo Bernardi, Alessandra Fudoli, Maurizio Rebaudengo, Matteo Sonza Reorda, Vincenzo Tancorre, Massimo Violante
2002IOLTSA BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques.Davide Appello, Alessandra Fudoli, Vincenzo Tancorre, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda